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Article

Stress–Strength Reliability Analysis for Different Distributions Using Progressive Type-II Censoring with Binomial Removal

1
Department of Mathematics and Statistics, Faculty of Science, Imam Mohammad Ibn Saud Islamic University (IMSIU), Riyadh 11432, Saudi Arabia
2
Faculty of Graduate Studies for Statistical Research, Cairo University, 5 Dr. Ahmed Zewail Street, Giza 12613, Egypt
3
Mathematics and Computer Science Department, Faculty of Science, Beni-Suef University, Beni-Suef 62521, Egypt
4
Department of Basic Sciences, Higher Institute of Administrative Sciences, Belbeis 44621, Egypt
5
Department of Basic Sciences, Obour High Institute for Management & Informatics, Obour 11828, Egypt
*
Author to whom correspondence should be addressed.
Axioms 2023, 12(11), 1054; https://doi.org/10.3390/axioms12111054
Submission received: 7 October 2023 / Revised: 31 October 2023 / Accepted: 1 November 2023 / Published: 15 November 2023

Abstract

:
In the statistical literature, one of the most important subjects that is commonly used is stress–strength reliability, which is defined as δ = P W < V , where V and W are the strength and stress random variables, respectively, and δ is reliability parameter. Type-II progressive censoring with binomial removal is used in this study to examine the inference of δ = P W < V for a component with strength V and being subjected to stress W. We suppose that V and W are independent random variables taken from the Burr XII distribution and the Burr III distribution, respectively, with a common shape parameter. The maximum likelihood estimator of δ is derived. The Bayes estimator of δ under the assumption of independent gamma priors is derived. To determine the Bayes estimates for squared error and linear exponential loss functions in the lack of explicit forms, the Metropolis–Hastings method was provided. Utilizing comprehensive simulations and two metrics (average of estimates and root mean squared errors), we compare these estimators. Further, an analysis is performed on two actual data sets based on breakdown times for insulating fluid between electrodes recorded under varying voltages.

1. Introduction

A growing amount of pressure has been placed on manufacturers in recent years to create high-quality goods while lowering manufacturing costs and time frames. Studying reliability is increasingly important as global competitiveness increases. Reliability estimates, prediction, and optimization are built on the pillars of lifetime testing, structural reliability, and machine maintenance. The stress–strength (SS) model is mathematically written as δ = P W < V , where V is the strength random variable, W is the stress random variable, and δ is the reliability parameter. In this model, the probability that the system can withstand the pressures placed on it is known as the system’s reliability, or δ = P W < V . A good illustration of both mechanical engineering and aerodynamics is the reliability of aircraft windshields. Various fields, including engineering, medicine, and the military, can employ SS models. SS reliability can provide scenarios for reliable structures such as carbon fiber, bridges, lifts, and others. The parameter δ is undoubtedly applicable in a wide range of sectors and offers more than just an SS model. It also gives a broad assessment of the differences between the two populations. For instance, in clinical investigations, we may assess the effectiveness of two treatments to compare V, the patient’s life expectancy while receiving one medicine, and W, the patient’s life expectancy when receiving a different medication. Information on more applications of this model can be found in [1]. Numerous studies on the S-S model using complete and censored samples have been conducted by [2,3,4,5,6,7,8,9,10,11,12] and others. Some recent studies concerning SS models can be found in [13,14,15,16,17,18,19].
Censored samples are used to analyze lifetime data because, in life-testing trials, one frequently runs into circumstances where it takes a long time to accumulate sufficient number of failures needed to make a meaningful judgment. In the past ten years, the Type-II progressive censoring (TII-PC) scheme has become one of the most popular censoring methods. The following is an explanation of it: Assume that n identical units will be tested, and m failures will be recorded. When the first failure occurs, R 1 items are randomly selected and eliminated from the ( n 1 ). Similar to the first failure, R 2 items of the surviving objects are selected at random and eliminated, and so on. The remaining items are all suppressed at the moment of the m t h failure. R = ( R 1 , R 2 , , R m ) displays the TII-PC scheme. For R = ( 0 , 0 , , n m ) in TII-PC, Type-II censoring is obtained, and a complete sampling scheme when ( n = m ) and ( R 1 = = R m 1 = R m = 0 ) . Research on the various characteristics of progressive censoring systems was provided by Balakrishnan [20] and Aggarwala and Balakrishnan [21]. The prefixes R 1 , R 2 , , R m are all present in this system. However, these numbers might happen at random in some real-world scenarios. According to Yuen and Tse [22], for instance, it is random and impossible to predict how many patients will withdraw from a clinical test at any given point. Additionally, even when some of the tested units have not failed, an experimenter may determine in some reliability trials that it is unsuitable or too unsafe to continue testing on some of the tested units. In these situations, the removal pattern is arbitrary at every failure (Yuen and Tse [22] and Amin [23]). This results in arbitrary removals and gradual censoring. As a result, several writers, including Wu et al. [24], Tse et al. [25], Dey and Dey [26], and Yan et al. [27], have examined the statistical inference on lifetime distributions under TII-PC with random removals.
In the literature, there is only one study regarding the parametric inference of the SS model with the stress and strength random variables belonging to the Marshall–Olkin extended Weibull family and where the observed samples are the TII-PC with fixed or random removal, as reported by Mokhlis et al. [28]. The main goal of the present work is to examine the estimate of the SS reliability parameter δ = P W < V when the W and V are independent random variables with distinct distributions and the observed samples are the TII-PC with binomial removal. So, we will now give a brief summary of our research.
1.
The parent distributions, Burr XII (BXII) with shape parameters ( ϑ , φ 1 ) and Burr III (BIII) with shape parameters ( ϑ , φ 2 ) , linked to δ , are described, and their significance is discussed.
2.
An explicit expression of the SS reliability parameter δ is derived, when V and W are independent random variables following BXII ( ϑ , φ 1 ) and BIII ( ϑ , φ 2 ) , respectively. This expression shows that δ does not depend on ϑ .
3.
The maximum likelihood estimate (MLE) of δ is obtained based on TII-PC with binomial removal.
4.
Under two distinct loss functions (squared error loss function (SEF) and linear exponential loss function (LNx)), the Bayes estimators of δ utilizing informative (INF) and non-informative (N-INF) priors are provided.
5.
The effectiveness of the developed estimates is evaluated using a Monte Carlo simulation analysis.
6.
A real data example is provided that illustrates the theoretical findings.
This article is organized as follows. Section 2 provides the description of the parent distributions along with the SS reliability formula. The MLE of δ based on TII-PC is obtained in Section 3. Section 4 proposes Bayesian estimates using the Metropolis–Hastings algorithm for both symmetric and asymmetric loss functions. We provide a simulation analysis in Section 5 that compares the aforementioned estimation techniques. Section 6 provides a demonstration of how the suggested model and approaches may be applied to engineering issues. In Section 7, there is a summary and a few conclusions.

2. Description of the Parent Distributions and Expression of δ = P W < V

In this section, a description of the parent distributions, namely the BXII and BIII distributions, is given. Also, the expression of the SS reliability δ = P W < V is provided, where V is the strength random variable that follows the BXII distribution, and W is the stress random variable that has the BIII distribution.
Burr [29] created a distributional scheme with twelve categories. Special focus has been placed on the BXII and BIII distributions. In the fields of lifetime and failure time modeling, the two-parameter BXII distribution is frequently used. In modeling lifetime data, or survival data, BXII and BIII have received special consideration because of their strong statistical and reliability characteristics.
Reference [30] noted that a significant amount of the curve shape properties in the Pearson family are covered when the parameters of the Burr distribution are chosen suitably. Since its shape parameter generates a variety of forms that are excellent fits for varied data, the BXII distribution has been used in research related to medicine, business, chemical engineering, quality control, and reliability. For instance, Ref. [31] illustrated the general applicability of the BXII distribution to any given collection of uni-model data, as well as the distribution’s link to other distributions. To create an economical statistical design of the control chart for the non-normally distributed data, Ref. [32] employed the BXII distribution. It was used by [33] to simulate inpatient costs in English hospitals. The BXII distribution has recently been applied to a number of disciplines, including finance and economics (McDonald and Richards [34], hydrology (Mielke and Johnson [35]), medicine (Wingo [36]), mineralogy (Cook and Johnson [37]). The probability density function (PDF) and the survival (SF) of the BXII distribution are defined by:
h ( v ) = ϑ φ 1 v ϑ 1 ( 1 + v ϑ ) φ 1 1 v R +
and
H ¯ ( v ) = ( 1 + v ϑ ) φ 1 v R + ,
where ϑ , φ 1 > 0 are the shape parameters. The BXII distribution’s inferences have been the subject of several studies (see, for example, [38,39,40,41,42,43,44]). Figure 1 shows the plots of PDF for the BXII distribution.
On the other hand, the BIII distribution has a wide range of applications in statistical modeling fields, including forestry (Gove et al. [45]), meteorology (Mielke [46]), fracture roughness data (Nadarajah and Kotz [47], and life testing (Hassen et al. [48]). In studies of the distribution of income, wages, and wealth, the BIII distribution is also known as the Dagum distribution [30]. It is referred to as the inverse Burr distribution in the actuarial literature [49] and the Kappa distribution in the meteorological literature [46]. For a random variable w R + , the PDF and SF of the BIII distribution, respectively, are given below:
g ( w ) = ϑ φ 2 w ( ϑ + 1 ) ( 1 + w ϑ ) φ 2 1 ,
and
G ¯ ( w ) = 1 ( 1 + w ϑ ) φ 2 ,
where ϑ , φ 2 > 0 , are the shape parameters. Several studies have looked at the implications of the BIII distribution (for instance, [50,51,52,53]). Figure 2 shows the plots of PDF for the BIII distribution.
Let strength V∼ BXII ( ϑ , φ 1 ) and stress W∼BIII ( ϑ , φ 2 ) be independently distributed random variables with the common shape parameter ϑ and the different shape parameter ( φ 1 , φ 2 ) . The SS reliability formula of δ = P W < V is computed as follows:
δ = 0 h ( v ) H W ( v ) d v = 0 ϑ φ 1 v ϑ 1 ( 1 + v ϑ ) φ 1 1 ( 1 + v ϑ ) φ 2 d v = φ 1 B φ 2 + 1 , φ 1 = Γ ( φ 1 + 1 ) Γ ( φ 2 + 1 ) Γ ( φ 1 + φ 2 + 1 ) ,
where Γ ( . ) is the gamma function. The SS parameter δ depends on the shape parameters φ 1 and φ 2 .

3. Maximum Likelihood Estimator of δ

Let ( v 1 : m 1 : n 1 , , v m 1 : m 1 : n 1 ) = ( v 1 , , v m 1 ) be the TII-PC from BXII ( ϑ , φ 1 ) with censoring scheme R = ( R 1 , , R m 1 ) having PDF (1) and SF (2). Let ( w 1 : m 2 : n 2 , , w m 2 : m 2 : n 2 ) = ( w 1 , , v m 2 ) be the TII-PC from BIII ( ϑ , φ 2 ) with censoring scheme R = ( R 1 , , R m 2 ) having PDF (3) and SF (4). The joint likelihood function is obtained as follows:
L = K 1 K 2 i = 1 m 1 h V ( v i ) H ¯ V ( v i ) R i j = 1 m 2 g W ( w j ) G ¯ W ( w j ) R j ,
where
K 1 = n 1 ( n 1 1 R 1 ) ( n 1 2 R 1 R 2 ) × . . . × ( n 1 m 1 + 1 R 1 . . . R m 1 1 ) ,
and
K 2 = n 2 ( n 2 1 R 1 ) ( n 2 2 R 1 R 2 ) × . . . × ( n 2 m 2 + 1 R 1 . . . R m 2 1 ) .
Using (1), (2), (3), and (4) in (6) we have
L ( ϑ φ 1 ) m 1 ( ϑ φ 2 ) m 2 i = 1 m 1 v i ϑ 1 ( 1 + v i ϑ ) φ 1 1 ( 1 + v i ϑ ) φ 1 R i j = 1 m 2 w j ( ϑ + 1 ) ( 1 + w j ϑ ) φ 2 1 1 ( 1 + w j ϑ ) φ 2 R j .
Now, the log-likelihood of (7) is:
* m 1 ln ( ϑ φ 1 ) + m 2 ln ( ϑ φ 2 ) + ϑ i = 1 m 1 ln ( v i ) j = 1 m 2 ln ( w j ) ( φ 1 + 1 ) i = 1 m 1 ln ( 1 + v i ϑ ) i = 1 m 1 R i φ 1 ln ( 1 + v i ϑ ) ( φ 2 + 1 ) j = 1 m 2 ln ( 1 + w j ϑ ) + j = 1 m 2 R j ln 1 ( 1 + w j ϑ ) φ 2 .
Differentiating (8) with regard to ϑ , φ 1 , and φ 2 and then equalizing them to zero, we obtain
* ϑ = m 1 + m 2 ϑ ^ + i = 1 m 1 ln ( v i ) j = 1 m 2 ln ( w j ) ( φ ^ 1 + 1 ) i = 1 m 1 ln v i ( 1 + v i ϑ ^ ) i = 1 m 1 R i φ ^ 1 ln v i ( 1 + v i ϑ ^ ) + ( φ ^ 2 + 1 ) j = 1 m 2 ln w j ( 1 + w j ϑ ^ ) j = 1 m 2 R j φ ^ 2 ( 1 + w j ϑ ^ ) φ ^ 2 1 w j ϑ ^ ln w j 1 ( 1 + w j ϑ ) φ ^ 2 = 0 ,
* φ 1 = m 1 φ ^ 1 i = 1 m 1 ln ( 1 + v i ϑ ^ ) i = 1 m 1 R i ln ( 1 + v i ϑ ^ ) = 0 ,
and
* φ 2 = m 2 φ ^ 2 j = 1 m 2 ln ( 1 + w j ϑ ^ ) + j = 1 m 2 R j ln ( 1 + w j ϑ ^ ) ( 1 + w j ϑ ^ ) φ ^ 2 1 = 0 .
It is obvious that the normal Equations (9)–(11) lack explicit forms. The Newton–Raphson technique is used to obtain MLEs of ϑ , φ 1 , and φ 2 .
Furthermore, we assumed that R i , i = 1 , , m 1 , R j , j = 1 , , m 2 are independent random variables following binomial distributions. Hence,
P ( R 1 = r 1 ) = n 1 m 1 r 1 P 1 r 1 1 P 1 n 1 m 1 r 1 ,
and
P R i = r i R i 1 = r i 1 , , R 1 = r 1 = n 1 m 1 s 1 = 1 i 1 r s 1 r i P 1 r i 1 P 1 n 1 m 1 s 1 = 1 i 1 r s 1 ,
where 0 r 1 n 1 m 1 , 0 r i n 1 m 1 s 1 = 1 i 1 r s 1 , i = 2 , , m 1 1 , R m 1 = n 1 m 1 s 1 = 1 m 1 1 r s 1 . Similarly,
P ( R 1 = r 1 ) = n 2 m 2 r 1 P 2 r 1 1 P 2 n 2 m 2 r 1 ,
and
P R j = r j R j 1 = r j 1 , . , R 1 = r 1 = n 2 m 2 s 2 = 1 j 1 r s 2 r j P 2 r j 1 P 2 n 2 m 2 s 2 = 1 j 1 r s 2 ,
where 0 r 1 n 2 m 2 , 0 r j n 2 m 2 s 2 = 1 j 1 r s 2 , j = 2 , , m 2 1 , R m 2 = n 2 m 2 s 2 = 1 m 2 1 r s 2 . The LF is, therefore, provided by
L 1 = L × P ( R 1 = r 1 , , R m 1 = r m 1 ) × P ( R 1 = r 1 , , R m 2 = r m 2 ) = L × n 1 m 1 i = 1 m 1 1 r i ! n 1 m 1 i = 1 m 1 1 r i ! P 1 i = 1 m 1 1 r i 1 P 1 ( m 1 1 ) ( n 1 m 1 ) i = 1 m 1 1 ( m 1 i ) r i × n 2 m 2 j = 1 m 2 1 r j ! n 2 m 2 j = 1 m 2 1 r j ! P 2 j = 1 m 2 1 r j 1 P 2 ( m 2 1 ) ( n 2 m 2 ) j = 1 m 2 1 ( m 2 j ) r j .
As observed, the joint PDF of R i , s , i = 1 , , m 1 and R j , s , j = 1 , , m 2 depend on P 1 and P 2 . Hence, the MLEs of P 1 and P 2 are obtained by maximizing L 1 as below:
P ^ 1 = i = 1 m 1 1 r i ( m 1 1 ) ( n 1 m 1 ) i = 1 m 1 1 ( m 1 i 1 ) r i , P ^ 2 = j = 1 m 2 1 r j ( m 2 1 ) ( n 2 m 2 ) j = 1 m 2 1 ( m 2 j 1 ) r j .
Finally, the MLE of δ is obtained by inserting φ ^ 1 and φ ^ 2 in Equation (5) as follows:
δ ^ = Γ ( φ ^ 1 + 1 ) Γ ( φ ^ 2 + 1 ) Γ ( φ ^ 1 + φ ^ 2 + 1 ) .

4. Bayesian Estimation

This section provides the Bayesian estimator of δ based on TII-PC with binomial removals, under the SEF and LNx loss functions, using INF and N-INF priors. We assume that the prior PDFs of ϑ , φ 1 , and φ 2 are given, respectively, by:
π k ( φ k ) = b k a k Γ ( a k ) φ k a k 1 e b k φ k , a k , b k , φ k > 0 , k = 1 , 2 ,
and
π 3 ( ϑ ) = b 3 a 3 Γ ( a 3 ) ϑ a 3 1 e b 3 ϑ , a 3 , b 3 , ϑ > 0 .
The joint posterior PDF of ϑ , φ 1 , and φ 2 is given by
π ( φ 1 , φ 2 , ϑ ) L 1 φ 1 a 1 1 φ 2 a 2 1 ϑ a 3 1 b 1 a 1 b 2 a 2 b 3 a 3 e ( b 1 φ 1 + b 2 φ 2 + b 3 ϑ ) .
Since 0 < P j < 1 , j = 1 , 2 , we consider the following prior PDFs for P j , j = 1 , 2
π k ( P j ) = 1 B ( c j , d j ) P j c j 1 ( 1 P j ) d j 1 , j = 1 , 2 , k = 4 , 5 ,
where B ( . , . ) is the beta function. The joint posterior PDF of φ 1 , φ 2 , ϑ , P 1 , and P 2 is given by:
π ( φ 1 , φ 2 , ϑ , P 1 , P 2 ) L 1 φ 1 a 1 1 φ 2 a 2 1 ϑ a 3 1 b 1 a 1 b 2 a 2 b 3 a 3 e ( b 1 φ 1 + b 2 φ 2 + b 3 ϑ ) π 4 ( P 1 ) π 5 ( P 2 ) .
Using (12), we have
π ( φ 1 , φ 2 , ϑ , P 1 , P 2 ) = D * π ( φ 1 , φ 2 , ϑ ) ,
where
D * = P 1 i = 1 m 1 1 r i + c 1 1 1 P 1 ( m 1 1 ) ( n 1 m 1 ) i = 1 m 1 1 ( m 1 i ) r i + d 1 1 B i = 1 m 1 1 r i + c 1 , ( m 1 1 ) ( n 1 m 1 ) i = 1 m 1 1 ( m 1 i ) r i + d 1 × P 2 j = 1 m 2 1 r j + c 2 1 1 P 2 ( m 2 1 ) ( n 2 m 2 ) j = 1 m 2 1 ( m 2 j ) r j + d 2 1 B j = 1 m 2 1 r j + c 2 , ( m 2 1 ) ( n 2 m 2 ) j = 1 m 2 1 ( m 2 j ) r j + d 2 .
The conditional posteriors are given as:
1.
For φ 1 :
π ( φ 1 | φ 2 , ϑ , P 1 , P 2 ) φ 1 a 1 1 e b 1 φ 1 i = 1 m 1 ( 1 + v i ϑ ) φ 1 R i j = 1 m 2 ( 1 + w j ϑ ) φ 1 R j
2.
For φ 2 :
π ( φ 2 | φ 1 , ϑ , P 1 , P 2 ) φ 2 a 2 1 e b 2 φ 2 i = 1 m 1 ( 1 + v i ϑ ) φ 2 R i j = 1 m 2 ( 1 ( 1 + w j ϑ ) φ 2 ) R j
3.
For ϑ :
π ( ϑ | φ 1 , φ 2 , P 1 , P 2 ) ϑ a 3 1 e b 3 ϑ i = 1 m 1 v i ϑ 1 ( 1 + v i ϑ ) φ 1 j = 1 m 2 w j ( ϑ + 1 ) ( 1 + w j ϑ ) φ 2
4.
For P 1 :
π ( P 1 | φ 1 , φ 2 , ϑ , P 2 ) P 1 i = 1 m 1 1 r i + c 1 1 ( 1 P 1 ) ( i = 1 m 1 1 ( m 1 i ) r i + d 1 1 )
5.
For P 2 :
π ( P 2 | φ 1 , φ 2 , ϑ , P 1 ) P 2 j = 1 m 2 1 r j + c 2 1 ( 1 P 2 ) ( j = 1 m 2 1 ( m 2 j ) r j + d 2 1 )
From the above conditional posteriors, which appear complex, we will not be able to obtain a distribution to generate samples from these relationships. Therefore, we will use a numerical method to solve the integration of the original posterior distribution, in Equation (17), such as the Markov Chain Monte Carlo (MCMC) method.
The Bayesian estimator of δ is defined as δ ˜ S E F and δ ˜ L N x , respectively, where it minimizes the SEF L S E F δ , δ ˜ S E F , loss function, and LNx loss function, L L N x δ , δ ˜ L N x .
L S E F δ , δ ˜ S E F = δ δ ˜ S E F 2 ,
L L N x δ , δ ˜ L N x = e α ( δ δ ˜ L N x ) α δ δ ˜ L N x 1 ,
and
δ ˜ S E F = E δ δ ˜ L N x = 1 α ln E e α δ ,
where α is an LNx scale parameter (for further information, see [54]). It should be clear that it is impossible to calculate Equation (20) analytically. Approximating these equations can be achieved with the Metropolis–Hastings (MH) method and the MCMC technique.

4.1. MH Algorithm

The MH method (Algorithm 1) uses the stages listed below to draw a sample from the posterior density provided by Equation (20)
Algorithm 1:
Step 1.Initialize ξ with ξ = ϑ ( 0 ) , ϕ 1 ( 0 ) , ϕ 2 ( 0 ) = ϑ ^ , ϕ ^ 1 , ϕ ^ 2 , where P 1 and P 2 are fixed.
Step 2.For i = 1 , 2 , , M , perform the following steps:
2.1:Set ξ = ξ ( i 1 ) .
2.2:Generate a new candidate parameter value ξ using a normal distribution with mean vector ξ ( i 1 ) and a small vector of standard deviations.
2.3:Compute β = π ( ξ ) π ( ξ ) , where π ( · ) is the posterior density in Equation (20).
2.4:Generate a sample u from the uniform U ( 0 , 1 ) distribution.
2.5:Accept or reject the new candidate ξ
If u β set ξ ( i ) = ξ elsewhere set ξ ( i ) = ξ
Therefore, MCMC samples of ( ϑ , ϕ 1 , ϕ 2 ) are obtained as:
ξ ( i ) = ϑ ( i ) , ϕ 1 ( i ) , ϕ 2 ( i ) , i = 1 , 2 , , M .
Hence, δ can be computed by substituting ξ ( i ) in Equation (5). Eventually, a portion of the initial samples can be removed (burn-in), and the remaining samples can be used to calculate Bayesian estimates (BEs) using random samples of size M drawn from the posterior density. The BEs of a parametric function δ under SEF and LNx are given by
δ ^ S E = 1 M l B i = l B M δ ( i ) ,
and
δ ^ L N x = 1 α ln 1 M l B i = l B M e α δ ( i ) ,
where l B represents the number of burn-in samples. Substituting δ ( i ) with ξ ( i ) in the above equations, we can obtain BEs of δ with respect to SEF and LNx loss functions.

4.2. Elicitation of Hyper-Parameters

The determination of hyper-parameters relies on informative priors, derived from the MLEs for BXII ( ϑ , ϕ 1 ) . This is achieved by aligning the mean and variance of ( ϑ ^ j , ϕ ^ 1 j ) with the corresponding parameters of gamma priors. Here, j = 1 , 2 , , f , and f denotes the number of available samples from the BXII ( ϑ , ϕ 1 ) distribution (Dey et al. [55]). Equating the moments of ( ϑ ^ j , ϕ ^ 1 j ) with the moments of the gamma priors yields the following equations:
1 f j = 1 f ϑ ^ j = a 1 b 1 , 1 f 1 j = 1 f ϑ ^ j 1 f j = 1 f ϑ ^ j 2 = a 1 b 1 2 , 1 f j = 1 f ϕ ^ 1 j = a 2 b 2 and 1 f 1 j = 1 f ϕ ^ 1 j 1 f j = 1 f ϕ ^ 1 j 2 = a 2 b 2 2 .
By solving the mentioned pair of equations, we can express the estimated hyper-parameters as follows:
a 1 = 1 f j = 1 f ϑ ^ j 2 1 f 1 j = 1 f ( ϑ ^ j 1 f j = 1 f ϑ ^ j ) 2 , b 1 = 1 f j = 1 f ϑ ^ j 1 f 1 j = 1 f ϑ ^ j 1 f j = 1 f ϑ ^ j 2 a 2 = ( 1 f j = 1 k ϕ ^ 1 j ) 2 1 k 1 j = 1 f ( ϕ ^ 1 j 1 f j = 1 f ϕ ^ 1 j ) 2 , b 2 = 1 f j = 1 f ϕ ^ 1 j 1 f 1 j = 1 f ϕ ^ 1 j 1 f j = 1 f ϕ ^ 1 j 2 .
We will apply the identical technique to calculate the hyper-parameters ( a 3 , b 3 , a 4 , b 4 ) for the BIII( ϑ , ϕ 2 ) case. Here, ϑ remains consistent across two assumed distributions, implying that its hyper-parameters assume identical values, specifically a 1 = a 3 and b 1 = b 3 .

5. Numerical Outcomes

In this section, we investigate the application of Monte Carlo simulation to the proposed estimates of the SS reliability δ within the context of TII-PC, incorporating binomial removal. The primary objective of this simulation study is to scrutinize the properties and effectiveness of derived estimates through both the ML and Bayesian methods. It is worth noting that the numerical calculations were executed using the R programming language, alongside various auxiliary software packages, to facilitate equation solving and result extraction. The following arguments are assumed for the simulation process:
1.
We assume a total of 1000 replications for our simulations.
2.
We assume the parameters for BXII( ϑ , φ 1 ) and BIII( ϑ , φ 2 ) are configured as follows: φ 1 takes values of 0.5 and 1.5, and φ 2 takes values of 0.75 and 1.75. Here, ϑ remains constant across both distributions, set at 1.5. Generating all potential parameter combinations will yield four distinct cases.
3.
We suggest a sample size of n = n 1 = n 2 with two values: 40 and 60. Furthermore, the number of stages m = m 1 = m 2 , varies depending on the chosen n value. Specifically, when n = 40 , we configure m to be either 20 or 30. On the other hand, for n = 60 , we explore options with m = 25 and 40 stages.
4.
In simulating the removal of units from the life test, we model it following a binomial distribution with probability P = P 1 = P 2 . We explore various values for the probability P = 0.05, 0.20, 0.50, and 0.8. Concerning the random unit removal patterns in the TII-PC, we assume two primary patterns based on n, m, and the removal probability P, falling into two distinct cases:
Scheme 1 (Sch-1):
R 1 follows a binomial distribution with parameters ( n m 1 , P ) , and subsequent stages R j follow a binomial distribution with parameters ( n j = 2 m 1 R j , P ) , where j = 2 , , m 1 . In this scheme, R m is set to zero.
Scheme 2 (Sch-2):
Here, R m follows a binomial distribution with parameters ( n m 1 , P ) and preceding stages R m j follow a binomial distribution with parameters ( n j = m 1 m R j , P ) . In this scheme, R 1 is set to zero.
Notably, Sch-1 involves a decreasing number of removals at each stage of censoring, while Sch-2 exhibits an increasing trend.

Steps of the Monte Carlo Simulation

Step 1:
For Sch-1, generate two random vectors of removed items, namely R and R , given ( n 1 , m 1 , P 1 ) and where ( n 2 , m 2 , P 2 ), n = n 1 = n 2 , m = m 1 = m 2 and P = P 1 = P 2 .
Step 2:
Generate a random data set V of size n = n 1 from BXII ( ϑ , φ 1 ) using the algorithm proposed by [56] and the provided R.
Step 3:
Similarly, generate a random data set W of size n = n 2 from the BIII ( ϑ , φ 2 ) given R .
Step 4:
Obtain MLE for the parameters ϑ , φ 1 , and φ 2 , and subsequently compute the estimate for δ by plugging these MLEs of ( ϑ , φ 1 , and φ 2 ) into Equation (5).
Step 5:
Compute the BE using the MH algorithm as follows:
1.
Consider two scenarios for prior distributions. In the first scenario, an INF prior is employed, where hyper-parameter values are computed using the technique outlined in Section 4.2 and Equations (23).
2.
Consider the second scenario, which involves the N-INF prior, where all hyper-parameter values are set to zero.
3.
For the given hyper-parameters of prior distributions, generate 10,000 samples of δ from the posterior density using MCMC and the MH algorithm.
4.
Discard the initial 2000 samples as burn-in from the overall set of 8000 samples generated from the posterior density.
5.
Calculate BEs of δ using two loss functions: SEF and LNx (with α = 1.5 for L N x 1 and α = 1.5 for L N x 2 ) using, respectively, (21) and (22).
Step 6:
Repeat Steps 2 to 5 a total of 1000 times and save all the estimates.
Step 7:
Calculate statistical metrics for point estimates: the average (A1) estimate and the root mean square error (A2) estimate. These calculations can be performed using the following formulas:
A 1 ( δ ) = 1 1000 l = 1 1000 δ ^ l , and A 2 ( δ ) = 1 1000 l = 1 1000 ( δ ^ l δ ) 2 .
In this context, δ signifies the actual value of the SS with the provided parameters, whereas δ ^ indicates the estimated value of the SS.
Step 8:
Repeat Steps 1 to 7 for the second scheme of removing items (Sch-2).
To provide point estimates of δ , we present the results of A1 and A2 estimates for various values of P and two proposed TII-PC schemes. Table 1 and Table 2 correspond to cases, where φ 1 = 0.5 and φ 2 take values of 0.75 and 1.75, respectively. Additionally, Table 3 and Table 4 correspond to cases where φ 1 = 1.5 and φ 2 take values of 0.75 and 1.75, respectively. The first row includes the A1 of δ and the second row includes the A2 of δ .
From the results in Table 1, Table 2, Table 3 and Table 4, we can draw some observations:
1.
As both n and m increase, there is a noticeable decrease in A2 for all proposed estimation methods, and A1 tends to converge to the true value of δ .
2.
With an increase in the removal probability (P), the A2 values also show an upward trend, indicating a decrease in the precision of the estimates as the value of P rises.
3.
In many instances, A2 estimates from Sch-2 appear to have slightly higher values compared to Sch-1 for all values of P except when P = 0.02 . This suggests that Sch-1 may exhibit better performance.
4.
When comparing BEs obtained using MCMC under the INF and N-INF approaches, there is a clear indication that the INF prior case significantly outperforms the N-INF prior case.
5.
The value of δ decreases with an increase in φ 2 , keeping ϑ and φ 1 constant. The same occurs when φ 1 increases.

6. Real Data Analysis

In this section, we analyze two actual datasets to illustrate the application of our proposed estimation techniques. These datasets consist of breakdown times for insulating fluid between electrodes recorded under varying voltages [57]. Table 5 displays the failure times (in minutes) for insulating fluid between two electrodes subjected to 36 kV (V) and 34 kV (W).
The Shapiro–Wilk normality tests were conducted to assess the normal distribution assumption for two datasets, V and W. The test statistics for the Shapiro–Wilk normality test were found to be 0.6082 and 0.7200 with corresponding values of p < 0.001 for the respective datasets. Therefore, we conclude that the two datasets do not follow a normal distribution.
The BXII ( ϑ , φ 1 ) and BIII ( ϑ , φ 2 ) distributions are initially applied independently to datasets V and W. First and foremost, it is crucial to ascertain the suitability of each distribution to analyze its respective dataset. This involves computing the MLEs for the parameters and assessing various goodness-of-fit criteria, including the negative log-likelihood criterion (NLC), the Akaike information criterion value (AICV), the Bayesian information criterion value (BICV), and the Anderson–Darling test (ADT) statistics, as well as the Kolmogorov–Smirnov test (K-ST) statistic and its corresponding p-value. These criteria are subsequently compared with those obtained from alternative distributions. For Dataset 1 with the BXII distribution, the alternatives include Weibull (WE), generalized exponential (Gen-Exp), exponential (Exp), and Lindely (L) distributions. As for Dataset 2, the compared distributions with BIII are inverse Weibull (Inv-WE), WE, Gen-Exp, and inverse gamma (Inv-Ga). Lower values of these criteria, coupled with larger p-values, indicate a superior fit. The findings, encompassing parameter estimates and goodness-of-fit statistics, are detailed in Table 6. The results from Table 6 indicate that, among the distributions considered, BXII and BIII serve as appropriate models for the provided Dataset 1 and Dataset 2, respectively. Additionally, Figure 3 presents visualizations of empirical and fitted distribution functions. These visuals distinctly highlight that the BXII and BIII distributions exhibit a more favorable alignment with Dataset 1 and Dataset 2, respectively, in comparison to the other distributions under consideration. This observation holds true, at least within the confines of these specific datasets.
Next, we check whether the null hypothesis H 0 : ϑ Data W = ϑ Data V against the alternative H 1 : ϑ Data W ϑ Data V holds. In this scenario, we calculate the test statistic as
2 * ϑ ^ Data W , ϕ ^ 2 * ϑ ^ Data V , ϕ ^ 1 = 69.2209 ,
and its associated p-value is found to be less than 0.05. Consequently, we accept the null hypothesis, affirming the validity of the assumption H 0 : ϑ Data W = ϑ Data V .
With the initial pair of datasets, we produce two sets of TII-PC samples from each dataset. These samples are constructed with a varying number of stages, precisely m = 10 , adhering to the item removal scheme outlined in Table 7.
We compute the estimate of δ through MLE for the parameters ϑ , φ 1 , and φ 2 , considering varying TII-PC patterns based on the provided two real datasets (V and W). The estimated value is found to be 0.7307. Furthermore, we calculate BEs using MCMC and utilizing the MH algorithm with the N-INF prior. While generating samples from the posterior distribution using MH, we initialize the value of δ as δ ( 0 ) = δ ^ , where δ ^ represents the MLE of δ . Subsequently, we discard the initial 2000 burn-in samples from a total of 10,000 samples generated from the posterior density. BEs are then derived using different loss functions, including SEF and LNx (with α = 1.5 for L N x 1 and α = 1.5 for L N x 2 ). The obtained BEs for SEF, L N x 1 and L N x 2 are 0.7709, 0.7667, and 0.7750, respectively.
Finally, the convergence of MCMC estimates using the MH algorithm for δ can be illustrated in Figure 4. This set of figures includes a trace plot, histogram, and cumulative mean for the estimated parameter δ under N-INF priors. These visualizations illustrate the normality of the generated posterior samples for the parameter δ and convergence to approximately 0.76.

7. Conclusions

Progressive censoring is frequently used in life testing and reliability studies to address a variety of issues that experimenters have while conducting various sorts of experiments, including cutting down on overall test duration, saving experimental units, and estimating effectively. One sort of progressive censoring that has been created to enable removal with specified distribution is the TII-PC with random removal. In this work, the estimate of the SS model is based on the assumption that the distributions of the random variables for stress and strength are distinct with common shape parameters. The point estimator for δ is generated using the TII-PC with binomial removal, taking the ML and Bayesian techniques into consideration. The MCMC approach and the MH algorithm, based on symmetric and asymmetric loss functions, are both carried out in light of INF and N-INF priors and result in Bayesian estimates. The effectiveness of the generated estimates is validated by a comprehensive simulation analysis. We discovered that the Bayes estimates employing the MCMC approach outperformed MLEs. Therefore, when analyzing data, one may consider using the Bayesian approach using the MH algorithm if prior knowledge about the data is available; otherwise, one may use ML or the Bayesian method based on the N-INF prior. Finally, to illustrate how our SS reliability model problem may be applied, we take a look at a real-world case.

Author Contributions

Conceptualization, I.E.; Software, L.S.D.; Formal analysis, A.R.E.-S.; Investigation, A.B.G.; Writing—original draft, A.S.H.; Writing—review & editing, M.E. All authors have read and agreed to the published version of the manuscript.

Funding

This work was supported and funded by the Deanship of Scientific Research at Imam Mohammad Ibn Saud Islamic University (IMSIU) (Grant Number: IMSIU-RP23009).

Data Availability Statement

Data are available in the paper.

Conflicts of Interest

The authors declare no conflict of interest.

Acronyms

Akaike information criteria valueAKICV
AverageA1
Anderson–Darling TestADT
Bayesian estimateBE
Bayesian information criteria valueBICV
Burr IIIBIII
Burr XIIBXII
Generalized exponentialGE
Inverse gamma formativeInv-Ga
Inverse WeibullInv-We
InformativeINF
Joint likelihood functionJLF
Kolmogorov–Smirnov TestK–ST
LindleyL
Maximum likelihood estimateMLE
Markov Chain Monte CarloMCMC
Metropolis–HastingsMH
Non-informativeN-INF
Probability density functionPDF
SchemeSch.
Root mean squared errorA2
Stress–strengthSS
Survival functionSF
Type-II progressive censoringTII-PC

References

  1. Kotz, S.; Pensky, M. The Stress-Strength Model and Its Generalizations: Theory and Applications; World Scientific: Singapore, 2003. [Google Scholar]
  2. Awad, A.M.; Gharraf, M.K. Estimation of P(Y < X) in the Burr case: A comparative study. Commun. Stat.-Simul. Comput. 1986, 15, 389–403. [Google Scholar] [CrossRef]
  3. Ahmed, K.E.; Fakhry, M.E.; Jaheen, Z.F. Empirical Bayes estimation of R=P(Y<X) and characterizations of Burr-type X model. J. Stat. Plan. Inference 1997, 64, 297–308. [Google Scholar]
  4. Kundu, D.; Gupta, R.D. Estimation of P[Y < X] for generalized exponential distribution. Metrika 2005, 61, 291–308. [Google Scholar] [CrossRef]
  5. Rezaei, S.; Tahmasbi, R.; Mahmoodi, M. Estimation of P[Y < X] for generalized Pareto distribution. J. Stat. Plan. Inference 2010, 140, 480–494. [Google Scholar] [CrossRef]
  6. Panahi, H.; Asadi, S. Estimation of R = P[Y<X] for two-parameter Burr Type XII Distribution. World Acad. Sci. Eng. Technol. 2010, 72, 465–470. [Google Scholar]
  7. Asgharzadeh, A.; Valiollahi, R.; Raqab, M.Z. Stress-strength reliability of Weibull distribution based on progressively censored samples. SORT-Stat. Oper. Res. Trans. 2011, 35, 103–124. [Google Scholar]
  8. Saracoğlu, B.; Kinaci, I.; Kundu, D. On estimation of R = P(Y < X) for exponential distribution under progressive type-II censoring. J. Stat. Comput. Simul. 2012, 82, 729–744. [Google Scholar] [CrossRef]
  9. Yadav, A.S.; Singh, S.K.; Singh, U. Estimation of stress–strength reliability for inverse Weibull distribution under progressive type-II censoring scheme. J. Ind. Prod. Eng. 2018, 35, 48–55. [Google Scholar] [CrossRef]
  10. Shoaee, S.; Khorram, E. Stress–strength reliability of a two-parameter Bathtub-shaped lifetime distribution based on progressively censored samples. Commun. Stat. Methods 2015, 44, 5306–5328. [Google Scholar] [CrossRef]
  11. Abd-Elfattah, A.M.; Abu-Moussa, M.H.; El-Fahham, M.M. Estimation of Stress-Strength Parameter for Burr type XII distribution Based on progressive type-II Censoring. In Proceedings of the 1st International Conference on New Horizons in Basic and Applied Science, Hurghada, Egypt, November 2013; Volume 1. Available online: http://www.anglisticum.mk (accessed on 20 October 2023).
  12. Yousef, M.M.; Hassan, A.S.; Alshanbari, H.M.; El-Bagoury, A.-A.H.; Almetwally, E.M. Bayesian and Non-Bayesian Analysis of Exponentiated Exponential Stress–Strength Model Based on Generalized Progressive Hybrid Censoring Process. Axioms 2022, 11, 455. [Google Scholar] [CrossRef]
  13. de la Cruz, R.; Salinas, H.S.; Meza, C. Reliability Estimation for Stress–Strength Model Based on Unit-Half-Normal Distribution. Symmetry 2022, 14, 837. [Google Scholar] [CrossRef]
  14. Temraz, N.S.Y. Inference on the stress strength reliability with exponentiated generalized Marshall Olkin-G distribution. PLoS ONE 2023, 18, e0280183. [Google Scholar] [CrossRef]
  15. Kumar, I.; Kumar, K.; Ghosh, I. Reliability Estimation in Inverse Pareto Distribution Using Progressively First Failure Censored Data. Am. J. Math. Manag. Sci. 2023, 42, 126–147. [Google Scholar] [CrossRef]
  16. Alsadat, N.; Hassan, A.S.; Elgarhy, M.; Chesneau, C.; Mohamed, R.E. An Efficient Stress–Strength Reliability Estimate of the Unit Gompertz Distribution Using Ranked Set Sampling. Symmetry 2023, 15, 1121. [Google Scholar] [CrossRef]
  17. Yu, Y.; Wang, L.; Dey, S.; Liu, J. Estimation of stress-strength reliability from unit-Burr III distribution under records data. Math. Biosci. Eng. 2023, 20, 12360–12379. [Google Scholar] [CrossRef]
  18. Kamel, I.; Anwar, T.; Najim, A. Different estimation methods of reliability in stress-strength model under chen distribution. AIP Conf. Proc. 2023, 2591, 050023. [Google Scholar] [CrossRef]
  19. Hassan, A.S.; Almanjahie, I.M.; Al-Omari, A.I.; Alzoubi, L.; Nagy, H.F. Stress–strength modeling using median- ranked set sampling: Estimation, simulation, and application. Mathematics. 2023, 11, 318. [Google Scholar] [CrossRef]
  20. Balakrishnan, N.; Aggarwala, R. Progressive Censoring: Theory, Methods, and Applications; Springer Science & Business Media: Boston, MA, USA, 2000. [Google Scholar]
  21. Balakrishnan, N. Progressive censoring methodology: An appraisal. TEST 2007, 16, 211–296. [Google Scholar] [CrossRef]
  22. Yuen, H.K.; Tse, S.K. Parameters estimation for Weibull with random removals. J. Stat. Comput. Simul. 1996, 55, 57–71. [Google Scholar] [CrossRef]
  23. Amin, Z.H. Bayesian inference for the Pareto lifetime model under progressive censoring with binomial removals. J. Appl. Stat. 2008, 35, 1203–1217. [Google Scholar] [CrossRef]
  24. Wu, S.J.; Chen, Y.J.; Chang, C.T. Statistical inference based on progressively censored samples with random removals from the Burr type XII distribution. J. Stat. Comput. Simul. 2007, 77, 19–27. [Google Scholar] [CrossRef]
  25. Tse, S.K.; Yang, C.; Yuen, H.K. Statistical analysis of Weibull distributed lifetime data under type-II progressive censoring with binomial removals. J. Appl. Stat. 2000, 27, 1033–1043. [Google Scholar] [CrossRef]
  26. Dey, S.; Dey, T. Statistical Inference for the Rayleigh distribution under progressively Type-II censoring with binomial removal. Appl. Math. Model. 2014, 38, 974–982. [Google Scholar] [CrossRef]
  27. Yan, W.; Shi, Y.; Song, B.; Zhaoyong, H. Statistical analysis of generalized exponential distribution under progressive censoring with binomial removals. J. Syst. Eng. Electron. 2011, 22, 704–714. [Google Scholar] [CrossRef]
  28. Mokhlis, L.S.D.; Khames, S.K.; Sadk, S.W. Estimation of Stress-Strength Reliability for Marshall- Olkin Extended Weibull Family Based on Type-II Progressive Censoring. J. Stat. Appl. Probab. 2021, 10, 385–396. [Google Scholar]
  29. Burr, W.I. Cumulative frequency distribution. Ann. Math. Stat. 1942, 13, 215–232. [Google Scholar] [CrossRef]
  30. Burr, I.W.; Cislak, P.J. On a general system of distributions: I. Its curve-shape characteristics; II. The sample median. J. Am. Stat. Assoc. 1968, 63, 627–635. [Google Scholar] [CrossRef]
  31. Tadikamalla, P.R. A look at the Burr and related distributions. Int. Stat. Rev./Revue Int. Stat. 1980, 48, 337–344. [Google Scholar] [CrossRef]
  32. Chou, C.Y.; Cheng, P.H.; Liu, H.R. Economic statistical design of X charts for non-normal data by considering quality loss. J. Appl. Stat. 2000, 27, 939–951. [Google Scholar] [CrossRef]
  33. Jones, A.M.; Lomas, J.; Nigel, R. Applying beta-type size distributions to health-care cost regressions. J. Appl. Econom. 2014, 29, 649–670. [Google Scholar] [CrossRef]
  34. McDonald, J.B.; Richards, D.O. Model selection, some generalized distributions. Commun. Stat. Theory Methods 1987, 16, 1049–1074. [Google Scholar] [CrossRef]
  35. Mielke, P.W., Jr.; Johnson, E.S. Some generalized beta distributions of the second kind having desirable applications features in hydrology and meterology. Water Resour. Res. 1974, 10, 223–226. [Google Scholar] [CrossRef]
  36. Wingo, D.R. Maximum likelihood methods for fitting the Burr type-XII distribution to life test data. Biom. J. 1983, 25, 77–81. [Google Scholar] [CrossRef]
  37. Cook, D.R.; Johnson, E.S. Generalized Burr-Pareto-Logistic distributions with applications to a uranium exploration data set. Technometrics 1986, 28, 123–131. [Google Scholar] [CrossRef]
  38. Li, X.; Shi, Y.; Wei, J.; Chai, J. Empirical Bayes estimators of reliability performances using LINEX loss under progressively type-II censored samples. Math. Comput. Simul. 2007, 73, 320–326. [Google Scholar] [CrossRef]
  39. Abd-Elfattah, A.M.; Hassan, A.S.; Nassr, S.G. Estimation in step-stress partially accelerated life tests for the Burr Type XII distribution using type I censoring. Stat. Methodol. 2008, 5, 502–514. [Google Scholar] [CrossRef]
  40. Rastogi, M.K.; Tripathi, Y.M. Estimating a parameter of Burr type XII distribution using hybrid censored observations. Int. J. Qual. Reliab. Manag. 2011, 28, 885–893. [Google Scholar] [CrossRef]
  41. Panahi, H.; Sayyareh, A. Estimation and prediction for a unified hybrid-censored Burr Type XII distribution. J. Stat. Comput. Simul. 2016, 86, 55–73. [Google Scholar] [CrossRef]
  42. Rastogi, M.K.; Tripathi, Y.M. Inference on unknown parameters of a Burr distribution under hybrid censoring. Stat. Pap. 2013, 54, 619–643. [Google Scholar] [CrossRef]
  43. Panahi, H. Estimation for the parameters of the Burr type XII distribution under doubly censored sample with application to microfluidics data. Int. J. Syst. Assur. Eng. 2019, 10, 510–518. [Google Scholar] [CrossRef]
  44. Hassan, A.S.; Assar, A.M.; Ali, K.A.; Nagy, H.F. Estimation of the density and cumulative distribution functions of the exponentiated Burr XII distribution. Stat. Transit. New Ser. 2021, 22, 171–189. [Google Scholar] [CrossRef]
  45. Gove, J.H.; Ducey, M.J.; Leak, W.B.; Zhang, L. Rotated sigmoid structures in managed uneven-aged northern hardwood stands: A look at the Burr Type III distribution. Forestry 2008, 81, 161–176. [Google Scholar] [CrossRef]
  46. Mielke, P.W. Another family of distributions for describing and analyzing precipitation data. J. Appl. Meterol. 1973, 12, 275–280. [Google Scholar] [CrossRef]
  47. Nadarajah, S.; Kotz, S. On the alternative to the Weibull function. Eng. Fract. Mech. 2007, 74, 451–456. [Google Scholar] [CrossRef]
  48. Hassan, A.S.; Elsherpieny, E.A.; Aghel, W.E. Statistical inference of the Burr Type III distribution under joint progressively Type-II censoring. Sci. Afr. 2023, 21, e01770. [Google Scholar] [CrossRef]
  49. Kleiber, C.; Kotz, S. Statistical Size Distributions in Economics and Actuarial Sciences; John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2003. [Google Scholar]
  50. Altindag, O.; Cankaya, M.N.; Yalcinkaya, A.; Aydoğdu, H. Statistical inference for the Burr Type III Distribution under Type II Censored Data. Commun. Fac. Sci. Univ. Ank.-Ser. A1 Math. Stat. 2017, 66, 297–310. [Google Scholar]
  51. Panahi, H. Estimation of the Burr type III distribution with application in unified hybrid censored sample of fracture toughness. J. Appl. Stat. 2017, 44, 2575–2592. [Google Scholar] [CrossRef]
  52. Gamchi, F.V.; Alma, Ö.G.; Belaghi, R.A. Classical and Bayesian inference for Burr type III distribution based on progressive type II hybrid censored data. Math. Sci. 2019, 13, 79–95. [Google Scholar] [CrossRef]
  53. Hassan, A.S.; Selmy, A.S.; Assar, S.M. Assessing the Lifetime Performance Index of Burr Type III Distribution under Progressive Type II Censoring. Pak. J. Stat. Oper. Res. 2021, 17, 633–647. [Google Scholar] [CrossRef]
  54. Zellner, A. Bayesian estimation and prediction using asymmetric loss functions. J. Am. Stat. Assoc. 1986, 81, 446–451. [Google Scholar] [CrossRef]
  55. Dey, S.; Dey, T.; Luckett, D.J. Statistical inference for the generalized inverted exponential distribution based on upper record values. Math. Comput. Simul. 2016, 120, 64–78. [Google Scholar] [CrossRef]
  56. Balakrishnan, N.; Sandhu, R.A. A Simple Simulational Algorithm for Generating Progressive Type-II Censored Samples. Am. Stat. 1995, 49, 229–230. [Google Scholar]
  57. Nelson, W. Applied Life Data Analysis; Wiley: New York, NY, USA, 1982. [Google Scholar]
Figure 1. Plots of PDF for the BXII distribution.
Figure 1. Plots of PDF for the BXII distribution.
Axioms 12 01054 g001
Figure 2. Plots of PDF for the BIII distribution.
Figure 2. Plots of PDF for the BIII distribution.
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Figure 3. The empirical distribution function and fitted distribution functions for Datasets 1 and 2.
Figure 3. The empirical distribution function and fitted distribution functions for Datasets 1 and 2.
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Figure 4. Convergence of MCMC samples for δ .
Figure 4. Convergence of MCMC samples for δ .
Axioms 12 01054 g004aAxioms 12 01054 g004b
Table 1. Measures of the MLEs and BEs for φ 1 = 0.5 and φ 2 = 0.75 under different values of P, m, and n.
Table 1. Measures of the MLEs and BEs for φ 1 = 0.5 and φ 2 = 0.75 under different values of P, m, and n.
( n , m ) PSch. MLEBE: INFBE: N-INF
SEF LNx 1 LNx 2 SEF LNx 1 LNx 2
(40, 20)0.05Sch-1A10.85360.79730.79680.79790.86740.86620.8685
A20.13900.07920.07860.07970.15190.15080.1530
Sch-2A10.82340.78600.78540.78660.83980.83810.8414
A20.11170.06810.06750.06870.12630.12490.1278
0.20Sch-1A10.80840.78220.78150.78280.82600.82410.8278
A20.09940.06440.06380.06500.11420.11270.1158
Sch-2A10.85240.79810.79760.79870.86580.86460.8669
A20.13780.08000.07950.08060.15030.14920.1513
0.40Sch-1A10.75370.76760.76690.76830.77650.77390.7790
A20.05900.05030.04960.05090.07260.07090.0743
Sch-2A10.85910.80100.80050.80160.87160.87060.8727
A20.14410.08290.08240.08340.15580.15480.1568
0.80Sch-1A10.74050.76450.76380.76520.76460.76170.7674
A20.05620.04740.04670.04800.06650.06500.0680
Sch-2A10.85970.80120.80070.80170.87210.87110.8731
A20.14470.08310.08250.08360.15630.15540.1573
(40,30)0.05Sch-1A10.77810.77420.77360.77470.79180.79010.7935
A20.07220.05680.05630.05740.08300.08170.0844
Sch-2A10.75660.76790.76730.76850.77150.76950.7734
A20.05730.05090.05030.05140.06690.06560.0682
0.20Sch-1A10.74320.76400.76340.76470.75880.75670.7609
A20.04930.04710.04650.04770.05740.05620.0586
Sch-2A10.81330.78620.78570.78680.82420.82280.8256
A20.10070.06840.06780.06890.11060.10940.1118
0.40Sch-1A10.73270.76070.76010.76140.74910.74680.7513
A20.04810.04410.04350.04470.05350.05260.0544
Sch-2A10.83210.79210.79160.79260.84250.84130.8437
A20.11880.07420.07370.07480.12840.12730.1294
0.80Sch-1A10.72590.75880.75820.75940.74260.74020.7449
A20.04710.04220.04160.04280.05050.04980.0513
Sch-2A10.84080.79480.79430.79530.85070.84960.8518
A20.12730.07690.07640.07740.13650.13550.1375
(60, 25)0.05Sch-1A10.85260.80190.80140.80240.86330.86240.8642
A20.13710.08390.08340.08430.14730.14650.1481
Sch-2A10.83790.79460.79400.79510.84990.84880.8509
A20.12320.07660.07610.07710.13440.13340.1354
0.20Sch-1A10.77810.77260.77190.77320.79490.79310.7966
A20.06940.05500.05440.05560.08330.08180.0847
Sch-2A10.85710.80510.80460.80560.86720.86630.8680
A20.14100.08710.08660.08750.15070.14990.1515
0.40Sch-1A10.74760.76260.76190.76320.76650.76430.7686
A20.05080.04560.04500.04620.06190.06060.0633
Sch-2A10.86150.80780.80730.80830.87130.87050.8720
A20.14510.08970.08920.09010.15460.15390.1553
0.80Sch-1A10.73890.76110.76050.76180.75890.75650.7613
A20.05100.04440.04380.04510.05970.05850.0610
Sch-2A10.85950.80700.80660.80750.86960.86880.8703
A20.14340.08900.08850.08940.15310.15230.1538
(60, 40)0.05Sch-1A10.79120.77870.77810.77920.80090.79970.8020
A20.07930.06130.06080.06180.08790.08690.0889
Sch-2A10.83510.79690.79650.79740.84270.84180.8435
A20.11950.07900.07850.07940.12680.12600.1276
0.20Sch-1A10.74390.76100.76040.76150.75600.75440.7575
A20.04310.04420.04360.04470.05040.04940.0514
Sch-2A10.84350.80150.80100.80200.85070.85000.8515
A20.12790.08360.08310.08400.13480.13410.1355
0.40Sch-1A10.73500.75740.75680.75790.74750.74580.7491
A20.04260.04100.04050.04150.04780.04700.0486
Sch-2A10.85050.80240.80190.80280.85720.85640.8579
A20.13440.08430.08390.08470.14090.14020.1416
0.80Sch-1A10.73070.75630.75570.75690.74300.74120.7447
A20.04230.04000.03950.04060.04620.04550.0469
Sch-2A10.85200.80290.80250.80340.85910.85840.8598
A20.13610.08490.08450.08530.14290.14230.1436
Table 2. Measures of the MLEs and BEs for φ 1 = 0.5 and φ 2 = 1.75 under different values of P, m, and n.
Table 2. Measures of the MLEs and BEs for φ 1 = 0.5 and φ 2 = 1.75 under different values of P, m, and n.
( n , m ) PSch. MLEBE: INFBE: N-INF
SEF LNx 1 LNx 2 SEF LNx 1 LNx 2
(40, 20)0.05Sch-1A10.77190.66990.66880.67090.79280.79090.7946
A20.21700.11180.11070.11280.23720.23550.2390
Sch-2A10.73090.64750.64640.64860.75340.75100.7558
A20.17630.08970.08860.09080.19790.19560.2002
0.20Sch-1A10.68560.62890.62780.63010.71140.70850.7143
A20.13390.07170.07060.07280.15840.15580.1610
Sch-2A10.78830.67680.67580.67780.80600.80430.8076
A20.23350.11900.11800.12000.25060.24900.2521
0.40Sch-1A10.62780.60620.60490.60740.65810.65460.6615
A20.08720.05000.04880.05110.11110.10840.1139
Sch-2A10.81120.68710.68620.68810.82850.82710.8299
A20.25540.12900.12810.13000.27220.27090.2735
0.80Sch-1A10.61260.60110.59990.60240.64550.64180.6492
A20.07110.04510.04400.04630.09770.09470.1008
Sch-2A10.81340.68940.68850.69040.83110.82980.8324
A20.25750.13120.13030.13220.27470.27350.2760
(40, 30)0.05Sch-1A10.66980.63100.63000.63200.68730.68500.6896
A20.12190.07520.07430.07620.13780.13580.1398
Sch-2A10.69510.64110.64010.64210.71180.70960.7139
A20.14350.08420.08330.08520.15870.15670.1606
0.20Sch-1A10.59650.59810.59690.59920.61700.61420.6197
A20.05930.04330.04230.04430.07310.07120.0751
Sch-2A10.72210.65270.65170.65360.73750.73550.7394
A20.16840.09500.09400.09590.18340.18150.1852
0.40Sch-1A10.58510.59350.59240.59450.60700.60430.6097
A20.05610.04060.03970.04150.06900.06740.0707
Sch-2A10.73520.66020.65920.66120.74990.74800.7518
A20.18130.10260.10160.10350.19530.19350.1971
0.80Sch-1A10.57910.58970.58860.59080.60160.59870.6045
A20.06410.03960.03870.04040.07410.07280.0755
Sch-2A10.73180.65860.65770.65960.74770.74580.7496
A20.17810.10110.10020.10210.19320.19140.1949
(60, 25)0.05Sch-1A10.80970.68880.68800.68960.82390.82280.8251
A20.25270.13090.13010.13170.26670.26560.2678
Sch-2A10.74680.65340.65250.65440.76430.76260.7659
A20.19130.09590.09500.09680.20870.20710.2103
0.20Sch-1A10.68830.62580.62480.62680.70900.70670.7112
A20.13560.06900.06800.07000.15490.15280.1570
Sch-2A10.81530.69410.69330.69500.82760.82650.8286
A20.25830.13590.13510.13670.27060.26960.2716
0.40Sch-1A10.65380.61130.61030.61240.67640.67390.6788
A20.10260.05480.05380.05590.12410.12190.1264
Sch-2A10.82640.69740.69660.69820.83940.83850.8404
A20.26960.13960.13880.14040.28250.28160.2833
0.80Sch-1A10.62190.60100.59990.60210.64560.64260.6485
A20.07750.04560.04460.04660.09680.09440.0993
Sch-2A10.82880.70150.70070.70230.84080.83990.8417
A20.27180.14340.14260.14410.28390.28300.2847
(60, 40)0.05Sch-1A10.69540.64020.63930.64110.70840.70690.7100
A20.14090.08330.08250.08420.15330.15190.1548
Sch-2A10.73050.65740.65660.65820.74180.74040.7433
A20.17420.09970.09890.10050.18530.18390.1867
0.20Sch-1A10.61460.60160.60060.60250.63210.63010.6340
A20.06910.04670.04590.04750.08540.08380.0869
Sch-2A10.75760.67080.67000.67160.76810.76690.7694
A20.20080.11280.11200.11360.21120.21000.2124
0.40Sch-1A10.58690.58890.58790.58980.60050.59850.6025
A20.04780.03520.03440.03600.05780.05650.0591
Sch-2A10.76880.67650.67570.67720.77780.77670.7790
A20.21210.11860.11780.11930.22130.22020.2224
0.80Sch-1A10.57740.58610.58510.58710.59240.59010.5946
A20.04600.03430.03350.03500.05410.05280.0553
Sch-2A10.77530.68050.67970.68120.78520.78410.7863
A20.21840.12250.12170.12320.22830.22720.2294
Table 3. Measures of the MLEs and BEs for φ 1 = 1.5 and φ 2 = 0.75 under different values of P, m, and n.
Table 3. Measures of the MLEs and BEs for φ 1 = 1.5 and φ 2 = 0.75 under different values of P, m, and n.
( n , m ) PSch. MLEBE: INFBE: N-INF
SEF LNx 1 LNx 2 SEF LNx 1 LNx 2
(40, 20)0.05Sch-1A10.63440.54440.54320.54560.66140.65810.6647
A20.16190.06710.06590.06820.18760.18450.1907
Sch-2A10.61330.53620.53490.53740.64260.63900.6461
A20.14280.05940.05830.06060.16990.16660.1732
0.20Sch-1A10.57270.52110.51980.52230.60500.60090.6090
A20.10640.04490.04380.04610.13480.13120.1384
Sch-2A10.64320.55090.54970.55200.66970.66660.6728
A20.17020.07340.07230.07460.19550.19250.1984
0.40Sch-1A10.52920.50750.50620.50880.56470.56010.5693
A20.07580.03320.03220.03430.10140.09770.1051
Sch-2A10.65130.55500.55340.55650.67840.67540.6813
A20.17860.08020.07960.08120.20440.20170.2072
0.80Sch-1A10.49910.49790.49660.49920.53580.53090.5408
A20.06450.02570.02480.02660.08150.07830.0848
Sch-2A10.65290.55700.55560.55850.67940.67650.6823
A20.17910.08180.08110.08250.20470.20190.2074
(40, 30)0.05Sch-1A10.57550.53050.52940.53170.59660.59370.5995
A20.10620.05480.05370.05590.12530.12270.1280
Sch-2A10.57230.52840.52720.52960.59300.59010.5960
A20.10360.05280.05170.05390.12210.11940.1248
0.20Sch-1A10.50710.50250.50130.50380.53110.52780.5344
A20.05780.03070.02980.03160.07160.06940.0740
Sch-2A10.60410.54280.54170.54400.62360.62100.6262
A20.13250.06630.06530.06740.15080.14830.1532
0.40Sch-1A10.48830.49220.49090.49340.51250.50900.5159
A20.05170.02390.02330.02460.06000.05830.0619
Sch-2A10.60510.53970.53860.54090.62450.62190.6271
A20.13350.06350.06240.06460.15170.14930.1541
0.80Sch-1A10.49050.49340.49220.49460.51510.51160.5185
A20.05490.02530.02470.02600.06390.06210.0658
Sch-2A10.61430.54330.54220.54450.63270.63010.6352
A20.14210.06710.06600.06810.15950.15710.1619
(60, 25)0.05Sch-1A10.65570.57060.56950.57170.67700.67460.6794
A20.18050.09280.09170.09390.20130.19900.2036
Sch-2A10.63400.55660.55540.55770.65650.65380.6592
A20.16020.07920.07810.08030.18180.17920.1843
0.20Sch-1A10.55470.52080.51960.52210.58180.57840.5852
A20.08810.04530.04420.04640.11170.10870.1147
Sch-2A10.66370.57910.57800.58020.68520.68300.6874
A20.18830.10130.10030.10240.20930.20720.2115
0.40Sch-1A10.53310.50840.50720.50950.56170.55800.5654
A20.07280.03370.03270.03480.09510.09200.0981
Sch-2A10.66630.57560.57450.57680.68810.68590.6902
A20.19100.09970.09910.10030.21240.21030.2145
0.80Sch-1A10.50440.49810.49690.49930.53430.53030.5382
A20.05970.02600.02520.02690.07600.07330.0787
Sch-2A10.66470.57530.57430.57630.68530.68310.6875
A20.18930.09770.09670.09860.20970.20760.2118
(60, 40)0.05Sch-1A10.59820.53840.53750.53920.61320.61120.6153
A20.12480.06150.06070.06240.13920.13730.1411
Sch-2A10.57660.52880.52790.52970.59230.59020.5944
A20.10450.05240.05150.05320.11910.11710.1211
0.20Sch-1A10.50880.50180.50080.50280.52680.52430.5293
A20.05220.02960.02880.03040.06360.06180.0654
Sch-2A10.63050.56000.55910.56090.64410.64230.6459
A20.15510.08270.08180.08360.16840.16670.1701
0.40Sch-1A10.50160.49880.49770.49980.51960.51710.5222
A20.04910.02750.02680.02830.05900.05730.0607
Sch-2A10.63280.56150.56060.56240.64610.64440.6479
A20.15760.08420.08340.08510.17050.16880.1722
0.80Sch-1A10.49180.49250.49160.49350.51070.50810.5133
A20.04850.02290.02230.02340.05580.05450.0573
Sch-2A10.63440.55790.55700.55870.64770.64600.6494
A20.15920.08040.07960.08130.17210.17040.1738
Table 4. Measures of the MLEs and BEs for φ 1 = 1.5 and φ 2 = 1.75 under different values of P, m, and n.
Table 4. Measures of the MLEs and BEs for φ 1 = 1.5 and φ 2 = 1.75 under different values of P, m, and n.
( n , m ) PSch. MLEBE: INFBE: N-INF
SEF LNx 1 LNx 2 SEF LNx 1 LNx 2
(40, 20)0.05Sch-1A10.52770.33420.33300.33540.56370.55940.5679
A20.27440.07760.07640.07870.30950.30540.3136
Sch-2A10.46670.30220.30110.30330.50610.50130.5108
A20.21420.04600.04500.04710.25240.24780.2570
0.20Sch-1A10.38710.26990.26880.27090.43030.42530.4353
A20.13830.01780.01710.01850.17890.17410.1837
Sch-2A10.53730.34260.34130.34390.57300.56890.5771
A20.28420.08600.08500.08710.31900.31490.3230
0.40Sch-1A10.35180.25710.25610.25810.39600.39100.4011
A20.10640.01350.01360.01350.14660.14190.1514
Sch-2A10.53580.34610.34460.34760.57240.56830.5765
A20.28340.09170.09010.09320.31890.31490.3229
0.80Sch-1A10.31260.24480.24390.24580.35680.35190.3618
A20.07710.01990.02050.01930.11250.10810.1170
Sch-2A10.54320.34970.34850.35090.57980.57570.5839
A20.29050.09310.09190.09430.32600.32200.3299
(40, 30)0.05Sch-1A10.41500.29860.29760.29960.44180.43850.4452
A20.16270.04340.04250.04440.18850.18520.1918
Sch-2A10.33170.26160.26070.26260.36010.35690.3634
A20.08500.01590.01570.01620.11040.10730.1135
0.20Sch-1A10.30190.24970.24880.25060.33070.32750.3339
A20.06200.01790.01830.01750.08480.08200.0877
Sch-2A10.44230.31160.31060.31270.46870.46540.4720
A20.18920.05590.05500.05690.21480.21150.2180
0.40Sch-1A10.27170.23820.23730.23900.30030.29730.3034
A20.04910.02610.02670.02550.06350.06140.0658
Sch-2A10.45660.31820.31720.31920.48180.47850.4850
A20.20320.06240.06140.06340.22760.22440.2308
0.80Sch-1A10.27380.23950.23860.24040.30220.29910.3053
A20.05050.02570.02630.02510.06540.06310.0677
Sch-2A10.46190.32340.32240.32450.48720.48400.4905
A20.20820.06750.06650.06860.23290.22980.2361
(60, 25)0.05Sch-1A10.55050.36620.36510.36740.57910.57580.5823
A20.29560.10920.10800.11030.32370.32050.3269
Sch-2A10.49080.32880.32770.33000.52210.51840.5258
A20.23680.07220.07110.07340.26730.26370.2709
0.20Sch-1A10.42410.29370.29270.29480.45760.45370.4616
A20.17100.03830.03720.03930.20360.19970.2075
Sch-2A10.55360.37940.37820.38060.58410.58080.5873
A20.29970.12260.12150.12370.32940.32620.3326
0.40Sch-1A10.33720.25850.25750.25950.37270.36870.3767
A20.09220.01570.01570.01580.12390.12020.1277
Sch-2A10.55200.38560.38430.38690.58230.57900.5856
A20.29820.12910.12790.13030.32780.32460.3310
0.80Sch-1A10.30130.24570.24480.24670.33710.33330.3410
A20.06840.02150.02200.02100.09510.09180.0984
Sch-2A10.54660.38490.38340.38650.57800.57470.5814
A20.29370.12910.12780.13060.32430.32100.3275
(60, 40)0.05Sch-1A10.43090.32070.31980.32170.45090.44850.4534
A20.17620.06460.06370.06560.19590.19340.1983
Sch-2A10.41650.31270.31180.31370.43670.43420.4392
A20.16220.05700.05610.05790.18200.17950.1844
0.20Sch-1A10.32060.26390.26300.26470.34210.33970.3446
A20.07220.01720.01690.01750.09150.08920.0938
Sch-2A10.49730.35910.35810.36010.51560.51330.5179
A20.24180.10240.10140.10340.25990.25760.2622
0.40Sch-1A10.30000.25470.25390.25560.32160.31920.3239
A20.05620.01700.01720.01690.07370.07160.0759
Sch-2A10.50690.36490.36390.36590.52500.52270.5273
A20.25140.10820.10720.10920.26930.26700.2715
0.80Sch-1A10.27280.24280.24200.24360.29430.29210.2966
A20.04370.02370.02420.02320.05500.05340.0567
Sch-2A10.50330.36320.36220.36420.52140.51910.5237
A20.24810.10670.10570.10770.26590.26370.2682
Table 5. Two datasets.
Table 5. Two datasets.
V (36 kV)0.350.590.960.991.691.972.072.582.712.90
3.673.995.3513.7725.50
W (34 kV)0.190.780.961.312.783.164.154.674.856.50
7.358.018.2712.0631.7532.5233.9136.7172.89
Table 6. Evaluation of the goodness of fit for the provided two datasets.
Table 6. Evaluation of the goodness of fit for the provided two datasets.
DatasetPDFEstimateNLCAICVBICVADTK-STp-Value
VBXII2.45890.376636.236776.473577.88960.28850.17210.7045
WE0.88904.291537.691479.382880.79890.66470.19170.5751
Gen-Exp0.96504.719737.905279.810381.22640.73220.21810.4143
Exp4.6063---37.910477.820778.52880.72990.22050.4006
L0.3750---39.871581.743182.45120.89480.27030.1854
WBIII0.82603.06701.62637.25269.14150.41510.12350.9003
Inv-WE1.92790.643470.6897145.3795147.26830.61870.15790.6738
WE0.770512.213968.3860140.7721142.66090.48040.16110.6499
Gen-Exp0.682918.677668.6489141.2978143.18670.49080.18860.4535
Inv-Ga0.53010.964572.1593148.3187150.20760.88620.21640.2917
Table 7. Generated m data of the TII-PC and corresponding censored schemes.
Table 7. Generated m data of the TII-PC and corresponding censored schemes.
i12345678910
v i 0.350.961.691.972.072.712.903.673.995.35
R i 1211000000
w i 0.191.312.784.154.674.857.358.2712.0631.75
R i 2221110000
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Elbatal, I.; Hassan, A.S.; Diab, L.S.; Ben Ghorbal, A.; Elgarhy, M.; El-Saeed, A.R. Stress–Strength Reliability Analysis for Different Distributions Using Progressive Type-II Censoring with Binomial Removal. Axioms 2023, 12, 1054. https://doi.org/10.3390/axioms12111054

AMA Style

Elbatal I, Hassan AS, Diab LS, Ben Ghorbal A, Elgarhy M, El-Saeed AR. Stress–Strength Reliability Analysis for Different Distributions Using Progressive Type-II Censoring with Binomial Removal. Axioms. 2023; 12(11):1054. https://doi.org/10.3390/axioms12111054

Chicago/Turabian Style

Elbatal, Ibrahim, Amal S. Hassan, L. S. Diab, Anis Ben Ghorbal, Mohammed Elgarhy, and Ahmed R. El-Saeed. 2023. "Stress–Strength Reliability Analysis for Different Distributions Using Progressive Type-II Censoring with Binomial Removal" Axioms 12, no. 11: 1054. https://doi.org/10.3390/axioms12111054

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