Challenges and Opportunities in Signal and Power Integrity: Theory and Applications

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".

Deadline for manuscript submissions: closed (1 May 2021) | Viewed by 8682

Special Issue Editors


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Guest Editor
Department of Industrial and Information Engineering and Economics, University of L'Aquila, via G. Gronchi, 18, I-67100 L’Aquila, Italy
Interests: signal and power Integrity; electromagnetic compatibility; artificial intelligence; machine learning
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Guest Editor
Electromagnetic Compatibility and Signal Integrity Laboratory, Department of Industrial and Information Engineering and Economics, University of L’Aquila, 67100 L’Aquila, Italy
Interests: signal and power integrity; electromagnetic compatibility; microwave and millimeter-wave components and systems; antenna design; antenna measurements
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Signal and power integrity (SI/PI) are essential and interlaced aspects of contemporary advanced digital and hybrid electronic system design. The correct and effective use of their rules sets not negligible challenges to design engineers in a broad range of theoretical and practical issues: the understanding of the physical mechanisms associated to the flow of currents and the delivery of electric power at the extremely high harmonics of the digital signals; the behavior of electric-to-optical (and their reverse) interfaces; the electrical behavior and modeling of the conductor, organic (inorganic) substrate or semiconductor materials; and the identification of proper figures of merit for a signal channel quantification, to name but a few examples.

The paradigm of the Artificial Intelligence and its applications to improve the quality of signals and electric power at board, package, and also die level have opened up wide fields in the research in signal and power integrity.

This Special Issue wishes to offer the opportunity to engineers and scientists to exchange state-of-the-art developments in the field of signal and power integrity applied to any kind of high-speed circuit and system, to the modeling, design, validation, and testing of electronic hardware. The topics span from the theory, algorithms, and methods to improve the accuracy, efficiency, and optimization of signal and power integrity simulations to practical applications, innovative tools, prototypes, measurement approaches, and sensors that help and support the correct and advanced SI/PI design of electronic systems and components.

You may choose our Joint Special Issue in Signals.

Prof. Dr. Antonio Orlandi
Prof. Dr. Francesco de Paulis
Guest Editors

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Keywords

  • signal and power integrity
  • high-speed digital circuits
  • analog circuits
  • RF systems
  • IC and packages
  • materials performance
  • signal and power integrity measurements and sensors
  • numerical simulations and EDA tools
  • electromagnetic interferences
  • Artificial Intelligence
  • Internet of Things applications

Published Papers (3 papers)

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Research

17 pages, 10295 KiB  
Article
Modeling, Verification, and Signal Integrity Analysis of High-Speed Signaling Channel with Tabbed Routing in High Performance Computing Server Board
by Kyunghwan Song, Jongwook Kim, Hyunwoong Kim, Seonghi Lee, Jangyong Ahn, Andres Brito, Hyunsik Kim, Minho Park and Seungyoung Ahn
Electronics 2021, 10(13), 1590; https://doi.org/10.3390/electronics10131590 - 01 Jul 2021
Cited by 6 | Viewed by 3280
Abstract
It is necessary to reduce the crosstalk noise in high-speed signaling channels. In the channel routing area, the tabbed routing pattern is used to mitigate far-end crosstalk (FEXT), and the electrical length is controlled with a time domain reflectometer (TDR) and time domain [...] Read more.
It is necessary to reduce the crosstalk noise in high-speed signaling channels. In the channel routing area, the tabbed routing pattern is used to mitigate far-end crosstalk (FEXT), and the electrical length is controlled with a time domain reflectometer (TDR) and time domain transmission (TDT). However, unlike traditional channels having uniform width and space, the width and space of tabbed routing changes by segment, and the capacitance and inductance values of tabbed routing also change. In this paper, we propose a tabbed routing equivalent circuit modeling method using the segmentation approach. The proposed model was verified using 3D EM simulation and measurement results in the frequency domain. Based on the calculated inductance and capacitance parameters, we analyzed the insertion loss, FEXT, and self-impedance in the frequency domain, and TDT and FEXT in the time domain, by comparing the values of these metrics with and without tabbed routing. Using the proposed tabbed routing model, we analyzed tabbed routing with variations of design parameters based on self- and mutual-capacitance and inductance. Full article
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10 pages, 2739 KiB  
Article
Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly
by Simone Scafati, Enza Pellegrino, Francesco de Paulis, Carlo Olivieri, James Drewniak and Antonio Orlandi
Electronics 2021, 10(11), 1275; https://doi.org/10.3390/electronics10111275 - 27 May 2021
Cited by 2 | Viewed by 2588
Abstract
The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available [...] Read more.
The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one. Full article
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15 pages, 4047 KiB  
Article
A Method for Measuring the Maximum Measurable Gain of a Passive Intermodulation Chamber
by Zhanghua Cai, Yantao Zhou, Lie Liu, Francesco de Paulis, Yihong Qi and Antonio Orlandi
Electronics 2021, 10(7), 770; https://doi.org/10.3390/electronics10070770 - 24 Mar 2021
Cited by 1 | Viewed by 1868
Abstract
This paper presents an approximate method that allows the calculation of the maximum measurable gain (MMG) in an anechoic chamber. This method is realized by using a low passive intermodulation (PIM) medium-gain directional antenna. By reducing the distance between the antenna and the [...] Read more.
This paper presents an approximate method that allows the calculation of the maximum measurable gain (MMG) in an anechoic chamber. This method is realized by using a low passive intermodulation (PIM) medium-gain directional antenna. By reducing the distance between the antenna and the wall of the chamber to reduce path loss, the purpose of replacing a high-gain antenna with a medium-gain antenna is achieved. The specific relationship between distance and equivalent gain is given in this paper. The measurement interval is determined by the 3 dB beamwidth of the measurement antenna to scan the whole chamber. A set of corresponding data for the residual PIM level and the MMG of the chamber can be obtained by the method of measurement outlined herein. The feasibility of this method was verified by measurements in two PIM measurement chambers. Full article
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