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Metrology
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Metrology in Times of Digitization
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Metrology in Times of Digitization

A special issue of Metrology (ISSN 2673-8244).

Deadline for manuscript submissions: closed (31 October 2022) | Viewed by 2725

Special Issue Editor

Prof. Dr. Han Haitjema

E-Mail Website
Guest Editor
Department of Mechanical Engineering, KU Leuven, Celestijnenlaan 300, 3001 Leuven, Belgium
Interests: dimensional metrology; interferometry; surface roughness; surface filtering
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

The adoption of digital technology in the world of metrology and calibration has been accelerating in recent years. The traditional paperwork of making manual records of measurements, typing and signing certificates is being replaced by their digital counterparts. Additionally, the recording of environmental conditions, original measurement data and much more—if not all—of the documentation required in the ISO 17025 is saved on hard disks instead of binders in cupboards, or even in the cloud. In the technology aspect there is the parallel development of big data, the application of data mining and artificial intelligence. In 2022, metrology day is dedicated to this subject, especially regarding the concept that data must be “FAIR”, an acronym that stands for findable, accessible, interoperable and reusable. Metrology will dedicate a Special Issue to this subject, where authors are invited submit contributions that focus on any of these or related aspects of metrology.

Prof. Dr. Han Haitjema
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • metrology 4.0
  • big data
  • open source
  • digitization
  • data mining

Published Papers (1 paper)

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Research

16 pages, 1095 KiB  
Article
Using Ontologies to Create Machine-Actionable Datasets: Two Case Studies
by Jean-Laurent Hippolyte, Marina Romanchikova, Maurizio Bevilacqua, Paul Duncan, Samuel E. Hunt, Federico Grasso Toro, Anne-Sophie Piette and Julia Neumann
Metrology 2023, 3(1), 65-80; https://doi.org/10.3390/metrology3010003 - 03 Feb 2023
Cited by 2 | Viewed by 2066
Abstract
Achieving the highest levels of compliance with the FAIR (findable, accessible, interoperable, reusable) principles for scientific data management and stewardship requires machine-actionable semantic representations of data and metadata. Human and machine interpretation and reuse of measurement datasets rely on metrological information that is [...] Read more.
Achieving the highest levels of compliance with the FAIR (findable, accessible, interoperable, reusable) principles for scientific data management and stewardship requires machine-actionable semantic representations of data and metadata. Human and machine interpretation and reuse of measurement datasets rely on metrological information that is often specified inconsistently or cannot be inferred automatically, while several ontologies to capture the metrological information are available, practical implementation examples are few. This work aims to close this gap by discussing how standardised measurement data and metadata could be presented using semantic web technologies. The examples provided in this paper are machine-actionable descriptions of Earth observation and bathymetry measurement datasets, based on two ontologies of quantities and units of measurement selected for their prominence in the semantic web. The selected ontologies demonstrated a good coverage of the concepts related to quantities, dimensions, and individual units as well as systems of units, but showed variations and gaps in the coverage, completeness and traceability of other metrology concept representations such as standard uncertainty, expanded uncertainty, combined uncertainty, coverage factor, probability distribution, etc. These results highlight the need for both (I) user-friendly tools for semantic representations of measurement datasets and (II) the establishment of good practices within each scientific community. Further work will consequently investigate how to support ontology modelling for measurement uncertainty and associated concepts. Full article
(This article belongs to the Special Issue Metrology in Times of Digitization)
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