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Journal: Electronics, 2023
Volume: 12
Number: 540

Article: Observation of Large Threshold Voltage Shift Induced by Pre-applied Voltage to SiO2 Gate Dielectric in Organic Field-Effect Transistors
Authors: by Yifu Guo, Junyang Deng, Jiebin Niu, Chunhui Duan, Shibing Long, Mengmeng Li and Ling Li
Link: https://www.mdpi.com/2079-9292/12/3/540

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