Machine Condition Monitoring and Fault Diagnosis: From Theory to Application, 2nd Edition
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Mechanical Engineering".
Deadline for manuscript submissions: 31 December 2024 | Viewed by 137
Special Issue Editor
Interests: fault diagnosis method; fault modeling; condition monitoring
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Modern machines are becoming more structurally complex and operate under harsher loading and operational conditions. To ensure the efficient and reliable operation of machines, reduced unscheduled downtime, and lower operation and maintenance costs, it is necessary to develop intelligent fault diagnostic methods and assess their health state for the aim of identifying the mode, type, severity, and degradation trend of faults.
This Special Issue encourages and welcomes original research articles on machine fault detection, diagnosis, and prognosis. Potential topics include, but are not limited to, the following:
- Fault diagnosis methods based on various sensor data;
- Signal processing;
- Fault model research with changeable variable transfer path;
- Fault diagnostics under non-stationary operating conditions;
- Fault prediction;
- Machine-learning-based fault diagnostics and condition monitoring;
- Fatigue analysis of machinery.
Dr. Feiyun Cong
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- condition monitoring
- fault diagnosis
- fault modeling
