Selected Papers from 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Intelligent Sensors".
Deadline for manuscript submissions: closed (31 December 2020) | Viewed by 499
Special Issue Editors
Interests: time and frequency measurements; measurement methods for signal/instrument characterization/calibration; data acquisition systems (DAQ); hardware design for instrumentation; applied Compressed Sensing (CS) and compressive sampling techniques
Special Issues, Collections and Topics in MDPI journals
Interests: biomedical and mechanical engineering; wearable sensors; measurement devises and techniques; sensors
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The 24th IMEKO TC4 International Symposium and the 22nd International Workshop on ADC and DAC Modelling and Testing (http://www.imeko-tc4-2020.org/) will be held online from 14 to 16 September 2020. The authors of papers in topics of interest to Sensors who present at this workshop are invited to submit extended versions of their work to the related Special Issue for publication.
IMEKO TC-4 Symposium Topics：
- Direct current and low frequency measurements;
- Radio frequency, microwave, and millimeter wave measurements;
- Calibration, metrology, and standards;
- Traceability and international compatibility of measurements;
- Advanced instrumentation based on micro- and nano-technologies;
- Signal and image processing;
- Waveform analysis and measurements;
- System identification and control;
- Embedded systems;
- Ambient systems and computer-assisted living;
- Software measurements;
- Biomedical measurements;
- EMC measurements;
- Power and energy measurements;
- Power quality assessment;
- Time and frequency measurements;
- Automated test and measurement systems;
- Measurement and instrumentation for industrial applications;
- Marine instrumentation technology;
- Sensors and transducers;
- Virtual measurement systems;
- Sensors interoperability;
- Wireless sensor networks.
IWADC Topics:
- AD&DA advanced techniques, circuits, and applications;
- Σ-Δ ADCs and their applications;
- Auxiliary circuits for ADC;
- ADC&DAC modelling;
- ADC&DAC testing and calibration;
- Signal processing for ADC;
- Signal quantization and roundoff;
- Resolution enhancement and autocorrection.
Dr. Ioan Tudosa
Dr. Francesco Scardulla
Guest Editors
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