New Insights into X-ray Microscopy and Applications

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (20 November 2023) | Viewed by 150

Special Issue Editors


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Guest Editor
MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, 1239 Siping Road, Shanghai 200092, China
Interests: X-ray optics; plasma diagnostics

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Guest Editor
Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
Interests: laser inertial confinement fusion diagnosis; X-ray imaging; VISAR

E-Mail Website
Guest Editor
Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
Interests: laser inertial confinement fusion diagnosis; X-ray imaging; X-ray spectrum

Special Issue Information

Dear Colleagues,

X-ray microscopy is a technology that operates in the X-ray band in order obtain high-resolution imaging of the internal structure of materials, and is widely applied in fields such as biomedicine, materials science, physics, and other disciplines. Compared to visible light, it is difficult to  focus X-ray through refraction. Various X-ray modulation techniques, such as grazing incidence, diffraction, phase contrast, and various forms of X-ray microscopy, have been developed. Examples include traditional X-ray grazing incidence microscopy, multilayer imaging microscopy, X-ray phase contrast microscopy, zone plate microscopy, X-ray fluorescence microscopy, etc. With the development of advanced light source technology and computational optics theory, new types of X-ray coherent diffraction imaging microscopy, X-ray holographic microscopy, X-ray scanning microscopy, X-ray three-dimensional imaging microscopy, etc., have flourished. In recent years, light source, X-ray detector, and optical component technology have all made significant progress, thus further improving the application of X-ray microscopy. In the fields of biomedicine, plasma diagnostics, synchrotron radiation and industrial nondestructive testing, these technological advances are particularly evident. X-ray microscopy has become one of the most powerful tools for understanding the internal structure of materials.

Prof. Dr. Baozhong Mu
Prof. Dr. Feng Wang
Prof. Dr. Shenye Liu
Guest Editors

Manuscript Submission Information

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Keywords

  • X-raymicroscopy
  • X-raymodulationtechnology
  • grazingincidence
  • phasecontrast
  • X-raysourceanddetector
  • plasmadiagnostics
  • sychronradiation

Published Papers

There is no accepted submissions to this special issue at this moment.
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