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Applied Sciences
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New Science Opportunities at Short Wavelength Free Electron Lasers
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New Science Opportunities at Short Wavelength Free Electron Lasers

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (20 December 2023) | Viewed by 7118

Special Issue Editor

Prof. Dr. Kiyoshi Ueda

E-Mail Website
Guest Editor
Department of Chemistry, Tohoku University, Sendai 980-8578, Japan
Interests: electron dynamics; molecular dynamics; atoms, molecules and clusters; ultrafast phenomena; photoionization; molecular imaging; electron spectroscopy; many particle spectroscopy; coherent control; free electron lasers

Special Issue Information

Dear Colleagues,

Short wavelength free electron lasers (FEL) deliver coherent pulses in the range from  extreme ultraviolet to X-rays, combining unprecedented power densities up to 1020 W/cm2 and extremely short pulse durations below 1 femtosecond. Such intense, ultrashot pulses are opening new pathways to visualize atoms and electrons in action, in any form of matter. Encouraged by the successful operations of existing FELs, new FELs and new operation modes of FELs are emerging, offering new scientific opportunities. The stunning success of SASE3 of European XFEL, the first high repetition rate soft X-ray FEL, and double attosecond pulse generations at LCLS are showcase examples of new FEL/operation modes that have provided new scientific opportunities. In the coming year 2022, LCLSII will start a high repetition rate operation in the soft to tender X-ray range, while both SASE and seeded soft X-ray FELs in Shanghai, China will start user operations. SHINE, a high-repetition X-ray FEL in Shanghai, is also coming in a few years. Considering these elements, we believe that it is time to have a new Special Issue “New Science Opportunities at Short Wavelength Free Electron Lasers” as a follow up of the past two Special Issues:  

This new Special Issue aims to cover the status of the new facilities, latest developments in the existing FELs, latest science activities with these FELs, as well as relevant theoretical developments, with the same energy as the above two Special Issues. We look forward to receiving your contributions.

Prof. Dr. Kiyoshi Ueda
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Published Papers (4 papers)

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Research

12 pages, 1238 KiB  
Article
Spatial and Momentum Mapping Modes for Velocity Map Imaging Spectrometer
by Yunfei Feng, Bocheng Ding, Ruichang Wu, Xin Jin, Kefei Wu, Jianfeng Liao, Jianye Huang and Xiaojing Liu
Appl. Sci. 2024, 14(5), 2190; https://doi.org/10.3390/app14052190 - 06 Mar 2024
Viewed by 476
Abstract
The velocity map imaging (VMI) technique is used to acquire the momentum distribution of charged particles. Here, we introduce two additional operation modes for our recently built velocity map imaging (VMI) spectrometer: the spatial mapping mode that magnifies the image of zero energy [...] Read more.
The velocity map imaging (VMI) technique is used to acquire the momentum distribution of charged particles. Here, we introduce two additional operation modes for our recently built velocity map imaging (VMI) spectrometer: the spatial mapping mode that magnifies the image of zero energy ions with different scales and the high-resolution momentum mapping mode that acquires the electron momentum distribution at the kinetic energy of about 100 eV. In simulations, the ion image is magnified with a factor of up to 7.6, and a relative resolution of 0.15% at 150 eV electron kinetic energy is predicted. Switching between these two modes helps reduce the alignment error to below 0.2 mm. In the test using the above-threshold ionization (ATI) of argon (Ar), the Ar+ ion image is magnified by a factor of up to 6.7, and a relative resolution of 1.3% at 44.6 eV electron kinetic energy is achieved. Full article
(This article belongs to the Special Issue New Science Opportunities at Short Wavelength Free Electron Lasers)
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21 pages, 943 KiB  
Article
Ionization of Xenon Clusters by a Hard X-ray Laser Pulse
by Yoshiaki Kumagai, Weiqing Xu, Kazuki Asa, Toshiyuki Hiraki Nishiyama, Koji Motomura, Shin-ichi Wada, Denys Iablonskyi, Subhendu Mondal, Tetsuya Tachibana, Yuta Ito, Tsukasa Sakai, Kenji Matsunami, Takayuki Umemoto, Christophe Nicolas, Catalin Miron, Tadashi Togashi, Kanade Ogawa, Shigeki Owada, Kensuke Tono, Makina Yabashi, Hironobu Fukuzawa, Kiyonobu Nagaya and Kiyoshi Uedaadd Show full author list remove Hide full author list
Appl. Sci. 2023, 13(4), 2176; https://doi.org/10.3390/app13042176 - 08 Feb 2023
Viewed by 1517
Abstract
Ultrashort pulse X-ray free electron lasers (XFFLs) provided us with an unprecedented regime of X-ray intensities, revolutionizing ultrafast structure determination and paving the way to the novel field of non-linear X-ray optics. While pioneering studies revealed the formation of a nanoplasma following the [...] Read more.
Ultrashort pulse X-ray free electron lasers (XFFLs) provided us with an unprecedented regime of X-ray intensities, revolutionizing ultrafast structure determination and paving the way to the novel field of non-linear X-ray optics. While pioneering studies revealed the formation of a nanoplasma following the interaction of an XFEL pulse with nanometer-scale matter, nanoplasma formation and disintegration processes are not completely understood, and the behavior of trapped electrons in the electrostatic potential of highly charged species is yet to be decrypted. Here we report the behavior of the nanoplasma created by a hard X-ray pulse interacting with xenon clusters by using electron and ion spectroscopy. To obtain a deep insight into the formation and disintegration of XFEL-ignited nanoplasma, we studied the XFEL-intensity and cluster-size dependencies of the ionization dynamics. We also present the time-resolved data obtained by a near-infrared (NIR) probe pulse in order to experimentally track the time evolution of plasma electrons distributed in the XFEL-ignited nanoplasma. We observed an unexpected time delay dependence of the ion yield enhancement due to the NIR pulse heating, which demonstrates that the plasma electrons within the XFEL-ignited nanoplasma are inhomogeneously distributed in space. Full article
(This article belongs to the Special Issue New Science Opportunities at Short Wavelength Free Electron Lasers)
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12 pages, 1669 KiB  
Article
A Reaction Microscope for AMO Science at Shanghai Soft X-ray Free-Electron Laser Facility
by Wenbin Jiang, Xincheng Wang, Shuai Zhang, Ruichao Dong, Yuliang Guo, Jinze Feng, Zhenjie Shen, Zhiyuan Zhu and Yuhai Jiang
Appl. Sci. 2022, 12(4), 1821; https://doi.org/10.3390/app12041821 - 10 Feb 2022
Cited by 4 | Viewed by 1839
Abstract
We report on the design and capabilities of a reaction microscope (REMI) end-station at the Shanghai Soft X-ray Free-Electron Laser Facility (SXFEL). This apparatus allows high-resolution and 4π solid-angle coincidence detection of ions and electrons. The components of REMI, including a supersonic [...] Read more.
We report on the design and capabilities of a reaction microscope (REMI) end-station at the Shanghai Soft X-ray Free-Electron Laser Facility (SXFEL). This apparatus allows high-resolution and 4π solid-angle coincidence detection of ions and electrons. The components of REMI, including a supersonic gas injection system, spectrometer, detectors and data acquisition system, are described in detail. By measuring the time of flight and the impact positions of ions and electrons on the corresponding detectors, three-dimensional momentum vectors can be reconstructed to study specific reaction processes. Momentum resolutions of ions and electrons with 0.11 a.u. are achieved, which have been measured from a single ionization experiment of oxygen molecules in an infrared (IR), femtosecond laser field, under vacuum at 1.2×10−10 torr, in a reaction chamber. As a demonstration, a Coulomb explosion experiment of oxygen molecules in the IR field is presented. These results demonstrate the performance of this setup, which provides a basic tool for the study of atomic and molecular reactions at SXFEL. Full article
(This article belongs to the Special Issue New Science Opportunities at Short Wavelength Free Electron Lasers)
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9 pages, 1383 KiB  
Article
A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser
by Bocheng Ding, Weiqing Xu, Ruichang Wu, Yunfei Feng, Lifang Tian, Xiaohong Li, Jianye Huang, Zhi Liu and Xiaojing Liu
Appl. Sci. 2021, 11(21), 10272; https://doi.org/10.3390/app112110272 - 02 Nov 2021
Cited by 5 | Viewed by 2282
Abstract
Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the [...] Read more.
Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and O+ kinetic energy spectrum from dissociative ionization of O2 by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking. Full article
(This article belongs to the Special Issue New Science Opportunities at Short Wavelength Free Electron Lasers)
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