Innovative Data Analysis Techniques for Metrology Applications

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".

Deadline for manuscript submissions: 15 August 2024 | Viewed by 395

Special Issue Editors


E-Mail Website
Guest Editor
Department of Mechanical and Industrial Engineering (DIMI), University of Brescia, 25123 Brescia, Italy
Interests: hand gesture recognition; computer vision; robotics; wearable sensors; deep learning; metrology

E-Mail Website
Guest Editor
Graduate School of Science and Technology, Nara Institute of Science and Technology, Nara 630-0192, Japan
Interests: ubiquitous computing; mobile computing; sensor networks
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Graduate School of Science and Technology, Nara Institute of Science and Technology, Nara 630-0192, Japan
Interests: civic computing; ubiquitous computing; mobile computing; participatory sensing; affective computing

Special Issue Information

Dear Colleagues,

At present, a variety of applications—ranging from robotics to biomechanics, industrial processes to agriculture, medicine to management—adopt smart and innovative techniques to interpret and analyze data. In the era of big data, it is of fundamental importance to robustly acquire information that will later be processed and adopted by the application of interest. As such, metrology plays an important role in both data acquisition and analysis.

Sensing technologies include contactless measurements, wearable sensors, mechanical and thermal instrumentation, and electrical measurements. The same data may be acquired in different ways, and even the same sensing technology may result in different outcomes when processed using different approaches. Furthermore, smart devices and embedded systems are rapidly becoming a necessity, especially for data collection and analysis in unstructured environments. Finally, data validation adhering to statistical and metrological standards is typically key to successful application development.

The aim of this Special Issue entitled “Innovative Data Analysis Techniques for Metrology Applications” is to bring together the research communities interested in metrological applications and data analysis from various departments and universities, without posing a restriction on the application field and especially focusing on real physical quantities instead of simulated models and synthetic datasets.

Topics of interest for this Special Issue include, but are not limited to, the following:

  • Applications for agriculture;
  • Environmental measurements and data analysis;
  • Industrial process measurements;
  • Healthcare, rehabilitation, and sport-centered applications;
  • Robotics applications;
  • Applications in unstructured environments;
  • Computer vision, augmented reality, and virtual reality applications;
  • Contactless measurements;
  • Embedded systems;
  • Innovative sensing devices;
  • Wearable sensors;
  • Deep learning, machine learning, and innovative algorithms and models for data analysis.

The technical program committee member is as follow:

Dr. Alessandro Luchetti
MIRo (Measurement, Instrumentation and Robotics) Laboratory, Department of Industrial Engineering (DII), University of Trento, 38123 Trento, Italy

Dr. Cristina Nuzzi
Prof. Dr. Keiichi Yasumoto
Dr. Yuki Matsuda
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • measurements
  • sensors
  • data analysis
  • machine learning
  • embedded systems
  • computer vision
  • robotics
  • industry
  • healthcare
  • agriculture
  • environmental measurements

Published Papers

This special issue is now open for submission.
Back to TopTop