Advanced Imaging Methods

A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Inorganic Crystalline Materials".

Deadline for manuscript submissions: closed (31 August 2021) | Viewed by 14814

Special Issue Editors


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Guest Editor
Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany
Interests: X-ray microscopy; X-ray optics; nanofabrication; focused ion beams and advanced materials

E-Mail Website
Guest Editor
Max Planck Institute for Intelligent Systems, Stuttgart, Germany
Interests: X-ray optics; Fresnel zone plates; atomic layer deposition; ion beam lithography; thin films

E-Mail Website
Guest Editor
Max Planck Institute for Intelligent Systems, Stuttgart, Germany
Interests: magnetization dynamics; time-resolved x-ray microscopy

Special Issue Information

Dear Colleagues,

The impact of the explosive growth in our technology and economy on the environment and our daily lives is becoming increasingly more evident. New materials solutions are essential to ensure growth while minimizing repercussions and facilitating a transformation to a more sustainable economy. Our ability to control matter at progressively smaller scales will prove instrumental in ensuring this change. Accordingly, the visualization of complex matter at a variety of time and length scales is a critical tool in providing the information feedback to improve the processes that will deliver the next generation of materials solutions. These include battery particles for high power density energy storage, more efficient solar or thermal energy conversion devices, new quantum electronic materials for efficient computing, higher-density and faster magnetic storage devices, and novel biomaterials for improved biocompatibility in medical devices.

To address these requirements, we would like to invite papers to our Special Issue on “Advanced Imaging Methods” to focus on applications of the visualization of matter from the atomic scale to mesoscale in 2, 3, and 4 dimensions. We want to cover a broad range of topics, from focused ion beams to scanning and transmission electron microscopes and both synchrotron and laboratory-based X-ray microscopes. Topics covered include direct and coherent imaging, such as ptychography and coherent diffractive imaging of nanomaterials, and time-resolved imaging.

This Special Issue on “Advanced Imaging Methods” is intended to provide an up-to-date overview of the recent developments in imaging of matter with novel properties.

Dr. Kahraman Keskinbora
Dr. Umut T. Sanli
Dr. Sebastian Wintz
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Crystals is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • X-ray microscopy
  • Electron microscopy
  • Focused ion beams
  • Time-resolved microscopy
  • Tomography
  • Coherent imaging

Published Papers (5 papers)

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Research

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13 pages, 2934 KiB  
Article
TimeMaxyne: A Shot-Noise Limited, Time-Resolved Pump-and-Probe Acquisition System Capable of 50 GHz Frequencies for Synchrotron-Based X-ray Microscopy
by Markus Weigand, Sebastian Wintz, Joachim Gräfe, Matthias Noske, Hermann Stoll, Bartel Van Waeyenberge and Gisela Schütz
Crystals 2022, 12(8), 1029; https://doi.org/10.3390/cryst12081029 - 25 Jul 2022
Cited by 9 | Viewed by 2359
Abstract
With the advent of modern synchrotron sources, X-ray microscopy was developed as a vigorous tool for imaging material structures with element-specific, structural, chemical and magnetic sensitivity at resolutions down to 25 nm and below. Moreover, the X-ray time structure emitted from the synchrotron [...] Read more.
With the advent of modern synchrotron sources, X-ray microscopy was developed as a vigorous tool for imaging material structures with element-specific, structural, chemical and magnetic sensitivity at resolutions down to 25 nm and below. Moreover, the X-ray time structure emitted from the synchrotron source (short bunches of less than 100 ps width) provides a unique possibility to combine high spatial resolution with high temporal resolution for periodic processes by means of pump-and-probe measurements. To that end, TimeMaxyne was developed as a time-resolved acquisition setup for the scanning X-ray microscope MAXYMUS at the BESSY II synchrotron in order to perform high precision, high throughput pump-and-probe imaging. The setup combines a highly sensitive single photon detector, a real time photon sorting system and a dedicated synchronization scheme for aligning various types of sample excitations of up to 50 GHz bandwidth to the photon probe. Hence, TimeMaxyne has been demonstrated to be capable of shot-noise limited, time-resolved imaging, at time resolutions of 50 ps and below, only limited by the X-ray pulse widths of the synchrotron. Full article
(This article belongs to the Special Issue Advanced Imaging Methods)
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12 pages, 5582 KiB  
Article
Laboratory X-ray Microscopy Study of Microcrack Evolution in a Novel Sodium Iron Titanate-Based Cathode Material for Li-Ion Batteries
by Viktor Shapovalov, Kristina Kutukova, Sebastian Maletti, Christian Heubner, Vera Butova, Igor Shukaev, Alexander Guda, Alexander Soldatov and Ehrenfried Zschech
Crystals 2022, 12(1), 3; https://doi.org/10.3390/cryst12010003 - 21 Dec 2021
Cited by 3 | Viewed by 2830
Abstract
The long-term performance of batteries depends strongly on the 3D morphology of electrode materials. Morphological changes, i.e., particle fracture and surface deterioration, are among the most prominent sources of electrode degradation. A profound understanding of the fracture mechanics of electrode materials in micro- [...] Read more.
The long-term performance of batteries depends strongly on the 3D morphology of electrode materials. Morphological changes, i.e., particle fracture and surface deterioration, are among the most prominent sources of electrode degradation. A profound understanding of the fracture mechanics of electrode materials in micro- and nanoscale dimensions requires the use of advanced in situ and operando techniques. In this paper, we demonstrate the capabilities of laboratory X-ray microscopy and nano X-ray computed tomography (nano-XCT) for the non-destructive study of the electrode material’s 3D morphology and defects, such as microcracks, at sub-micron resolution. We investigate the morphology of Na0.9Fe0.45Ti1.55O4 sodium iron titanate (NFTO) cathode material in Li-ion batteries using laboratory-based in situ and operando X-ray microscopy. The impact of the morphology on the degradation of battery materials, particularly the size- and density-dependence of the fracture behavior of the particles, is revealed based on a semi-quantitative analysis of the formation and propagation of microcracks in particles. Finally, we discuss design concepts of the operando cells for the study of electrochemical processes. Full article
(This article belongs to the Special Issue Advanced Imaging Methods)
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14 pages, 4472 KiB  
Article
Laboratory-Based Nano-Computed Tomography and Examples of Its Application in the Field of Materials Research
by Dominik Müller, Jonas Graetz, Andreas Balles, Simon Stier, Randolf Hanke and Christian Fella
Crystals 2021, 11(6), 677; https://doi.org/10.3390/cryst11060677 - 12 Jun 2021
Cited by 7 | Viewed by 3207
Abstract
In a comprehensive study, we demonstrate the performance and typical application scenarios for laboratory-based nano-computed tomography in materials research on various samples. Specifically, we focus on a projection magnification system with a nano focus source. The imaging resolution is quantified with common 2D [...] Read more.
In a comprehensive study, we demonstrate the performance and typical application scenarios for laboratory-based nano-computed tomography in materials research on various samples. Specifically, we focus on a projection magnification system with a nano focus source. The imaging resolution is quantified with common 2D test structures and validated in 3D applications by means of the Fourier Shell Correlation. As representative application examples from nowadays material research, we show metallization processes in multilayer integrated circuits, aging in lithium battery electrodes, and volumetric of metallic sub-micrometer fillers of composites. Thus, the laboratory system provides the unique possibility to image non-destructively structures in the range of 170–190 nanometers, even for high-density materials. Full article
(This article belongs to the Special Issue Advanced Imaging Methods)
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7 pages, 4983 KiB  
Article
Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples
by Sina Mayr, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe and Sebastian Wintz
Crystals 2021, 11(5), 546; https://doi.org/10.3390/cryst11050546 - 14 May 2021
Cited by 2 | Viewed by 2384
Abstract
We employ xenon (Xe) plasma focused ion beam (PFIB) milling to obtain soft X-ray transparent windows out of bulk samples. The use of a Xe PFIB allows for the milling of thin windows (several 100 nm thick) with areas of the order of [...] Read more.
We employ xenon (Xe) plasma focused ion beam (PFIB) milling to obtain soft X-ray transparent windows out of bulk samples. The use of a Xe PFIB allows for the milling of thin windows (several 100 nm thick) with areas of the order of 100 µm × 100 µm into bulk substrates. In addition, we present an approach to empirically determine the transmission level of such windows during fabrication by correlating their electron and soft X-ray transparencies. We perform scanning transmission X-ray microscopy (STXM) imaging on a sample obtained by Xe PFIB milling to demonstrate the conceptual feasibility of the technique. Our thinning approach provides a fast and simplified method for facilitating soft X-ray transmission measurements of epitaxial samples and it can be applied to a variety of different sample systems and substrates that are otherwise not accessible. Full article
(This article belongs to the Special Issue Advanced Imaging Methods)
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Review

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42 pages, 10687 KiB  
Review
Nuclear Resonance Vibrational Spectroscopy: A Modern Tool to Pinpoint Site-Specific Cooperative Processes
by Hongxin Wang, Artur Braun, Stephen P. Cramer, Leland B. Gee and Yoshitaka Yoda
Crystals 2021, 11(8), 909; https://doi.org/10.3390/cryst11080909 - 02 Aug 2021
Cited by 9 | Viewed by 3082
Abstract
Nuclear resonant vibrational spectroscopy (NRVS) is a synchrotron radiation (SR)-based nuclear inelastic scattering spectroscopy that measures the phonons (i.e., vibrational modes) associated with the nuclear transition. It has distinct advantages over traditional vibration spectroscopy and has wide applications in physics, chemistry, bioinorganic chemistry, [...] Read more.
Nuclear resonant vibrational spectroscopy (NRVS) is a synchrotron radiation (SR)-based nuclear inelastic scattering spectroscopy that measures the phonons (i.e., vibrational modes) associated with the nuclear transition. It has distinct advantages over traditional vibration spectroscopy and has wide applications in physics, chemistry, bioinorganic chemistry, materials sciences, and geology, as well as many other research areas. In this article, we present a scientific and figurative description of this yet modern tool for the potential users in various research fields in the future. In addition to short discussions on its development history, principles, and other theoretical issues, the focus of this article is on the experimental aspects, such as the instruments, the practical measurement issues, the data process, and a few examples of its applications. The article concludes with introduction to non-57Fe NRVS and an outlook on the impact from the future upgrade of SR rings. Full article
(This article belongs to the Special Issue Advanced Imaging Methods)
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