Next Article in Journal
High-Temperature Coefficient of Resistance in MoxW1−xS2 Thin Film
Next Article in Special Issue
Influence of Quality of Mounting Process of RF Transistors on Their Thermal Parameters and Lifetime
Previous Article in Journal
Using Artificial Intelligence for Space Challenges: A Survey
Previous Article in Special Issue
Monolithic Si-Based AlGaN/GaN MIS-HEMTs Comparator and Its High Temperature Characteristics
 
 
Article

Article Versions Notes

Appl. Sci. 2022, 12(10), 5109; https://doi.org/10.3390/app12105109
Action Date Notes Link
article xml file uploaded 19 May 2022 09:40 CEST Original file -
article xml uploaded. 19 May 2022 09:40 CEST Update https://www.mdpi.com/2076-3417/12/10/5109/xml
article pdf uploaded. 19 May 2022 09:41 CEST Version of Record https://www.mdpi.com/2076-3417/12/10/5109/pdf
article html file updated 19 May 2022 09:42 CEST Original file https://www.mdpi.com/2076-3417/12/10/5109/html
Back to TopTop