Development and Applications of Microwave/Millimeter Wave Diagnostics in Industry, 2nd Edition

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Applied Physics General".

Deadline for manuscript submissions: 30 September 2024 | Viewed by 271

Special Issue Editors

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Guest Editor
Global Innovation Center, Kyushu University, Kasuga 816-8580, Japan
Interests: calibration; marine radar; oceanographic techniques; tides; anechoic chambers (electromagnetic); electrocardiography; height measurement; image resolution; lenses; level measurement; light diffraction
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
1. Department of Electrical and Computer Engineering, University of California, Davis, CA 95616, USA
2. Co-Director of Davis MM Wave Research Center, University of California, Davis, CA 95616, USA
Interests: millimeter wave imaging; vacuum microelectronics; phased array antennas; microwave tube design; high power microwave sources; free electron lasers; plasma physics; wave-plasma interactions; ultrashort pulse electronics; high power millimeter wave sources; millimeter wave quasi-optical grid arrays; laser diagnostics; RF accelerators; advanced light sources; gyrotrons; MEMS; cancer diagnostics and treatment
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Microwave/millimeter-wave diagnostics are widely employed in various industrial applications, as well as in remote sensing and plasma diagnostics, on account of two important features. Namely, the capacity to penetrate through dielectric materials, which can be applied to the nondestructive measurement of materials, and the fact transmissivity is not affected by the surrounding environment, another strong point of using radar and range meter technology. The low energy use compared to other wavelengths, such as X-rays, is appropriate for non-invasive biomedical measurements, as long as the probe beam power is sufficiently low to control the effect of heating. 

On the other hand, this technology suffers from poor spatial resolution due to its long wavelength. However, several research approaches have been undertaken to ameliorate this problem. Specifically, those approaches are the UWB (ultra-wide band) technique in the range direction and the SA (synthetic aperture) technique in the azimuth direction. The phase measurement of signal waves is also quite effective for achieving this objective. 

The ever-accelerating progress in microwave- and millimeter-wave devices and circuits, such as monolithic microwave integrated circuits (MMICs) and data processing, including computer technology, has contributed to the rapid advancement of diagnostic technology. This includes micro- to millimeter-wave imaging, including optics imaging, synthetic imaging, and MIMO (multi-input multi-output) imaging. These techniques are of critical importance in various applications due to the possibility of high localization and the accessibility of the measurements.

In this Special Issue, we will publish scientific papers related to industrial applications of micro- to millimeter-lenth waves, with topics including system development, data processing techniques, system application results, and physics-based understandings of results. However, we will also include many kinds of valuable studies that promote future advancements in this field.  

Prof. Dr. Atsushi Mase
Prof. Dr. Neville C. Luhmann
Guest Editors

Manuscript Submission Information

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  • microwave/millimeter-wave diagnostics
  • industrial application
  • non-destructive measurement
  • biomedical measurement
  • spatial resolution phase measurement
  • imaging
  • SAR
  • MIMO
  • automobile radar
  • AI application

Published Papers

This special issue is now open for submission.
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