Advances in Optical 3D Metrology

A special issue of Metrology (ISSN 2673-8244).

Deadline for manuscript submissions: 25 June 2025 | Viewed by 130

Special Issue Editors

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Guest Editor
Department of Civil, Environmental, Architectural, Engineering and Mathematics, University of Brescia, Via Branze 43, 25123 Brescia, Italy
Interests: mobile mapping; laser scanner; 3D; deformation monitoring of large structures and infrastructures; cultural heritage survey

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Guest Editor
3D Optical Metrology (3DOM) Unit, Bruno Kessler Foundation (FBK), 38123 Trento, Italy
Interests: photogrammetry; laser scanning; optical metrology; 3D; AI; quality control
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Guest Editor
School of Science, RMIT University, GPO Box 2476, Melbourne 3001, Australia
Interests: close range photogrammetry applications; precise optical metrology; camera calibration
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Special Issue Information

Dear Colleagues,

Optical 3D Metrology (O3DM) tackles precise 3D measurements and accurate modelling from imaging and range sensors. Optical 3D Metrology investigates open issues concerning detailed 3D reconstructions in fields including industrial inspections, aerospace and automotive design, material and component testing, scene documentation, motion analysis, medical applications, and the exploration of remote and hazardous sites, to name but a few.

This Special Issue stems from the ISPRS Optical 3D Metrology workshop ( Optical 3D Metrology (O3DM) is a series of biannual conferences that build on the heritage of SPIE Videometrics (1991–2017) and Optical 3D Measurement Techniques (1989–2009). The previous editions of O3DM were held in Strasbourg (France) in December 2019 and in Wuerzburg (Germany) in December 2022.

For this Special Issue, we are seeking innovative contributions in the form of extended and improved articles that were presented at the workshop. The accepted papers will be published as peer-reviewed articles in this Metrology Special Issue.

Dr. Giorgio Vassena
Prof. Dr. Fabio Remondino
Prof. Dr. Mark Shortis
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • sensor investigations and characterisation
  • radiometric and geometric calibration of sensors
  • sensor/data fusion
  • quality and calibration of colour for 3D models acquired using optical and range-sensing techniques
  • algorithms for precise 3D data derivation and processing
  • ambiguous sequences in image orientation
  • hybrid adjustments for high-accuracy applications
  • AI methods in metrology and industrial inspections
  • handling of transparent or reflective surfaces

Published Papers

This special issue is now open for submission.
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