Latest Research on Electronic Noise
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".
Deadline for manuscript submissions: 30 August 2024 | Viewed by 1828
Interests: design of dedicated; low-noise and high-sensitivity instrumentation; design and characterization of sensors
Special Issues, Collections and Topics in MDPI journals
Electronic noise has often been considered a problem, and is seen as a disturbance to be eliminated or, at least, reduced as much as possible.However, having its origins in the interaction between matter and charged particles and carrying information about the phenomena that occur at the microscopic level, it can give useful information on the structure of the device under test (DUT) or on its working mechanisms. In this sense, therefore, measuring noise is a powerful device and material characterization technique. This Special Issue aims to collect works that address noise from different points of view: as a knowledge tool or as an issue to be controlled and reduced. Physical interpretations, models, applications, dedicated instrumentation, and measurements are among the topics that we intend to explore.
Dr. Graziella Scandurra
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- sensors’ characterization and reliability
- noise characterization
- electronic noise
- noise in cryptography
- low noise instrumentation
- signal processing
- measuring noise