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Journal: Photonics, 2022
Volume: 9
Number: 665

Article: Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology
Authors: by Ziruo Wu, Yingfan Xiong, Lihua Lei, Wen Tan, Zhaohui Tang, Xiao Deng, Xinbin Cheng and Tongbao Li
Link: https://www.mdpi.com/2304-6732/9/9/665

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