Advanced Spectral Imaging Applications: Characterization, Detection and Classification

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: 30 April 2024 | Viewed by 883

Special Issue Editor


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Guest Editor
State Key Discipline Laboratory of Color Science and Engineering and State Education Ministry Key Laboratory of Photoelectronic Imaging Technology and Systems, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
Interests: hyper-spectral and multi-spectral imaging; color science; color imaging technology

Special Issue Information

Dear Colleagues,

Spectral imaging technology is a combination of imaging and spectral detection technology, which can obtain spectral information on any pixel of the target. According to the spectral resolution, spectral imaging technologies include multi-spectral imaging and hyper-spectral imaging. According to the spectral range, they include ultraviolet, visible, and infrared spectral imaging. According to the optical system, they include scanning, snapshot, and compressed sensing. Advanced spectral imaging technologies are fundamental tools for the development of many fields. They are extensively applied in fields such as biology, geography, agriculture, medical treatment, military, printing industry, aerospace, etc. Specifically, spectral information can be utilized for geological detection, material classification, component analysis, remote sensing imaging, color reproduction, and so on. Therefore, this Special Issue aims to present advanced spectral imaging technologies and applications, including new methods and experimental results from theoretical research to application.

This Special Issue focuses on, but is not limited to, ultraviolet, visible, and infrared spectral imaging technologies, multi-spectral and hyper-spectral imaging, applications in characterization, detection, classification, remote sensing, and color reproduction, as well as other issues in spectral imaging and applications.

Dr. Ningfang Liao
Guest Editor

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Keywords

  • spectral imaging
  • spectral imaging applications
  • multi-spectral imaging
  • hyper-spectral imaging

Published Papers (1 paper)

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Research

13 pages, 16687 KiB  
Article
A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements
by Simon Verspeek, Thomas De Kerf, Bart Ribbens, Xavier Maldague, Steve Vanlanduit and Gunther Steenackers
Appl. Sci. 2024, 14(1), 235; https://doi.org/10.3390/app14010235 - 27 Dec 2023
Viewed by 626
Abstract
In non-destructive inspections today, the size of the sample being examined is often limited to fit within the field of view of the camera being used. When examining larger specimens, multiple image sequences need to be stitched together into one image. Due to [...] Read more.
In non-destructive inspections today, the size of the sample being examined is often limited to fit within the field of view of the camera being used. When examining larger specimens, multiple image sequences need to be stitched together into one image. Due to uneven illumination, the combined image may have artificial defects. This manuscript provides a solution for performing line-scan measurements from a sample and combining the images to avoid these artificial defects. The proposed algorithm calculates the pixel shift, either through checkerboard detection or by field of view (FOV) calculation, for each image to create the stitched image. This working principle eliminates the need for synchronisation between the motion speed of the object and the frame rate of the camera. The algorithm is tested with several cameras that operate in different wavelengths (ultraviolet (UV), visible near infrared (Vis-NIR) and long-wave infrared (LWIR)), each with the corresponding light sources. Results show that the algorithm is able to achieve subpixel stitching accuracy. The side effects of heterogeneous illumination can be solved using the proposed method. Full article
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