Next Article in Journal
Test Structures for the Characterization of the Gate Resistance in 16 nm FinFET RF Transistors
Next Article in Special Issue
Property Analysis of Gateway Refinement of Object-Oriented Petri Net with Inhibitor-Arcs-Based Representation for Embedded Systems
Previous Article in Journal
An Efficient Hardware Implementation for Complex Square Root Calculation Using a PWL Method
 
 
Article

Article Versions Notes

Electronics 2023, 12(14), 3009; https://doi.org/10.3390/electronics12143009
Action Date Notes Link
article pdf uploaded. 9 July 2023 10:43 CEST Version of Record https://www.mdpi.com/2079-9292/12/14/3009/pdf-vor
article pdf uploaded. 9 July 2023 11:20 CEST Updated version of record https://www.mdpi.com/2079-9292/12/14/3009/pdf-vor
article xml file uploaded 10 July 2023 05:28 CEST Original file -
article xml uploaded. 10 July 2023 05:28 CEST Update https://www.mdpi.com/2079-9292/12/14/3009/xml
article pdf uploaded. 10 July 2023 05:28 CEST Updated version of record https://www.mdpi.com/2079-9292/12/14/3009/pdf
article html file updated 10 July 2023 05:29 CEST Original file -
article html file updated 20 July 2023 21:20 CEST Update https://www.mdpi.com/2079-9292/12/14/3009/html
Back to TopTop