Angle-Resolved Photoemission Spectroscopy and Materials Characterization
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 July 2022) | Viewed by 634
Special Issue Editor
Interests: 2D materials; ARPES; 2D heterostructures; transition metal dichalcogenides; graphene; electronic properties; surface science; photoemission; surface characterization
Special Issue Information
Dear Colleagues,
Angle-resolved photoemission spectroscopy (ARPES) is one of the most interesting techniques in solid-state physics today.
Conventional ARPES allows the direct measurement of electron k-space position, energy, and effective mass; additionally, by means of high-resolution equipment, one can also study many-body interactions such as electron–electron scattering, electron–phonon scattering, and defect scattering.
In the last few years, many ARPES variants have been created hand in hand with technological advances including time-, spatially, spin-resolved ARPES, high-energy ARPES, secondary electron ARPES, and orbital tomography. Therefore, ARPES can now also produce dynamics, real-space, spin, bulk, and empty-states information. Moreover, some of these variants have been combined together; for instance, spin-resolved ARPES can also be spatially and time-resolved, offering an incredible amount of material information.
ARPES measurements are routinely used in combination with other techniques. For example, micro-ARPES is usually coupled with micro-Raman, micro-photoluminescence, and scanning probe microscopies. Another example is the combination of ARPES with electronic, spintronic, and optoelectronic measurements, especially using ultra-thin stacked heterostructure devices.
This Special Issue is devoted to the latest developments in ARPES and its integration with other material characterization techniques.
It is my pleasure to invite you to submit a manuscript for this Special Issue. Full papers, communications, and reviews are all welcome.
Dr. Mattia Cattelan
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- ARPES
- spin-resolved ARPES
- time-resolved ARPES
- spatially localized ARPES
- orbital tomography
- high-energy ARPES
- secondary electron ARPES
- pump-and-probe ARPES
- high-resolution ARPES
- surface characterizations
