Special Issue "Design and Test of Micro-Electromechanical Systems (MEMS)"

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".

Deadline for manuscript submissions: 15 March 2024 | Viewed by 122

Special Issue Editor

Dr. Jia Li
E-Mail Website
Guest Editor
Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China
Interests: testing, design-for-testability (DfT) and power-aware design of very large scale integrated (VLSI) circuits and micro-electromechanical systems

Special Issue Information

Dear Colleagues,

This Special Issue (SI) encourages papers on the achievement of new theories and methods centred around the design and testing of micro-electromechanical systems (MEMSs). MEMSs, by nature, are interdisciplinary systems involving a wide and diverse range of technical aspects, including microelectronics technology, materials science, mechanical engineering, chemical engineering, and many other fields. Because they usually require complex test stimuli rather than simple digital electronic signals as common VLSI systems to verify their specifications, testing and calibration costs have actually become a bottleneck to reduce the overall production cost of MEMS sensors. To address the related issues, we look forward to the latest research findings that suggest theories and practical solutions for various design and testing methods for MEMS. The topics of interest include, but are not limited to, the following:

  • Design methodology of MEMSs;
  • Design methodology of interface circuit of MEMSs;
  • Design-for-test methodology of MEMSs;
  • Testing methodology of MEMSs;
  • Built-in-self-test of MEMSs;
  • Self-calibration of MEMSs;
  • Design-for-reliability of MEMSs.

Dr. Jia Li
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • MEMS design
  • MEMS testing
  • design-for-test of MEMS

Published Papers

This special issue is now open for submission.
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