Sensors in Nondestructive Testing
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Industrial Sensors".
Deadline for manuscript submissions: 20 August 2024 | Viewed by 293
Special Issue Editors
Interests: nondestructive testing methods and instruments; signal processing techniques; machine learning methods; sensors and actuators
Interests: nondestructive testing methods and instruments; signal processing techniques; machine learning methods; sensors and actuators
Special Issues, Collections and Topics in MDPI journals
Interests: nondestructive testing and evaluation; sensors; structure health monitoring
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Nondestructive testing (NDT) technologies, along with advanced sensors and signal processing techniques, play an important role in ensuring product quality during production. With the emergence of challenges in inspecting more complex structures under more complicated environments, sensor technologies in NDT have undergone great advancements.
There have been many recent advances in the development of sensors in NDT technologies, including eddy current testing, magnetic flux leakage testing, ultrasonic testing, guided wave testing and some other methods. Moreover, the finite element simulation and analytical calculation of electromagnetic fields and ultrasonic fields have played an important role in the development of NDT sensors. Furthermore, the advancement of electronic circuit design and digital signal processing techniques has greatly improved the sensor signals in NDT.
This Special Issue invites authors to submit high-quality research articles that cover but are not limited to different topics of Sensors in Nondestructive Testing:
- Advanced NDT sensors;
- Optimization of NDT sensors;
- Analytical models for designing NDT sensors;
- Numerical computation of electromagnetic fields;
- New applications of NDT;
- Novel signal processing algorithms for sensor signals.
Prof. Dr. Yihua Kang
Dr. Bo Feng
Prof. Dr. Jianbo Wu
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- electronic circuit design for NDT sensors
- nondestructive testing
- material characterization
- electromagnetic fields
- magnetic flux leakage testing
- eddy current testing
- magnetic particle inspection
