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Sensors and X-ray Detectors
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Sensors and X-ray Detectors

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Optical Sensors".

Deadline for manuscript submissions: closed (31 October 2021) | Viewed by 8708

Special Issue Editor

Prof. Dr. Youngjin Lee

E-Mail Website
Guest Editor
Department of Radiological Science, Gachon University, 191, Hambakmoe-ro, Yeonsu-gu, Incheon 21936, Republic of Korea
Interests: medical imaging; image processing; photon-counting detector technology; medical physics
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Medical and industrial imaging systems including X-ray sources provide us with the ability to look inside a subject. Recent developments have led to widespread research in the field of sensor and X-ray detector technologies, such as flat-panel, CMOS, semiconductor, photon counting, etc., in combinations of various types. In addition, research using Monte Carlo simulation for the pre-modeling of sensors and detectors is also actively being conducted. This Special Issue will highlight state-of-the-art sensor and detector modalities and applications in various imaging fields. Both research papers and systematic review articles will be considered. Contributions addressing the subsequent list of keywords will be considered.

Prof. Dr. Youngjin Lee
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Sensor technology
  • X-ray detector technology
  • Medical imaging
  • Measuring system and signal processing
  • Radiation detector, system design, and applications
  • Growth and search for new sensor or detector material
  • Monte Carlo simulation
  • Application of machine learning
  • Low-cost or low-dose system

Published Papers (3 papers)

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Research

10 pages, 2781 KiB  
Communication
A Study on the Performance of a Silicon Photodiode Sensor for a Particle Dosimeter and Spectrometer
by Bobae Kim, Uk-Won Nam, Sunghwan Kim, Sukwon Youn, Won-Kee Park, Jongdae Sohn, Hong Joo Kim, Seh-Wook Lee, Junga Hwang, Sung-Joon Ye, Insoo Jun and Young-Jun Choi
Sensors 2021, 21(23), 8029; https://doi.org/10.3390/s21238029 - 01 Dec 2021
Cited by 2 | Viewed by 2245
Abstract
A lunar vehicle radiation dosimeter (LVRAD) has been proposed for studying the radiation environment on the lunar surface and evaluating its impact on human health. The LVRAD payload comprises four systems: a particle dosimeter and spectrometer (PDS), a tissue-equivalent dosimeter, a fast neutron [...] Read more.
A lunar vehicle radiation dosimeter (LVRAD) has been proposed for studying the radiation environment on the lunar surface and evaluating its impact on human health. The LVRAD payload comprises four systems: a particle dosimeter and spectrometer (PDS), a tissue-equivalent dosimeter, a fast neutron spectrometer, and an epithermal neutron spectrometer. A silicon photodiode sensor with compact readout electronics was proposed for the PDS. The PDS system aims to measure protons with 10–100 MeV of energy and assess dose in the lunar space environment. The manufactured silicon photodiode sensor has an effective area of 20 mm × 20 mm and thickness of 650 μm; the electronics consist of an amplifier, analog pulse processor, and a 12-bit analog-to-digital converter for signal readout. We studied the responses of silicon sensors which were manufactured with self-made electronics to gamma rays with a wide range of energies and proton beams. Full article
(This article belongs to the Special Issue Sensors and X-ray Detectors)
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19 pages, 6036 KiB  
Article
The X-ray Sensitivity of an Amorphous Lead Oxide Photoconductor
by Oleksandr Grynko, Tristen Thibault, Emma Pineau and Alla Reznik
Sensors 2021, 21(21), 7321; https://doi.org/10.3390/s21217321 - 03 Nov 2021
Cited by 7 | Viewed by 2116
Abstract
The photoconductor layer is an important component of direct conversion flat panel X-ray imagers (FPXI); thus, it should be carefully selected to meet the requirements for the X-ray imaging detector, and its properties should be clearly understood to develop the most optimal detector [...] Read more.
The photoconductor layer is an important component of direct conversion flat panel X-ray imagers (FPXI); thus, it should be carefully selected to meet the requirements for the X-ray imaging detector, and its properties should be clearly understood to develop the most optimal detector design. Currently, amorphous selenium (a-Se) is the only photoconductor utilized in commercial direct conversion FPXIs for low-energy mammographic imaging, but it is not practically feasible for higher-energy diagnostic imaging. Amorphous lead oxide (a-PbO) photoconductor is considered as a replacement to a-Se in radiography, fluoroscopy, and tomosynthesis applications. In this work, we investigated the X-ray sensitivity of a-PbO, one of the most important parameters for X-ray photoconductors, and examined the underlying mechanisms responsible for charge generation and recombination. The X-ray sensitivity in terms of electron–hole pair creation energy, W±, was measured in a range of electric fields, X-ray energies, and exposure levels. W± decreases with the electric field and X-ray energy, saturating at 18–31 eV/ehp, depending on the energy of X-rays, but increases with the exposure rate. The peculiar dependencies of W± on these parameters lead to a conclusion that, at electric fields relevant to detector operation (~10 V/μm), the columnar recombination and the bulk recombination mechanisms interplay in the a-PbO photoconductor. Full article
(This article belongs to the Special Issue Sensors and X-ray Detectors)
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16 pages, 3695 KiB  
Article
Estimating the Product of the X-ray Spectrum and Quantum Detection Efficiency of a CT System and Its Application to Beam Hardening Correction
by Joseph J. Lifton and Andrew A. Malcolm
Sensors 2021, 21(9), 3284; https://doi.org/10.3390/s21093284 - 10 May 2021
Cited by 2 | Viewed by 2667
Abstract
Lab-based X-ray computed tomography (XCT) systems use X-ray sources that emit a polychromatic X-ray spectrum and detectors that do not detect all X-ray photons with the same efficiency. A consequence of using a polychromatic X-ray source is that beam hardening artefacts may be [...] Read more.
Lab-based X-ray computed tomography (XCT) systems use X-ray sources that emit a polychromatic X-ray spectrum and detectors that do not detect all X-ray photons with the same efficiency. A consequence of using a polychromatic X-ray source is that beam hardening artefacts may be present in the reconstructed data, and the presence of such artefacts can degrade XCT image quality and affect quantitative analysis. If the product of the X-ray spectrum and the quantum detection efficiency (QDE) of the detector are known, alongside the material of the scanned object, then beam hardening artefacts can be corrected algorithmically. In this work, a method for estimating the product of the X-ray spectrum and the detector’s QDE is offered. The method approximates the product of the X-ray spectrum and the QDE as a Bézier curve, which requires only eight fitting parameters to be estimated. It is shown experimentally and through simulation that Bézier curves can be used to accurately simulate polychromatic attenuation and hence be used to correct beam hardening artefacts. The proposed method is tested using measured attenuation data and then used to calculate a beam hardening correction for an aluminium workpiece; the beam hardening correction leads to an increase in the contrast-to-noise ratio of the XCT data by 41% and the removal of cupping artefacts. Deriving beam hardening corrections in this manner is more versatile than using conventional material-specific step wedges. Full article
(This article belongs to the Special Issue Sensors and X-ray Detectors)
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