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Journal: Electronics, 2023
Volume: 12
Number: 2306
Article:
EEDD: Edge-Guided Energy-Based PCB Defect Detection
Authors:
by
Shuixin Deng, Lei Deng, Ting Sun, Shijie Yu, Li Wang, Baohua Chen, Hao Hu, Yusen Xie, Hanxi Yin, Junwei Xiao, Xinglong Cui, Yeyu Fu, Xuewei Tang, Ruirui Song, Lin Li, Shanpeng Xiao, Yuan Li and Yizheng Li
Link:
https://www.mdpi.com/2079-9292/12/10/2306
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