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Materials
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Characterization of Thin Films and Superlattice Using Thermal Wave Methods
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Characterization of Thin Films and Superlattice Using Thermal Wave Methods

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Thin Films and Interfaces".

Deadline for manuscript submissions: closed (10 September 2023) | Viewed by 5534

Special Issue Editor

Prof. Dr. Michał Pawlak

E-Mail Website
Guest Editor
Institute of Physics, Nicolaus Copernicus University, Toruń, Poland
Interests: heat transport in thin films and superlattice; photothermal infrared radiometry; new infrared spectroscopic method

Special Issue Information

Dear Colleagues,

Thermal conductivity plays a significant role in applications focused on measuring the accurate amount of energy dissipation. Investigating this parameter will thereby pave the way for fundamental thin film characterization research. Thermal conductivity can be measured using frequency and time-domain methods. Frequency domain methods, in contrast to time-domain methods, can also quantify thermal diffusivity as well as important parameters such as thermal boundary resistance. This Special Issue is addressed to publish papers about the investigation of these parameters in thin films using thermal wave methods such as photothermal infrared radiometry, thermoreflectance, photothermal beam deflection method, thermal lens method, and photoacoustics. We look forward to all contributions.

Best wishes,

Prof. Dr. Michał Pawlak
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • photothermal
  • thermal wave methods
  • thin films
  • superlattice

Published Papers (4 papers)

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Research

10 pages, 5563 KiB  
Article
Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods
by Ameneh Mikaeeli, Dorota Korte, Humberto Cabrera, Dariusz Chomicki, Dariusz Dziczek, Oksana Kharchenko, Peng Song, Junyan Liu, Andreas D. Wieck and Michal Pawlak
Materials 2023, 16(18), 6312; https://doi.org/10.3390/ma16186312 - 20 Sep 2023
Viewed by 838
Abstract
Measurement of thermal properties of thin films is challenging. In particular, thermal characterization is very difficult in semi-transparent samples. Here, we use two photothermal methods to obtain information about the thermal diffusivity as well as thermal conductivity of azoheteroarene functionalized polymer thin layers. [...] Read more.
Measurement of thermal properties of thin films is challenging. In particular, thermal characterization is very difficult in semi-transparent samples. Here, we use two photothermal methods to obtain information about the thermal diffusivity as well as thermal conductivity of azoheteroarene functionalized polymer thin layers. The photothermal beam deflection (PBD) method is employed to gather data directly on thermal conductivity and thermal diffusivity, while the thermal lens (TL) method is employed to measure the effective thermal diffusivity. Consequently, the thermal diffusivity of the layers is indirectly estimated from the effective thermal diffusivity using a well-established theoretical relationship. Despite the utilization of distinct methods, our study reveals a remarkable consistency in the highly accurate results obtained from both approaches. This remarkable agreement reaffirms the reliability and mutual compatibility of the employed methods, highlighting their shared ability to provide accurate and congruent outcomes. Full article
(This article belongs to the Special Issue Characterization of Thin Films and Superlattice Using Thermal Wave Methods)
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16 pages, 3865 KiB  
Article
Photoacoustic Characterization of TiO2 Thin-Films Deposited on Silicon Substrate Using Neural Networks
by Katarina Lj Djordjević, Dragana K. Markushev, Marica N. Popović, Mioljub V. Nesić, Slobodanka P. Galović, Dragan V. Lukić and Dragan D. Markushev
Materials 2023, 16(7), 2865; https://doi.org/10.3390/ma16072865 - 04 Apr 2023
Cited by 1 | Viewed by 1117
Abstract
In this paper, the possibility of determining the thermal, elastic and geometric characteristics of a thin TiO2 film deposited on a silicon substrate, with a thickness of 30 μm, in the frequency range of 20 to 20 kHz with neural networks were [...] Read more.
In this paper, the possibility of determining the thermal, elastic and geometric characteristics of a thin TiO2 film deposited on a silicon substrate, with a thickness of 30 μm, in the frequency range of 20 to 20 kHz with neural networks were analysed. For this purpose, the geometric (thickness), thermal (thermal diffusivity, coefficient of linear expansion) and electronic parameters of substrates were known and constant in the two-layer model, while the following nano-layer thin-film parameters were changed: thickness, expansion and thermal diffusivity. Predictions of these three parameters of the thin-film were analysed separately with three neural networks. All of them together were joined by a fourth neural network. It was shown that the neural network, which analysed all three parameters at the same time, achieved the highest accuracy, so the use of networks that provide predictions for only one parameter is less reliable. The obtained results showed that the application of neural networks in determining the thermoelastic properties of a thin film on a supporting substrate enables the estimation of its characteristics with great accuracy. Full article
(This article belongs to the Special Issue Characterization of Thin Films and Superlattice Using Thermal Wave Methods)
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13 pages, 2701 KiB  
Article
Influence of P3HT:PCBM Ratio on Thermal and Transport Properties of Bulk Heterojunction Solar Cells
by Dorota Korte, Egon Pavlica, Domen Klančar, Gvido Bratina, Michal Pawlak, Ewa Gondek, Peng Song, Junyan Liu and Beata Derkowska-Zielinska
Materials 2023, 16(2), 617; https://doi.org/10.3390/ma16020617 - 09 Jan 2023
Cited by 1 | Viewed by 1447
Abstract
The influence of P3HT:PCBM ratio on thermal and transport properties of solar cells were determined by photothermal beam deflection spectrometry, which is advantageous tool for non-destructively study of bulk heterojunction layers of organic solar cells. P3HT:PCBM layers of different P3HT:PCBM ratios were deposited [...] Read more.
The influence of P3HT:PCBM ratio on thermal and transport properties of solar cells were determined by photothermal beam deflection spectrometry, which is advantageous tool for non-destructively study of bulk heterojunction layers of organic solar cells. P3HT:PCBM layers of different P3HT:PCBM ratios were deposited on top of PEDOT:PSS/ITO layers which were included in organic bulk-heterojunction solar cells. The thermal diffusivity, energy gap and charge carrier lifetime were measured at different illumination conditions and with a different P3HT:PCBM ratios. As expected, it was found that the energy band gap depends on the P3HT:PCBM ratio. Thermal diffusivity is decreasing, while charge carrier lifetime is increasing with PCBM concentration. Energy band gap was found to be independent on illumination intensity, while thermal diffusivity was increasing and carrier lifetime was decreasing with illumination intensity. The carrier lifetime exhibits qualitatively similar dependence on the PCBM concentration when compared to the open-circuit voltage of operating solar cells under AM1.5 illumination. BDS and standard I-V measurement yielded comparable results arguing that the former is suitable for characterization of organic solar cells. Full article
(This article belongs to the Special Issue Characterization of Thin Films and Superlattice Using Thermal Wave Methods)
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12 pages, 4021 KiB  
Article
Influence of Post Processing on Thermal Conductivity of ITO Thin Films
by Anna Kaźmierczak-Bałata, Jerzy Bodzenta, Mohsen Dehbashi, Jeyanthinath Mayandi and Vishnukanthan Venkatachalapathy
Materials 2023, 16(1), 362; https://doi.org/10.3390/ma16010362 - 30 Dec 2022
Cited by 2 | Viewed by 1321
Abstract
This work presents the influence of post processing on morphology, thermal and electrical properties of indium tin oxide (ITO) thin films annealed at 400 °C in different atmospheres. The commercially available 170 nm thick ITO layers deposited on glass were used as a [...] Read more.
This work presents the influence of post processing on morphology, thermal and electrical properties of indium tin oxide (ITO) thin films annealed at 400 °C in different atmospheres. The commercially available 170 nm thick ITO layers deposited on glass were used as a starting material. The X-ray diffraction measurements revealed polycrystalline structure with dominant signal from (222) plane for all samples. The annealing reduces the intensity of this peak and causes increase of (221) and (440) peaks. Atomic force microscopy images showed that the surface morphology is typical for polycrystalline layers with roughness not exceeding few nm. Annealing in the oxygen and the nitrogen-hydrogen mixture (NHM) changes shapes of grains. The electrical conductivity decreases after annealing except the one of layer annealed in NHM. Thermal conductivities of annealed ITO thin films were in range from 6.4 to 10.6 W·m−1·K−1, and they were higher than the one for starting material—5.1 W·m−1·K−1. Present work showed that annealing can be used to modify properties of ITO layers to make them useful for specific applications e.g., in ITO based solar cells. Full article
(This article belongs to the Special Issue Characterization of Thin Films and Superlattice Using Thermal Wave Methods)
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