Optoelectronic Detection Technologies and Applications
A special issue of Photonics (ISSN 2304-6732).
Deadline for manuscript submissions: 10 October 2024 | Viewed by 675
Special Issue Editors
Interests: photoelectronic detection; optical testing; laser technology and applications
Interests: photoelectronic information; nano-optics; optical thin films
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Photoelectronic detection technology, as one of the major means of acquiring information, has the advantages of high precision, fast response, remote detection, and so on. Photoelectronic detection technology is a comprehensive subject based on optics, mechanics, electronics, computers, etc. In the last few decades, enormous progress has been made in photoelectronic detection technology, due to the rapid development of laser technology, optical waveguide technology, optical fiber technology, photo-detection technology, computer technology, as well as the continuous emergence of new materials, new devices, and new processes. Photoelectronic detection technology has a wide range of applications and plays an increasingly important role in both military and civilian fields.
This Special Issue invites manuscripts that introduce the recent advances in “Optoelectronic Detection Technologies and Applications”. All theoretical, numerical, and experimental papers are welcomed. Topics include, but are not limited to, the following:
- UV/VIS/IR detection technologies and applications;
- Terahertz detection technologies and applications;
- Low-level light detection technologies and applications;
- Single-photon detection technologies and applications;
- Laser detection technologies and applications;
- Polarization detection technologies and applications;
- Quantum detection technologies and applications;
- Multi-spectral/high-spectral/hyper-spectral detection technologies and applications;
- High dynamic imaging technologies and applications;
- High-speed imaging technologies and applications;
- 3D imaging technologies and applications;
- Optoelectronic devices technologies and applications;
- Novel Microwave detection technologies and applications;
- Composite detection technologies and applications;
- Space detection technologies and applications;
- Intelligent optoelectronic detection technologies and applications.
Prof. Dr. Bincheng Li
Prof. Dr. Dawei Zhang
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- UV/VIS/IR detection
- terahertz detection
- single-photon detection
- laser detection
- quantum detection
- multi-spectral/high-spectral/hyper-spectral detection
- high dynamic imaging
- 3D imaging
- optoelectronic devices
- intelligent optoelectronic detection