Micro/Nanofabrication of Silicon Metal–Oxide–Semiconductor Devices

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D:Materials and Processing".

Deadline for manuscript submissions: closed (15 November 2020) | Viewed by 196

Special Issue Editors

Centre for Quantum Computation and Communication Technology, School of Electrical Engineering and Telecommunications, The University of New South Wales, Sydney, NSW, Australia
Interests: MOS technology; silicon nanofabrication; nanoelectronics

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Guest Editor
Centre for Quantum Computation and Communication Technology, School of Electrical Engineering and Telecommunications, The University of New South Wales, Sydney, New South Wales, Australia
Interests: MOS technology; silicon quantum computing; nanoelectronics

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Guest Editor
IQM Finland Oy, Vaisalantie 6 C, 02130 Espoo, Finland
Interests: semiconductor; superconductor; quantum computing

Special Issue Information

Dear Colleagues,

The silicon metal–oxide–semiconductor (MOS) is the core structure of modern-day integrated circuit (IC) chips. Due to the demand for high-performance and high-density ICs, MOS devices have been continuously scaled down for the past five decades. However, the increasing miniaturisation will eventually hit fundamental limitations such as heat dissipation, scalability and, more prominently, the quantum mechanical effects. To overcome these issues, we should leverage on the quantum phenomenon to engineer MOS-based quantum devices. Such technology relies on the exploration of advanced micro- and nanofabrication technologies, processes, structures and new materials. As the semiconductor industries and foundries have been well developed for many decades, it is extremely beneficial to develop quantum technology based on silicon MOS fabrication processes, for instance, silicon quantum dots for quantum computing and single electron transistors for quantum metrology.

This Special Issue of Micromachines seeks to showcase research papers, short communications, and review articles that focus on new techniques and recent developments in engineering metal–oxide–semiconductor devices and their applications. Topics of interest for this Special Issue include but are not limited to: (1) methodology and applications of an advanced fabrication process of silicon MOS devices; (2) improvements of the quality of gate dielectric; and (3) improvements of device performance via bandgap and strain engineering, and novel architectures such as FinFET and ultrathin body.

Dr. Fay Hudson
Dr. Wee Han Lim
Dr. Kok Wai Chan
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Micromachines is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • micro- and nano-device fabrication
  • MOS devices
  • silicon quantum devices

Published Papers

There is no accepted submissions to this special issue at this moment.
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