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Photonics
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Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and...
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Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and Technologies

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: closed (20 August 2023) | Viewed by 3793

Special Issue Editors

Dr. Shengzhen Yi

E-Mail Website
Guest Editor
A Key Laboratory of Advanced Micro-Structured Materials, MOE, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
Interests: X-ray imaging optics; plasma diagnostics
Dr. Wei Wang

E-Mail Website
Guest Editor
Shanghai Institute of Laser Plasma, Chinese Academy of Engineering Physics, Shanghai, China
Interests: laser inertial confinement fusion; laser-driven radiation source

Special Issue Information

Dear Colleagues,

Extreme ultraviolet (EUV) and soft X-rays are important information carriers for laser-driven, heavy-ion-driven, Z-pinch, and other inertial confinement fusion and magnetic-confinement fusion experiments. The key data of plasma evolution play an important role in deeply understanding the important physical laws of the fusion process and revealing key physical problems. EUV and soft X-ray optical systems and technologies are important tools for plasma diagnostics. The collaborative application of normal incidence, grazing incidence reflection, spectroscopic devices (such as transmission optical structures, multilayers, crystals, and zone plates), and time-resolved recording devices (such as framing cameras and streak cameras), as well as the exploration of new methods, technologies, and systems, have become an important research direction for precision extreme ultraviolet and X-ray diagnostics.

This Special Issue plans to provide an overview of recent advances in high-performance extreme ultraviolet and soft X-ray optical systems and their applications in different fields.

This Special Issue focuses on the new structural design, device development and exploration of new diagnostic methods, technologies and systems for EUV and soft X-ray optics for plasma diagnostics. Potential topics include, but are not limited to:

  • EUV and soft X-ray imaging system;
  • EUV and soft X-ray spectroscopy element and system;
  • High time-resolved EUV and soft X-ray measurement device;
  • EUV and soft X-ray diagnostic techniques in inertial confinement fusion;
  • EUV and soft X-ray diagnostic techniques in magnetic confinement fusion;
  • Key EUV and soft X-ray optical elements for plasma diagnostics;
  • Novel optical structures for EUV and soft X-ray imaging or spectroscopy;
  • Key technologies in EUV and soft X-ray optics development.

Dr. Shengzhen Yi
Dr. Wei Wang
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • EUV and X-ray microscopy
  • plasma diagnostics
  • high resolution
  • X-ray bent-crystal optics
  • spectral resolution
  • time-resolved detector
  • grazing incidence optics
  • X-ray multilayers elements
  • X-ray diagnostics
  • inertial confinement fusion
  • magnetic confinement fusion
  • EUV and X-ray optics for synchrotron radiation
  • diagnostics technology by EUV or X-ray optics

Published Papers (3 papers)

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Research

11 pages, 4798 KiB  
Article
A Wide-Range High-Resolution X-ray Crystal Spectrometer for Laser–Plasma Diagnostics
by Shengzhen Yi, Huiyao Du, Haoxuan Si, Yue Yu, Jun Xiong and Zhanshan Wang
Photonics 2023, 10(9), 1054; https://doi.org/10.3390/photonics10091054 - 15 Sep 2023
Viewed by 960
Abstract
Wide-range crystal spectrometers are important tools for performing X-ray spectroscopic measurements of medium- and high-Z tracer elements in research on laser-driven inertial confinement fusion (ICF) plasmas. In this paper, we propose a wide-range high-resolution crystal spectrometer based on a tandem array of crystals [...] Read more.
Wide-range crystal spectrometers are important tools for performing X-ray spectroscopic measurements of medium- and high-Z tracer elements in research on laser-driven inertial confinement fusion (ICF) plasmas. In this paper, we propose a wide-range high-resolution crystal spectrometer based on a tandem array of crystals that have the same geometric parameters. We have developed a three-channel crystal spectrometer that covers the range of 8–18 keV by combining Ge<311>, Ge<331>, and Ge<531> crystals. Here, we report the design, optical simulations, and X-ray test experiments of this spectrometer. The calibration results indicate that the spectral resolution E/ΔE is greater than 2800 at 8.048 keV. By selecting appropriate Bragg angles, crystal materials, orientations, or other geometrical parameters, the wide-range crystal spectrometer developed in this paper can also be used to make measurements in other energy ranges. Full article
(This article belongs to the Special Issue Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and Technologies)
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12 pages, 2338 KiB  
Communication
Statistical Analysis of Single-Order Diffraction Grating with Quasi-Random Structures
by Huaping Zang, Zhihao Cui, Lai Wei, Hongjie Liu, Quanping Fan, Yangfan He, Bin Sun, Jihui Chen and Leifeng Cao
Photonics 2023, 10(3), 303; https://doi.org/10.3390/photonics10030303 - 13 Mar 2023
Viewed by 1171
Abstract
Single-order diffraction gratings with quasi-random structures are effective optical elements in suppressing harmonics contamination. However, background intensity fluctuations introduced by quasi-random structures may affect the measurement of the spectra and the fluctuations lack quantitative description. A unified theoretical method is provided to describe [...] Read more.
Single-order diffraction gratings with quasi-random structures are effective optical elements in suppressing harmonics contamination. However, background intensity fluctuations introduced by quasi-random structures may affect the measurement of the spectra and the fluctuations lack quantitative description. A unified theoretical method is provided to describe quasi-random diffraction structures with arbitrary distribution functions and an arbitrary number of microstructures. The effect of the number of microstructures and distribution functions on the level of background fluctuations is evaluated. This work provides important guidance for the design and optimization of single-order diffraction gratings, which are attractive for spectral analysis and monochromator applications in synchrotron beam lines. Full article
(This article belongs to the Special Issue Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and Technologies)
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10 pages, 19889 KiB  
Communication
Response of Lead Fluoride (PbF2) Crystal under X-ray and Gamma Ray Radiation
by Vasileios Ntoupis, Dionysios Linardatos, George Saatsakis, Nektarios Kalyvas, Athanasios Bakas, George Fountos, Ioannis Kandarakis, Christos Michail and Ioannis Valais
Photonics 2023, 10(1), 57; https://doi.org/10.3390/photonics10010057 - 4 Jan 2023
Viewed by 1253
Abstract
Background: In this research, the response of a 10 × 10 × 10 mm3 commercially available PbF2 crystal was experimentally assessed under X-ray and gamma ray radiation to verify the possible application of this material in X-ray medical imaging. Methods: The [...] Read more.
Background: In this research, the response of a 10 × 10 × 10 mm3 commercially available PbF2 crystal was experimentally assessed under X-ray and gamma ray radiation to verify the possible application of this material in X-ray medical imaging. Methods: The measurements were performed under X-ray from 50 to 130 kVp and gamma ray excitation (Tc-99m 140 keV and I-131 365 keV). The PbF2 response was experimentally assessed by the determination of the absolute luminescence efficiency (AE), X-ray luminescence efficiency (XLE), and the stopping power of this scintillating crystal in terms of the energy absorption efficiency (EAE). The results were compared with bismuth germanate (BGO) crystal, which is commonly used in medical imaging modalities. Results: The AE of PbF2 gradually decreased from 50 kVp up to 130 kVp. The maximum value was 0.61 efficiency units (EU) at 140 keV, and the minimum value was 0.03 EU at 71 keV (130 kVp). Similarly, low values appeared for the XLE, where the maximum value was 16.9 × 10−5 at 140 keV. Conclusions: These findings show that the PbF2 scintillator has unacceptably low luminescence efficiency. Although PbF2 can effectively absorb radiation, the scintillation light, at room temperatures, is negligible, and, thus, it could not be used in medical imaging applications in the examined energy range. Full article
(This article belongs to the Special Issue Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and Technologies)
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