Research on Lattice Distortion and Residual Stress as a Function of Surface Treatment

A special issue of Metals (ISSN 2075-4701).

Deadline for manuscript submissions: closed (28 January 2020) | Viewed by 364

Special Issue Editor


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Guest Editor
1. Institute of Materials Science and Engineering, Department TEXMAT, Clausthal University of Technology, Agricolastrasse 6, D-38678 Clausthal-Zellerfeld, Germany
2. Helmholtz Zentrum Geesthacht, Max Planck Straße 1, Geb. 33, D-21502 Geesthacht, Germany
Interests: crystallographic texture; materials characterization using X-rays; neutrons; synchrotrons and EBSD; instrumentation for in situ analytics; phase evolution; residual stresses
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Special Issue Information

Dear Colleagues,

Most engineering parts include a surface treatment to improve overall fatigue and corrosion properties or to optimize surface quality as one of the final processing steps. All these techniques (laser peening, shot peening, ball burnishing, swaging, etc.) together with all other methods used on machine sample surfaces (metal cutting, shipping production, polishing, machining, etc.) result in a distortion in the micro- or nanoscale of surfaces. These distortions accumulate many kinds of defects, which can be seen as residual stresses in a finished product. Due to the length scale, residual stresses are divided into σ1 stresses, which are average strains over a defined gage volume of a number of grains; into σ2, which describes the average strain in one grain; and into σ3 local strain at nano-level inside grains. Diffraction methods allow one to separate by investigation reflex position, line broadening, and line profile. The major part is the residual stress, which is the most important in practice.

We ask for all kinds of residual stresses related to surface treatment, but we will give priority to macro-stresses (σ1-stresses).

 

Prof. Dr. Heinz-Günter Brokmeier

Guest Editor

Keywords

  • Residual stresses
  • Surface treatment (peening, machining, swaging, and burnishing)
  • Distortion
  • Diffraction methods
  • Reflex position
  • Line broadening

Published Papers

There is no accepted submissions to this special issue at this moment.
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