In Situ Characterization of Nanocrystals: Electron Microscopy and Beyond

A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Crystal Engineering".

Deadline for manuscript submissions: closed (30 April 2024) | Viewed by 165

Special Issue Editors

Key Lab of MEMS of MoE, Southeast University, Sipailou 2, Nanjing 210096, China
Interests: in situ transmission electron microscopy; electron irradiation; structural evolution; nanofabrication; two-dimensional materials

E-Mail Website
Guest Editor
School of Mechanics and Safety Engineering, No.100 Science Avenue, Zhengzhou University, Zhengzhou 450001, China
Interests: in situ liquid cell transmission electron microscopy; nanocrystal structural evolution; lithium battery

Special Issue Information

Dear Colleagues,

The design of functional nanomaterials and nanodevices often relies on a fundamental understanding of the relationship between the structure and property of nanomaterials. In situ electron microscopy is a state-of-the-art technique to observe a sample’s response to external stimuli and the environment (including electron beam irradiation, thermal treatment, mechanical force, optical excitation, electric and magnetic field, gas/liquid exposure, etc.). It offers direct observation of nanocrystal dynamics with resolution down to the atomic level, providing unique access to understanding and quantifying the nature of samples during the physical and chemical processes. There are extensive findings based on in situ electron microscopy, such as nanocrystal nucleation and growth, structure evolution under electric and mechanical force, and dynamics in reaction conditions. These progresses reveal fundamental insights into dynamic reaction mechanisms and provide new opportunities for the development of nanoscience and nanotechnology.

This Special Issue mainly focuses on the latest discoveries of nanocrystal dynamics in nanomaterials synthesis, nanoelectronics, catalysis, energy conversion and storage, etc. It is also appreciated to discuss progress in the development of cutting-edge in situ characterization techniques.

Dr. Tao Xu
Dr. Wen Wang
Guest Editors

Manuscript Submission Information

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Keywords

  • in situ characterization
  • electron microscopy
  • nanocrystal
  • dynamics on the nanoscale
  • structure–property relationship

Published Papers

There is no accepted submissions to this special issue at this moment.
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