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Wavelet Features in Remote Sensing Image Processing

A special issue of Remote Sensing (ISSN 2072-4292). This special issue belongs to the section "Remote Sensing Image Processing".

Deadline for manuscript submissions: closed (31 December 2019) | Viewed by 736

Special Issue Editor

E-Mail Website1 Website2
Guest Editor
Department Software Engineering and Artificial Intelligence, Faculty of Informatics, University Complutense of Madrid, 28040 Madrid, Spain
Interests: computer vision; image processing; pattern recognition; 3D image reconstruction, spatio-temporal image change detection and tracking; fusion and registering from imaging sensors; superresolution from low-resolution image sensors
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Special Issue Information

Dear Colleagues,

Wavelet transforms provide excellent tools and functionalities for discrete Remote Sensing images. Images can be analyzed at different scales i.e. at different resolutions (multiresolution) in order to discover hidden features useful for posterior analysis. The decomposition level can be as deep as required, where approximation and detail coefficients (horizontal, vertical, diagonal) can bring out relevant features for different purposes in the broad range of applications based on remote sensing.

This Special Issue is focused on the use of wavelets in remote sensing for feature extraction in order to cover the broad range of possibilities in remote sensing. Theoretical, methodological, experimental and application papers are welcome (but not limited to) the following aspects:

  • Image change detection
  • Image fusion: multiresolution/multi(hyper)spectral/multisensory
  • Pattern recognition/classification
  • Texture analysis
  • Registration
  • Correlation
  • Denoising/enhancement/filtering
  • Compression

Prof. Dr. Gonzalo Pajares Martinsanz
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Remote Sensing is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2700 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • wavelets
  • change detection
  • fusion
  • texture analysis
  • pattern recognition
  • registering
  • correlation
  • filtering
  • compression

Published Papers

There is no accepted submissions to this special issue at this moment.
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