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Journal: Eng. Proc., 2021
Volume: 6
Number: 86
Article:
Carrier Mobility in Semiconductors at Very Low Temperatures
Authors:
by
Ingo Tobehn-Steinhäuser, Manfred Reiche, Matthias Schmelz, Ronny Stolz, Thomas Fröhlich and Thomas Ortlepp
Link:
https://www.mdpi.com/2673-4591/6/1/86
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