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Micromachines
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Gallium Nitride-Based Devices
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Gallium Nitride-Based Devices

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D1: Semiconductor Devices".

Deadline for manuscript submissions: closed (25 April 2023) | Viewed by 16808

Special Issue Editor

Dr. Neha Aggarwal

E-Mail Website
Guest Editor
Paul-Drude-Institut für Festkörperelektronik, Hausvogteipl. 5-7, 10117 Berlin, Germany
Interests: Gallium Nitride; Aluminium Nitride; AlGaN; Boron Nitride; nanoplasmonics; molecular beam epitaxy of III-Nitride material system; optoelectronics; device fabrication; photodetectors
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

The escalating demand for high-frequency and high-power operations in power conversion systems is leading the way towards a material that should be able to out-perform conventional Si-based components. Gallium Nitride (GaN) is an III-V group compound that is being merged with pre-existing silicon-based semiconductor technology to speed up its accessibility to large-scale users. GaN-based devices have been growing rapidly and have already shown marked importance in solid-state lighting applications, making them high-power and high-speed, especially in the ultraviolet (UV) range due to their wide and direct bandgap properties. With the increasing need to save energy, GaN is an important semiconductor material that possesses the capability to increase technological requirements quite efficiently. The different polarity/orientations of GaN have resulted in a debate regarding its device applicability. Presently, non-polar GaN-based structures are demonstrating higher efficiencies and a faster switching response in UV optoelectronic devices. However, in polar GaN, N-polar portrays the key characteristics of an efficient photodetection device over Ga-polar devices. More recently, atomically thin GaN has emerged and is potentially suitable for ultracompact electronics and optics. This freshly synthesized two-dimensional (2D) GaN allows for control over light-emitting properties guided by strong quantum confinement. Moreover, 2D GaN materials can also act as possible electrode materials for batteries since they have a very low mass density and are definitely an environmentally friendly alternative that can provide high-storage capacities. This Special Issue creates an opportunity for researchers who are willing to contribute to all of these latest material developments and process advancements in GaN technology in the form of research papers, short communications, and perspectives as well as review articles.

We are looking forward to receiving your submissions!

Regards,
Dr. Neha Aggarwal
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Micromachines is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • epitaxial growth
  • electronic transport
  • gallium nitride
  • non-polar GaN
  • nanostructures
  • optoelectronics
  • polarity
  • radiation-resistant
  • strain-free growth
  • semiconductor device technology
  • UV technology
  • wide-bandgap
  • 2D semiconductors

Related Special Issue

Published Papers (7 papers)

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Research

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11 pages, 3177 KiB  
Article
Revealing the Mechanism of the Bias Temperature Instability Effect of p-GaN Gate HEMTs by Time-Dependent Gate Breakdown Stress and Fast Sweeping Characterization
by Xiangdong Li, Meng Wang, Jincheng Zhang, Rui Gao, Hongyue Wang, Weitao Yang, Jiahui Yuan, Shuzhen You, Jingjing Chang, Zhihong Liu and Yue Hao
Micromachines 2023, 14(5), 1042; https://doi.org/10.3390/mi14051042 - 12 May 2023
Cited by 3 | Viewed by 1793
Abstract
The bias temperature instability (BTI) effect of p-GaN gate high-electron-mobility transistors (HEMTs) is a serious problem for reliability. To uncover the essential cause of this effect, in this paper, we precisely monitored the shifting process of the threshold voltage (VTH) of [...] Read more.
The bias temperature instability (BTI) effect of p-GaN gate high-electron-mobility transistors (HEMTs) is a serious problem for reliability. To uncover the essential cause of this effect, in this paper, we precisely monitored the shifting process of the threshold voltage (VTH) of HEMTs under BTI stress by fast sweeping characterizations. The HEMTs without time-dependent gate breakdown (TDGB) stress featured a high VTH shift of 0.62 V. In contrast, the HEMT that underwent 424 s of TDGB stress clearly saw a limited VTH shift of 0.16 V. The mechanism is that the TDGB stress can induce a Schottky barrier lowering effect on the metal/p-GaN junction, thus boosting the hole injection from the gate metal to the p-GaN layer. This hole injection eventually improves the VTH stability by replenishing the holes lost under BTI stress. It is the first time that we experimentally proved that the BTI effect of p-GaN gate HEMTs was directly dominated by the gate Schottky barrier that impeded the hole supply to the p-GaN layer. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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10 pages, 3448 KiB  
Article
InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
by Krzysztof Gibasiewicz, Anna Kafar, Dario Schiavon, Kiran Saba, Łucja Marona, Eliana Kamińska and Piotr Perlin
Micromachines 2023, 14(2), 408; https://doi.org/10.3390/mi14020408 - 09 Feb 2023
Cited by 3 | Viewed by 1846
Abstract
The main objective of this work is to demonstrate and validate the feasibility of fabricating (Al, In) GaN laser diodes with etched facets. The facets are fabricated using a two-step dry and wet etching process: inductively coupled plasma—reactive ion etching in chlorine, followed [...] Read more.
The main objective of this work is to demonstrate and validate the feasibility of fabricating (Al, In) GaN laser diodes with etched facets. The facets are fabricated using a two-step dry and wet etching process: inductively coupled plasma—reactive ion etching in chlorine, followed by wet etching in tetramethylammonium hydroxide (TMAH). For the dry etching stage, an optimized procedure was used. For the wet etching step, the TMAH temperature was set to a constant value of 80 °C, and the only variable parameter was time. The time was divided into individual steps, each of 20 min. To validate the results, electro-optical parameters were measured after each step and compared with a cleaved reference, as well as with scanning electron microscope imaging of the front surface. It was determined that the optimal wet etching time was 40 min. For this time, the laser tested achieved a fully comparable threshold current (within 10%) with the cleaved reference. The described technology is an important step for the future manufacturing of photonic integrated circuits with laser diodes integrated on a chip and for ultra-short-cavity lasers. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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16 pages, 6586 KiB  
Article
Monolithic 45 Degree Deflecting Mirror as a Key Element for Realization of 2D Arrays of Laser Diodes Based on AlInGaN Semiconductors
by Kiran Saba, Anna Kafar, Jacek Kacperski, Krzysztof Gibasiewicz, Dario Schiavon, Takao Oto, Szymon Grzanka and Piotr Perlin
Micromachines 2023, 14(2), 352; https://doi.org/10.3390/mi14020352 - 31 Jan 2023
Viewed by 2020
Abstract
In this study, we propose a solution for realization of surface emitting, 2D array of visible light laser diodes based on AlInGaN semiconductors. The presented system consists of a horizontal cavity lasing section adjoined with beam deflecting section in the form of 45° [...] Read more.
In this study, we propose a solution for realization of surface emitting, 2D array of visible light laser diodes based on AlInGaN semiconductors. The presented system consists of a horizontal cavity lasing section adjoined with beam deflecting section in the form of 45° inclined planes. They are placed in the close vicinity of etched vertical cavity mirrors that are fabricated by Reactive Ion Beam Etching. The principle of operation of this device is confirmed experimentally; however, we observed an unexpected angular distribution of reflected rays for the angles lower than 45°, which we associate with the light diffraction and interference between the vertical and deflecting mirrors. The presented solution offers the maturity of edge-emitting laser technology combined with versatility of surface-emitting lasers, including on-wafer testing of emitters and addressability of single light sources. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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7 pages, 2289 KiB  
Article
Improved Optical and Electrical Characteristics of GaN-Based Micro-LEDs by Optimized Sidewall Passivation
by Zhifang Zhu, Tao Tao, Bin Liu, Ting Zhi, Yang Chen, Junchi Yu, Di Jiang, Feifan Xu, Yimeng Sang, Yu Yan, Zili Xie and Rong Zhang
Micromachines 2023, 14(1), 10; https://doi.org/10.3390/mi14010010 - 21 Dec 2022
Cited by 7 | Viewed by 2212
Abstract
GaN-based Micro-LED has been widely regarded as the most promising candidate for next generation of revolutionary display technology due to its advantages of high efficiency, high brightness and high stability. However, the typical micro-fabrication process would leave a great number of damages on [...] Read more.
GaN-based Micro-LED has been widely regarded as the most promising candidate for next generation of revolutionary display technology due to its advantages of high efficiency, high brightness and high stability. However, the typical micro-fabrication process would leave a great number of damages on the sidewalls of LED pixels, especially for Micro-LEDs, thus reducing the light emitting efficiency. In this paper, sidewall passivation methods were optimized by using acid-base wet etching and SiO2 layer passivation. The optical and electrical characteristics of optimized Micro-LEDs were measured and analyzed. The internal quantum efficiency (IQE) of Micro-LED was increased to 85.4%, and the reverse leakage current was reduced down to 10−13 A at −5 V. Optimized sidewall passivation can significantly reduce the non-radiative recombination centers, improving the device performance and supporting the development of high-resolution Micro-LED display. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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12 pages, 2973 KiB  
Article
Miniature Mesa Extension for a Planar Submicron AlGaN/GaN HEMT Gate Formation
by Moath Alathbah and Khaled Elgaid
Micromachines 2022, 13(11), 2007; https://doi.org/10.3390/mi13112007 - 18 Nov 2022
Cited by 2 | Viewed by 2458
Abstract
In this letter, a novel approach is presented to overcome issues in AlGaN/GaN high electron mobility transistors (HEMTs), such as metal discontinuity of the gate stemmed from conventional mesa isolation. This usually requires a careful mesa etch process to procure an anisotropic mesa-wall [...] Read more.
In this letter, a novel approach is presented to overcome issues in AlGaN/GaN high electron mobility transistors (HEMTs), such as metal discontinuity of the gate stemmed from conventional mesa isolation. This usually requires a careful mesa etch process to procure an anisotropic mesa-wall profile. An alternative technique is the use of ion implantation for device isolation instead of conventional mesa for a planar device formation. However, ion implantation is a costly process and not always easily accessible. In this work, the proposed method is to simply extend the mesa below the gate just enough to accommodate the gatefeed, thereby ensuring the entire gate is planar in structure up to the gatefeed. The newly developed device exhibited no compromise to the DC (direct current) and RF (radio frequency) performance. Conversely, it produced a planar gate configuration with an enhanced DC transconductance (approximately 20% increase is observed) and a lower gate leakage while the etch process is considerably simplified. Similarly, the RF transconductance of proposed device (device B) increased by 80% leading to considerable improvements in RF performance. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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16 pages, 7426 KiB  
Article
Analysis of Operational Characteristics of AlGaN/GaN High-Electron-Mobility Transistor with Various Slant-Gate-Based Structures: A Simulation Study
by Jun-Ho Lee, Jun-Hyeok Choi, Woo-Seok Kang, Dohyung Kim, Byoung-Gue Min, Dong Min Kang, Jung Han Choi and Hyun-Seok Kim
Micromachines 2022, 13(11), 1957; https://doi.org/10.3390/mi13111957 - 11 Nov 2022
Cited by 4 | Viewed by 1633
Abstract
This study investigates the operational characteristics of AlGaN/GaN high-electron-mobility transistors (HEMTs) by applying a slant-gate structure and drain-side extended field-plate (FP) for improved breakdown voltage. Prior to the analysis of slant-gate-based HEMT, simulation parameters were extracted from the measured data of fabricated basic [...] Read more.
This study investigates the operational characteristics of AlGaN/GaN high-electron-mobility transistors (HEMTs) by applying a slant-gate structure and drain-side extended field-plate (FP) for improved breakdown voltage. Prior to the analysis of slant-gate-based HEMT, simulation parameters were extracted from the measured data of fabricated basic T-gate HEMTs to secure the reliability of the results. We suggest three different types of slant-gate structures that connect the basic T-gate electrode boundary to the 1st and 2nd SiN passivation layers obliquely. To consider both the breakdown voltage and frequency characteristics, the DC and RF characteristics of various slant-gate structures including the self-heating effect were analyzed by TCAD simulation. We then applied a drain-side extended FP to further increase the breakdown voltage. The maximum breakdown voltage was achieved at the FP length of 0.4 μm. Finally, we conclude that the slant-gate structures can improve breakdown voltage by up to 66% without compromising the frequency characteristics of the HEMT. When the drain-side FP is applied to a slant-gate structure, the breakdown voltage is further improved by up to 108%, but the frequency characteristics deteriorate. Therefore, AlGaN/GaN HEMTs with an optimized slant-gate-based structure can ultimately be a promising candidate for high-power and high-frequency applications. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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Review

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21 pages, 3838 KiB  
Review
A Brief Overview of the Rapid Progress and Proposed Improvements in Gallium Nitride Epitaxy and Process for Third-Generation Semiconductors with Wide Bandgap
by An-Chen Liu, Yung-Yu Lai, Hsin-Chu Chen, An-Ping Chiu and Hao-Chung Kuo
Micromachines 2023, 14(4), 764; https://doi.org/10.3390/mi14040764 - 29 Mar 2023
Cited by 7 | Viewed by 3135
Abstract
In this paper, we will discuss the rapid progress of third-generation semiconductors with wide bandgap, with a special focus on the gallium nitride (GaN) on silicon (Si). This architecture has high mass-production potential due to its low cost, larger size, and compatibility with [...] Read more.
In this paper, we will discuss the rapid progress of third-generation semiconductors with wide bandgap, with a special focus on the gallium nitride (GaN) on silicon (Si). This architecture has high mass-production potential due to its low cost, larger size, and compatibility with CMOS-fab processes. As a result, several improvements have been proposed in terms of epitaxy structure and high electron mobility transistor (HEMT) process, particularly in the enhancement mode (E-mode). IMEC has made significant strides using a 200 mm 8-inch Qromis Substrate Technology (QST®) substrate for breakdown voltage to achieve 650 V in 2020, which was further improved to 1200 V by superlattice and carbon-doped in 2022. In 2016, IMEC adopted VEECO metal-organic chemical vapor deposition (MOCVD) for GaN on Si HEMT epitaxy structure and the process by implementing a three-layer field plate to improve dynamic on-resistance (RON). In 2019, Panasonic HD-GITs plus field version was utilized to effectively improve dynamic RON. Both reliability and dynamic RON have been enhanced by these improvements. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
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