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Surface Imaging/Spectroscopy at the Solid/Liquid Interface
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Surface Imaging/Spectroscopy at the Solid/Liquid Interface

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Thin Films and Interfaces".

Deadline for manuscript submissions: closed (31 December 2022) | Viewed by 2742

Special Issue Editor

Dr. Michał Mosiałek

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Guest Editor
Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, Niezapominajek 8, PL–30239 Krakow, Poland
Interests: nanomaterials; solid-oxide fuel cells; aluminum-ion batteries; corrosion; alloys; soft matter nanostructures
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Understanding the essence of the processes taking place at the solid/liquid interface has a very important cognitive meaning. A conference devoted to these issues is organized in Krakow every 3 years. In this Special Issue we would like to present both the works that were presented at the 6th edition of International Symposium on Surface Imaging/Spectroscopy at the Solid/Liquid Interface as well as other interesting works on this subject.

This Special Issue is focused on:

- New materials for electrochemistry- and energy-related applications—their synthesis and characterization by in situ and ex situ spectroscopic, microscopic, SPM and electrochemical techniques.

- Nanomaterials for energy storage, energy conversion and sensing applications.

- Application of spectroscopic, microscopic, SPM and electrochemical techniques in studies of surfaces modified by metal oxides, semiconductors, polymers, colloids, hybrid materials and nano-sized catalysts.

- High-resolution imaging of clusters, biomolecules and biological systems and their characterization using electrochemical methods.

- Fundamentals of surface structure, reactivity and electron transfer—comparison of experimental and theoretical results.

Dr. Michał Mosiałek
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • fuel cells
  • metal-ion batteries
  • plasma electrolytic oxidation
  • corrosion
  • scanning electrochemical microscopy
  • anodic nanotube layers

Published Papers (1 paper)

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Research

13 pages, 2420 KiB  
Article
PbS and PbO Thin Films via E-Beam Evaporation: Morphology, Structure, and Electrical Properties
by Saad Akhtar, Nimra Saeed, Muhammad Bilal Hanif, Zia-ur-Rehman, Salahuddin Dogar, Waqar Mahmood, Michał Mosiałek, Bogna Daria Napruszewska, Muhammad Ashraf, Martin Motola and Abdul Faheem Khan
Materials 2022, 15(19), 6884; https://doi.org/10.3390/ma15196884 - 04 Oct 2022
Cited by 6 | Viewed by 2424
Abstract
Thin films of lead sulfide (PbS) are being extensively used for the fabrication of optoelectronic devices for commercial and military applications. In the present work, PbS films were fabricated onto a soda lime glass substrate by using an electron beam (e-beam) evaporation technique [...] Read more.
Thin films of lead sulfide (PbS) are being extensively used for the fabrication of optoelectronic devices for commercial and military applications. In the present work, PbS films were fabricated onto a soda lime glass substrate by using an electron beam (e-beam) evaporation technique at a substrate temperature of 300 °C. Samples were annealed in an open atmosphere at a temperature range of 200–450 °C for 2 h. The deposited films were characterized for structural, optical, and electrical properties. Structural properties of PbS have been studied by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), energy dispersive spectroscopy (EDS), and Rutherford backscattering spectrometry (RBS). The results of XRD showed that the PbS thin film was crystalline in nature at room temperature with cubic crystal structure (galena) and preferential (111) and orientation (022). The morphology of the thin films was studied by FESEM, which also showed uniform and continuous deposition without any peel-off and patches. EDS analysis was performed to confirm the presence of lead and sulfur in as-deposited and annealed films. The thickness of the PbS film was found to be 172 nm, which is slightly greater than the intended thickness of 150 nm, determined by RBS. Ultraviolet-Visible-Near-Infrared (UV-Vis-NIR) spectroscopy revealed the maximum transmittance of ~25% for as-deposited films, with an increase of 74% in annealed films. The band gap of PbS was found in the range of 2.12–2.78 eV for as-deposited and annealed films. Hall measurement confirmed the carriers are p-type in nature. Carrier concentration, mobility of the carriers, conductivity, and sheet resistance are directly determined by Hall-effect measurement. The as-deposited sample showed a conductivity of 5.45 × 10−4 S/m, which gradually reduced to 1.21 × 10−5 S/m due to the composite nature of films (lead sulfide along with lead oxide). Furthermore, the present work also reflects the control of properties by controlling the amount of PbO present in the PbS films which are suitable for various applications (such as IR sensors). Full article
(This article belongs to the Special Issue Surface Imaging/Spectroscopy at the Solid/Liquid Interface)
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