X-ray Diffraction Applications in Materials Characterization
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".
Deadline for manuscript submissions: closed (20 February 2024) | Viewed by 260
Special Issue Editor
Special Issue Information
Dear Colleagues,
Over the past hundred years, X-ray diffraction (XRD) has been widely regarded as the most powerful tool for crystalline structural study. Not only that, it has played an active role in the understanding and exploration of nature, especially in condensed matter physics, material science, life medicine, chemical engineering, geology, mineralogy, environmental science, archaeology, history and many other fields.
This Special Issue focus on the different aspects of the applications of XRD in materials sciences and engineering. As a continuously evolving tool, XRD has a lot of advantages, fast, reliable, accurate, cost-effective and non-destructive, which allows us to analyze the structure, composition, and properties of materials at the atomic level. We welcome research results from researchers including, but not limited to:
- Analysis of the properties and composition of materials;
- XRD for discovering unknown synthesized materials, developing new materials, and optimizing existing materials;
- XRD for monitoring the composition and structure of materials,
- XRD for identifying phases, detecting defects, and analyzing strain in a material;
- Industrial applications of XRD, industrial production and quality control;
- Noval X-ray diffraction detection technologies.
Dr. Cristóbal Verdugo-Escamilla
Guest Editor
Manuscript Submission Information
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Keywords
- materials
- X-ray diffraction
- XRD
- surface X-ray diffraction
- synthesized materials
- materials structure
- structural characterization
- phase transitions
- hybrid materials
