Next Article in Journal
Power and Element Allocation Design for RIS–NOMA IoV Networks
Next Article in Special Issue
Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices
Previous Article in Journal
State Feedback and Deadbeat Predictive Repetitive Control of Three-Phase Z-Source Inverter
Previous Article in Special Issue
Effect of Trapped Charge Induced by Total Ionizing Dose Radiation on the Top-Gate Carbon Nanotube Field Effect Transistors
 
 
Article

Article Versions Notes

Electronics 2023, 12(4), 1008; https://doi.org/10.3390/electronics12041008
Action Date Notes Link
article xml file uploaded 17 February 2023 09:27 CET Original file -
article xml uploaded. 17 February 2023 09:27 CET Update -
article pdf uploaded. 17 February 2023 09:27 CET Version of Record -
article html file updated 17 February 2023 09:29 CET Original file -
article xml file uploaded 17 February 2023 12:50 CET Update -
article xml uploaded. 17 February 2023 12:50 CET Update https://www.mdpi.com/2079-9292/12/4/1008/xml
article pdf uploaded. 17 February 2023 12:50 CET Updated version of record https://www.mdpi.com/2079-9292/12/4/1008/pdf
article html file updated 17 February 2023 12:52 CET Update -
article html file updated 9 March 2023 20:40 CET Update https://www.mdpi.com/2079-9292/12/4/1008/html
Back to TopTop