Research on Deep Learning in Object Detection

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Computing and Artificial Intelligence".

Deadline for manuscript submissions: 20 August 2024 | Viewed by 362

Special Issue Editors


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Guest Editor
Department of Engineering, University of Trás-os-Montes and Alto Douro and INESC TEC, 5000-801 Vila Real, Portugal
Interests: computer vision; image and video processing; machine learning; artificial intelligence

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Guest Editor
School of Science and Technology, University of Trás-os-Montes e Alto Douro, Portugal C-MADE / UTAD, Quinta de Prados, 5000 Vila Real, Portugal
Interests: energy efficiency; buildings sustainability; sustainable materials; construction economics; machine learning
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
1. School of Technology and Management, Polytechnic University of Leiria, 2411-901 Leiria, Portugal
2. Institute for Systems Engineering and Computers at Coimbra (INESC Coimbra), 3030-290 Coimbra, Portugal
Interests: computer vision and image processing; artificial intelligence and deep learning in health systems; medical image analysis; biosensors; sensor-based systems; industrial automation systems; Industry 4.0
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

A fundamental problem in computer vision is the task of object identification. It is essential to many applications, from robots and augmented reality to autonomous driving and surveillance. Accurately localizing and categorizing items inside intricate and varied settings is one of the main issues in object detection. Deep learning methods have significantly improved object detection in recent years, creating new research opportunities and revolutionizing the field. Deep learning-based methods that use convolutional neural networks (CNNs) to extract rich representations of objects from unprocessed picture data have successfully addressed this difficulty. These models have enhanced detection resilience and accuracy by capturing complex patterns.

The Special Issue covers a broad spectrum of study areas, emphasising the creation of innovative architectures, feature extraction strategies, and training approaches for deep learning-based object identification. Researchers have explored a range of architectural designs, including one-stage detectors and two-stage detectors, each with unique advantages and disadvantages concerning accuracy and speed. Furthermore, due to their potential to enhance object detection and localization, attention processes, including self-attention and spatial attention, have drawn interest.

This Special Issue aims to present a thorough summary of current developments and new directions in deep learning for object detection, compiling original research and review articles on recent advances, technologies, solutions, applications, and novel challenges in this field.

Potential topics include, but are not limited to, the following:

  • Advancements in convolutional neural networks for object detection;
  • One-stage vs. two-stage detectors;
  • Role of transfer learning in object detection;
  • Real-time object detection for autonomous vehicles;
  • Object detection in aerial imagery;
  • Deep learning approaches to object detection in medical imaging;
  • Challenges in dataset annotation and bias in object detection models;
  • Edge computing and mobile deployment of object detection models.

Dr. António Manuel Trigueiros Da Silva Cunha
Dr. Sandra Pereira
Dr. Paulo Jorge Coelho
Guest Editors

Manuscript Submission Information

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Keywords

  • object detection
  • deep learning
  • instance segmentation
  • architecture design
  • feature extraction

Published Papers (1 paper)

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Research

18 pages, 9565 KiB  
Article
An Instance Segmentation Method for Insulator Defects Based on an Attention Mechanism and Feature Fusion Network
by Junpeng Wu, Qitong Deng, Ran Xian, Xinguang Tao and Zhi Zhou
Appl. Sci. 2024, 14(9), 3623; https://doi.org/10.3390/app14093623 - 25 Apr 2024
Viewed by 209
Abstract
Among the existing insulator defect detection methods, the automatic detection of inspection robots based on the instance segmentation algorithm is relatively more efficient, but the problem of the limited accuracy of the segmentation algorithm is still a bottleneck for increasing inspection efficiency. Therefore, [...] Read more.
Among the existing insulator defect detection methods, the automatic detection of inspection robots based on the instance segmentation algorithm is relatively more efficient, but the problem of the limited accuracy of the segmentation algorithm is still a bottleneck for increasing inspection efficiency. Therefore, we propose a single-stage insulator instance defect segmentation method based on both an attention mechanism and improved feature fusion network. YOLACT is selected as the basic instance segmentation model. Firstly, to improve the segmentation speed, MobileNetV2 embedded with an scSE attention mechanism is introduced as the backbone network. Secondly, a new feature map that combines semantic and positional information is obtained by improving the FPN module and fusing the feature maps of each layer, during which, an attention mechanism is introduced to further improve the quality of the feature map. Thirdly, in view of the problems that affect the insulator segmentation, a Restrained-IoU (RIoU) bounding box loss function which covers the area deviation, center deviation, and shape deviation is designed for object detection. Finally, for the validity evaluation of the proposed method, experiments are performed on the insulator defect data set. It is shown in the results that the improved algorithm achieves a mask accuracy improvement of 5.82% and a detection speed of 37.4 FPS, which better complete the instance segmentation of insulator defect images. Full article
(This article belongs to the Special Issue Research on Deep Learning in Object Detection)
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