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Journal: Electronics, 2020
Volume: 9
Number: 1140

Article: Pattern Detection Model Using a Deep Learning Algorithm for Power Data Analysis in Abnormal Conditions
Authors: by Jeong-Hee Lee, Jongseok Kang, We Shim, Hyun-Sang Chung and Tae-Eung Sung
Link: https://www.mdpi.com/2079-9292/9/7/1140

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