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Article

A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield

by
N. Can
* and
H.G. Belik
Faculty of Arts and Sciences, Physics Department, Celai Bayar University, 45140 Muradiye, Manisa, Turkey
*
Author to whom correspondence should be addressed.
Math. Comput. Appl. 2004, 9(1), 91-99; https://doi.org/10.3390/mca9010091
Published: 1 April 2004
Versions Notes

Abstract

A simple method that computes the number of atoms in implanted samples from the integral of the elastic backseattering yield, using a pocket calculator, is represented. The energy dependence E-2, of the Rutherford law and the screening of the nuclear charge by the electron cloud is considered. The method is based on the assumption that the stopping power is a linearly decreasing function of the energy in the range from 1.4 MeV to 2 MeV. The total yield can be integrated analytically, and the number of atoms in the sample can then be ascertained by an iteration procedure that can be accomplished with a scientific pocket calculator, The results obtained are compared with the values obtained using the computer simulation code for RBS spectra RUMP.
Keywords: RBS; Elastic backscattering; Stopping Power RBS; Elastic backscattering; Stopping Power

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MDPI and ACS Style

Can, N.; Belik, H.G. A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield. Math. Comput. Appl. 2004, 9, 91-99. https://doi.org/10.3390/mca9010091

AMA Style

Can N, Belik HG. A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield. Mathematical and Computational Applications. 2004; 9(1):91-99. https://doi.org/10.3390/mca9010091

Chicago/Turabian Style

Can, N., and H.G. Belik. 2004. "A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield" Mathematical and Computational Applications 9, no. 1: 91-99. https://doi.org/10.3390/mca9010091

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