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Journal: Electronics, 2022
Volume: 11
Number: 1921

Article: A Novel Prognostic Model of the Degradation Malfunction Combining a Dynamic Updated-ARIMA and Multivariate Isolation Forest: Application to Radar Transmitter
Authors: by Yuting Zhai, Dongli Liu, Zhanxin Cheng and Shaojun Fang
Link: https://www.mdpi.com/2079-9292/11/12/1921

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