Artificial Intelligence and Sensor-Enhanced Fault Diagnosis for Industrial Application
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Intelligent Sensors".
Deadline for manuscript submissions: 25 June 2024 | Viewed by 591
Special Issue Editors
Interests: fault diagnosis and state monitoring; fault-tolerant control; iterative learning control; biochemical process synthesis
Special Issues, Collections and Topics in MDPI journals
Interests: complex system fault diagnosis and fault tolerance control; multi-robot collaborative path planning and control; sewage treatment process
Interests: fault diagnosis and state monitoring; fault-tolerant control; distributed control; intelligent connected vehicle
Special Issue Information
Dear Colleagues,
In Industry 4.0, a key goal is to digitize and intelligentize condition monitoring and fault diagnosis technologies in complex industrial production processes. In the past decade, artificial intelligence, as a supplement to traditional physics-based and signal-processing-based fault detection, diagnosis, and prediction technologies, has provided a promising tool for industrial production lines to achieve automated safety production and accurate fault prediction.
This Special Issue will focus on the advanced research and engineering innovations in the adoption of artificial intelligence technologies for fault detection, diagnosis and prediction. Researchers are welcome to publish original research on the latest findings related to intelligent techniques of fault diagnosis in manufacturing production processes.
Topics of interest include, but are not limited to, the following:
- Fault mechanism analysis;
- Data-driven fault diagnosis and state monitoring;
- Fault-tolerant control for complex systems;
- Statistical learning, machine learning, artificial intelligence, data mining, big data analysis, and signal processing techniques in fault diagnosis;
- Reliability analysis, remaining life prognosis, and non-destructive testing;
- Health maintenance and performance evaluation
- Advanced imaging process and optimization method;
- Sensors and instrument measurement;
- Nonlinear system analysis and control.
Prof. Dr. Jing Wang
Dr. Meng Zhou
Dr. Shenghui Guo
Dr. Weixin Han
Guest Editors
Manuscript Submission Information
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