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Correction

Correction: He et al. A 3.95 ppm/°C 7.5 μW Second-Order Curvature Compensated Bandgap Reference in 0.11 μm CMOS. Electronics 2022, 11, 2869

1
Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
2
University of Chinese Academy of Sciences, Beijing 100049, China
*
Author to whom correspondence should be addressed.
Electronics 2022, 11(21), 3565; https://doi.org/10.3390/electronics11213565
Submission received: 25 October 2022 / Accepted: 26 October 2022 / Published: 1 November 2022
(This article belongs to the Section Semiconductor Devices)

Additional Affiliation

In the published publication [1], there was an error regarding the affiliation of Yuefeng He, Guoshun Yuan, Lei Lei, Hongjiang Yu and Dewei Kong. In addition to affiliation 2, the updated affiliation should include: University of Chinese Academy of Sciences, Beijing 100049, China. The authors state that the scientific conclusions are unaffected. This correction was approved by the Academic Editor. The original publication has also been updated.

Reference

  1. He, Y.; Yuan, G.; Lei, L.; Yu, H.; Kong, D. A 3.95 ppm/°C 7.5 μW Second-Order Curvature Compensated Bandgap Reference in 0.11 μm CMOS. Electronics 2022, 11, 2869. [Google Scholar] [CrossRef]
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MDPI and ACS Style

He, Y.; Yuan, G.; Lei, L.; Yu, H.; Kong, D. Correction: He et al. A 3.95 ppm/°C 7.5 μW Second-Order Curvature Compensated Bandgap Reference in 0.11 μm CMOS. Electronics 2022, 11, 2869. Electronics 2022, 11, 3565. https://doi.org/10.3390/electronics11213565

AMA Style

He Y, Yuan G, Lei L, Yu H, Kong D. Correction: He et al. A 3.95 ppm/°C 7.5 μW Second-Order Curvature Compensated Bandgap Reference in 0.11 μm CMOS. Electronics 2022, 11, 2869. Electronics. 2022; 11(21):3565. https://doi.org/10.3390/electronics11213565

Chicago/Turabian Style

He, Yuefeng, Guoshun Yuan, Lei Lei, Hongjiang Yu, and Dewei Kong. 2022. "Correction: He et al. A 3.95 ppm/°C 7.5 μW Second-Order Curvature Compensated Bandgap Reference in 0.11 μm CMOS. Electronics 2022, 11, 2869" Electronics 11, no. 21: 3565. https://doi.org/10.3390/electronics11213565

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