Single Photon Technologies

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (30 May 2020) | Viewed by 5483

Special Issue Editors

Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico Milano, Via Ponzio 34/5, 20133 Milano, Italia
Interests: time-correlated single-photon counting; SPAD; time-resolved electronics; fast counting
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Guest Editor
Department of Electronics, Information and Bioengineering, Politecnico di Milano, 20132 Milan, Italy
Interests: single photon timing applications; integrated electronics

Special Issue Information

Dear colleagues,

The Single Photon Workshop 2019 is the ninth installment in a series of workshops on single-photon technologies and applications. SPW 2019 is intended to bring together a broad range of people with interests in single-photon sources, single-photon detectors, photon entanglement, and their use in scientific and industrial applications. It will be an exciting opportunity for those interested in these technologies to learn about the state of the art and to foster continuing partnerships with others seeking to advance the capabilities of such technologies.

Associated with this conference will be this Special Issue. The Special Issue is not limited to the works presented during the conference but is open to all contributions related to the world of single photon.

Papers are solicited in the following areas:
● Single-photon detectors: devices, circuits, and systems to achieve single-photon sensitivity;
● Single-photon sources: materials, schemes, and architectures to generate and control light emission at single photon level;
● Applications: single-photon technologies for scientific and industrial applications, from ground to space and from life science to quantum information processing;
● Metrology/validation techniques and instrumentation to prove single-photon generation and acquisition.

Prof. Ivan Rech
Dr. Giulia Acconcia
Guest Editors

Manuscript Submission Information

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Keywords

  • Single photon detectors 
  • Single photon source
  • Single photon applications 
  • Single photon metrology
  • Time correlated single photon conting 
  • SPAD
  • SSPD 
  • Single photon camera 
  • LIDAR

Published Papers (1 paper)

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Research

8 pages, 2689 KiB  
Article
Current-Assisted Single Photon Avalanche Diode (CASPAD) Fabricated in 350 nm Conventional CMOS
by Gobinath Jegannathan, Hans Ingelberts and Maarten Kuijk
Appl. Sci. 2020, 10(6), 2155; https://doi.org/10.3390/app10062155 - 22 Mar 2020
Cited by 6 | Viewed by 4773
Abstract
A current-assisted single-photon avalanche diode (CASPAD) is presented with a large and deep absorption volume combined with a small p-n junction in its middle to perform avalanche trigger detection. The absorption volume has a drift field that serves as a guiding mechanism to [...] Read more.
A current-assisted single-photon avalanche diode (CASPAD) is presented with a large and deep absorption volume combined with a small p-n junction in its middle to perform avalanche trigger detection. The absorption volume has a drift field that serves as a guiding mechanism to the photo-generated minority carriers by directing them toward the avalanche breakdown region of the p-n junction. This drift field is created by a majority current distribution in the thick (highly-resistive) epi-layer that is present because of an applied voltage bias between the p-anode of the avalanching region and the perimeter of the detector. A first CASPAD device fabricated in 350-nm CMOS shows functional operation for NIR (785-nm) photons; absorbed in a volume of 40 × 40 × 14 μm3. The CASPAD is characterized for its photon-detection probability (PDP), timing jitter, dark-count rate (DCR), and after pulsing. Full article
(This article belongs to the Special Issue Single Photon Technologies)
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