New Frontiers in Optical Coordinate Measuring Systems

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (30 September 2022) | Viewed by 493

Special Issue Editors

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Guest Editor
Laboratory of Coordinate Metrology, Faculty of Mechanical Engineering, Cracow University of Technology, Krakow, Poland
Interests: mechanical engineering; coordinate metrology and its applications in production engineering; micro and nano dimensional metrology; calibration methods for coordinate systems; fringe optics systems and photogrammetry; metrological aspects of reverse engineering; metrology in industrial design and Industry 4.0; quality engineering; quality management systems
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E-Mail Website
Guest Editor
Laboratory of Coordinate Metrology, Faculty of Mechanical Engineering, Cracow University of Technology, al. Jana Pawla II 37, 31-864 Krakow/Cracow, Poland
Interests: coordinate measuring technique; contact and contactless measurements; simulation and modeling of measuring systems, especially those with open kinematic chain; coordinate metrology in medicine and bioengineering; in-process/in-line metrology
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Laboratory of Coordinate Metrology, Mechanical Department, Cracow University of Technology, Al. Jana Pawla II 37, 31-864 Krakow, Poland
Interests: coordinate metrology (in scales ranging from nanometers to large volume objects); in-process metrology; coordinate measuring systems (including portable measuring systems and computed tomography systems); measurement accuracy; simulation and numerical methods in metrology (especially the Monte Carlo method); methods for identifying and correcting geometric errors of machines
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Coordinate measuring systems offer high accuracy, automation of measurements and universality, which translates into shortening of the measurement time, which is one of the most sought aspects of measurements in the Industry 4.0 era. Five years ago, a contact Coordinate Measuring Machine might still be regarded as the most common and most accurate (it allows one to obtain accuracy of up to 0.1 μm) tool of the coordinate technique. It is still hard to reach this accuracy on contactless, optical systems, but they display other important advantages, mainly the mentioned shortening of the measurement time and the possibility of obtaining information-rich measurement results. The trend observed in recent years clearly indicates that systems of this type, additionally operating in connection with automation systems and devices such as industrial robots, will be one of the most popular tools, in the future, for quality assessment in advanced production processes.

We invite contributions to this Special Issue on topics including, but not limited to, the following areas:

  • Optical Coordinate Measuring Machines;
  • Multisensor Coordinate Measuring Machines;
Optical metrology in manufacturing:
  • CCD/CMOS sensors;
  • Laser triangulation sensors;
  • Structured light sensors;
  • Vision-based measurement systems;
  • Fringe optics.

Optical metrology systems integrated in manufacturing tools and lines:

  • Optical solutions for in-process control;
  • Optical in situ measurements;
  • In-line optical inspection systems;
  • Automation of optical measuring systems.
  • Portable optical measuring systems;
  • Optical metrology systems in Industry 4.0;
Traceability of optical metrology systems:
  • Calibration and verification;
  • Uncertainty estimation;
  • Identification and correction of error sources;
  • System’s accuracy modeling.

Prof. Dr. Jerzy A. Sładek
Prof. Dr. Ksenia Ostrowska
Prof. Dr. Adam Gąska
Guest Editors

Manuscript Submission Information

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  • optical CMM
  • optical metrology
  • coordinate metrology
  • Industry 4.0
  • accuracy improvements
  • CCD/CMOS sensors
  • confocal sensor
  • laser triangulation sensor
  • structured light sensor
  • white light sensor
  • video probe
  • digital image processing
  • multisensor CMM
  • measurement uncertainty
  • error sources
  • calibration and verification
  • traceability

Published Papers

There is no accepted submissions to this special issue at this moment.
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