Electromagnetic Imaging from Radio Frequency to Sub-Millimeter Waves

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Microwave and Wireless Communications".

Deadline for manuscript submissions: 15 November 2024 | Viewed by 57

Special Issue Editors


E-Mail Website
Guest Editor
Department of Electrical, Electronic, Telecommunication Engineering, and Naval Architecture, University of Genoa, 16145 Genova, Italy
Interests: electromagnetic imaging; electromagnetic scattering; computational electromagnetics
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Department of Electrical, Electronic, Telecommunications Engineering, and Naval Architecture, University of Genoa, 16145 Genova, Italy
Interests: electromagnetic imaging and antenna diagnostic

Special Issue Information

Dear Colleagues,

The objective of electromagnetic imaging is to retrieve information about tested structures by studying their interactions with electromagnetic waves. To make a long story short, this involves solving an inverse problem, where the measurable effect is a field-related quantity, and the cause is related to the targets’ geometric and electromagnetic properties. The major benefit of using non-ionizing radiation for electromagnetic imaging is the possibility of acquiring target features and analyzing objects in a fully non-invasive and safe way.

Thanks to the continuous development of imaging techniques and algorithms, an uncountable number of applications across almost all bands of the frequency spectrum are emerging.

Based on the frequency band, the achievable resolution of imaging techniques can vary significantly (basically, this ranges from meters in the RF band to fractions of millimeters at THz frequencies), and therefore applications may be very diverse.

The targets of interest for electromagnetic imaging include deep and shallow subsurface regions, civil and archeological structures, industrial products, the human body, plants and their fruits, food, and many others. Therefore, the applications may be related to a wide range of fields, from biomedical diagnostics to space exploration, and from nondestructive testing to security. In all cases, the successful application of electromagnetic imaging methodologies requires a strong connection between analytical and numerical modeling, measurement system design, and processing algorithms.

Dr. Alessandro Fedeli
Dr. Valentina Schenone
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electromagnetic imaging
  • microwave imaging
  • millimeter-wave imaging
  • THz imaging
  • tomography
  • inverse scattering
  • inverse problems
  • subsurface imaging
  • nondestructive tests
  • through-the-wall imaging
  • biomedical diagnostics
  • security imaging

Published Papers

This special issue is now open for submission.
Back to TopTop