Selected Papers from the 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (IEEE MetroXRAINE 2023)
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: closed (3 April 2024) | Viewed by 430
Special Issue Editors
Interests: dielectric characterization of materials; microwave reflectometry systems for monitoring applications; 4.0-based measurement systems; measurements for augmented reality systems
Special Issues, Collections and Topics in MDPI journals
Interests: measurement theory; electronic measurements; electronic instrumentation devices; wearable brain computer interface
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering—IEEE MetroXRAINE 2023 will be held on OCTOBER 25-27, 2023, in Milano, Italy (https://metroxraine.org/). This will be an international event, mainly aimed at creating a synergy between experts in eXtended reality, the brain–computer interface, and artificial intelligence, with special attention to measurement. Authors of papers related to sensors presented at the conference are invited to submit extended versions of their work to this Special Issue for publication.
Areas of interest include, but are not limited to:
- Instrumental solutions and measurement principles for enhancing the accuracy and robustness of XR-BCI systems.
- Display technologies and human vision.
- Wearable sensors for neuroimaging.
- User experience, perception and interactions in XR and BCI.
- Multisensory experiences and improved immersion.
- Psychophysical condition monitoring.
- Advanced machine learning techniques for XR-BCI.
- Deep learning-based classification.
- VR-supported mindfulness-based on EEG signals.
- Immersive user experience with XR-BCI.
- Human-in-the-loop AI.
- Bioengineering and rehabilitation.
- Biosignal processing.
- Instrumental solutions and measurement principles for smart industry.
- New challenge for metrology in the digital transformation scenario.
You may choose our Joint Special Issue in Sensors.
Prof. Dr. Egidio De Benedetto
Dr. Antonio Esposito
Guest Editors
Manuscript Submission Information
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