Electrical Characterization of Cu-Doped PEDOT:PSS Polymeric Thin Films †
Abstract
:1. Introduction
2. Materials and Methods
2.1. Hall Measurements
2.2. Conductivity Measurement Based on Hall Measurements
2.3. Sample Preparation
2.4. Temperature Dependence on Electrical Conductivity
2.4.1. Mott Model
2.4.2. Schaefer–Siebert–Roth Model
3. Results and Discussion
3.1. Atomic Force Microscope (AFM)
3.2. Conductive Atomic Force Microscope (C-AFM)
3.3. Temperature Dependance Results
3.4. Hall Mobility and Carrier Concentration Density
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Roughness Parameter | PEDOT:PSS 3–4% | PEDOT:PSS 1.3% + CuCl2 |
---|---|---|
(nm) | 6.23 | 1.43 |
(nm) | 2.90 | 1.89 |
N2d (cm2) | Mobility (cm2/Vs) | |
---|---|---|
2.89 × 1015 | 2.37 |
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Mikaeeli, A.; Jukam, N.; Szczesny, R.; Ludwing, A.; Bolukbasi, I.; Wieck, A.D.; Pawlak, M. Electrical Characterization of Cu-Doped PEDOT:PSS Polymeric Thin Films. Eng. Proc. 2023, 56, 327. https://doi.org/10.3390/ASEC2023-15903
Mikaeeli A, Jukam N, Szczesny R, Ludwing A, Bolukbasi I, Wieck AD, Pawlak M. Electrical Characterization of Cu-Doped PEDOT:PSS Polymeric Thin Films. Engineering Proceedings. 2023; 56(1):327. https://doi.org/10.3390/ASEC2023-15903
Chicago/Turabian StyleMikaeeli, Ameneh, Nathan Jukam, Robert Szczesny, Arne Ludwing, Ismail Bolukbasi, Andreas D. Wieck, and Michal Pawlak. 2023. "Electrical Characterization of Cu-Doped PEDOT:PSS Polymeric Thin Films" Engineering Proceedings 56, no. 1: 327. https://doi.org/10.3390/ASEC2023-15903