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Special Issue "XUV and X-ray Free-Electron Lasers and Applications"
A special issue of Photonics (ISSN 2304-6732).
Deadline for manuscript submissions: closed (30 April 2023) | Viewed by 11723
Special Issue Editors
Interests: high-order laser harmonics; free-electron lasers; attosecond pulses; extreme-ultraviolet optics; ultrafast beamlines
Interests: XUV ultrafast spectroscopy; XUV ultrafast optics; Generation of femto- and attosecond pulses; Ultrafast pulse conditioning Space optics
Special Issue Information
Nowadays, free-electron laser (FEL) technology is rapidly developing and opens new perspectives for sources of extreme peak brightness in the X-ray spectral region with ultrashort pulse duration and full transverse coherence. Since the operation of FLASH as the first user-dedicated facility for soft-X rays in 2005, the capability of FEL facilities to operate towards higher X-ray energies opens up a new realm for experiments dedicated to coherent X-ray imaging, structure determination of molecules in biology, medical diagnosis, nondestructive testing, and the study ultrafast electron dynamics in matter. Nowadays, seven FEL facilities are in operation worldwide (FLASH, LCLS, SACLA, FERMI, PAL-XFEL, European XFEL, Swiss XFEL) and others are in an advanced stage of development.
This Special Issue aims to explore the current state-of-the-art of FEL sources in delivering ultrashort pulses in the femtosecond or sub-femtosecond regime with high photon energy, which enable the use of X-ray-based techniques for coherent control and state-selective spectroscopy. Contributions related to measurement of the spectral phase of FEL pulses and the realization of coherent control are welcome.
One research field where X-ray FELs play a central role is coherent imaging, as they enable atomic-resolution imaging of biological molecules with single-pulse imaging techniques. Contributions related coherent time-resolved imaging techniques involving FELs are welcome.
On the technological side, the development of a new generation of detectors has been one of the keys for the successful operation of FEL facilities. Contributions related to the development of FEL detectors particularly suited for emerging FELs with higher repetition rates are also welcome.
In addition, optics play a crucial role in handling ultrashort and ultraintense FEL pulses at high energies. Contributions related to the development of optical components to manage, handle, and condition FEL beams are also welcome.
Dr. Luca Poletto
Dr. Fabio Frassetto
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- free-electron lasers
- coherent control
- coherent X-ray imaging
- diffractive imaging
- X-ray diffraction techniques
- X-ray ultrafast detectors
- X-ray microfocusing and nanofocusing