Advanced Optoelectronic Detection Technologies and Systems

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".

Deadline for manuscript submissions: 29 February 2024 | Viewed by 239

Special Issue Editors

School of Electronic and Information Engineering, Tiangong University, Tianjin 300387, China
Interests: new semiconductor optoelectronic devices and integration; power power electronic device technology; smart sensors and system integration
Special Issues, Collections and Topics in MDPI journals
Prof. Dr. Delin Zhang
E-Mail Website
Guest Editor
School of Electronic and Information Engineering, Tiangong University, Tianjin 300387, China
Interests: spintronic and magnetic devices; semiconductor devices
Dr. Xiuyan Li
E-Mail Website
Guest Editor
Associate Professor, School of Electronic and Information Engineering, Tiangong University, Tianjin 300387, China
Interests: optoelectronic detection and imaging
Associate Professor, School of Electronic and Information Engineering, Tiangong University, Tianjin 300387, China
Interests: microwave and terahertz photonics; optical fiber sensors
Special Issues, Collections and Topics in MDPI journals
Dr. Hang Li
E-Mail Website
Guest Editor
School of Electronic and Information Engineering, Tiangong University, Tianjin 300387, China
Interests: magnetic materials and devices

Special Issue Information

Dear Colleagues,

It is our pleasure to announce a new Special Issue of Applied Sciences devoted to advanced optoelectronic detection technologies and systems. It will cover both the theoretical and experimental advances of materials, devices, algorithms, and systems in optoelectronic detection technology. Particularly welcome will be works focused on semiconductor, spintronic, magnetic, and terahertz devices, and their applications in sensors and detections. Taking into account that a validation of a supposition is usually realized via a cross-check, the use of combined approaches are also welcomed.

This Special Issue also collects the selected papers from Symposium on Semiconductor Light Source System 2023 organized by the China Electrotechnical Society.

Prof. Dr. Pingjuan Niu
Prof. Dr. Delin Zhang
Dr. Xiuyan Li
Dr. Jia Shi
Dr. Hang Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electrotechnology
  • semiconductor materials, devices, light sources, and systems
  • spintronic and magnetic devices
  • terahertz materials and devices
  • optoelectronic materials
  • optoelectronic devices
  • optoelectronic imaging
  • algorithms in optoelectronic detections

Published Papers

This special issue is now open for submission.
Back to TopTop