# Research on Algorithm for Improving Infrared Image Defect Segmentation of Power Equipment

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## Abstract

**:**

## 1. Introduction

## 2. Countermeasure Datasets for Learning Attack Strategies

## 3. CS_DeeplabV3+ Model

#### 3.1. Deeplab V3+ Model

#### 3.2. CS_DeeplabV3+Model

#### 3.3. Improving Attention Mechanism Module

_{0}∈RC/r × C, W

_{1}∈RC × C/r, W

_{0}, and W

_{1}denote the two-layer network parameters of the MLP, and the final output of the channel attention is F’.

#### 3.4. Semantic Segmentation Feature Enhancement Module

#### 3.5. Improved Loss Function

_{t}represents the probability predicted by the model, and weight γ represents the rate of decline in the weight of the adjusted sample. When γ is set to 0, the focus loss function degrades to a cross-entropy loss function. As γ increases, so does the adjustment factor. The original focus loss function achieves the target training by suppressing the loss value of the sample to varying degrees. Suppression causes the weight of the sample loss value to decrease between 0 and 1. The weight of the simple sample is close to 0, and the weight of the difficult sample is close to 1, but during the semantic segmentation process, we need to correctly classify each pixel. Therefore, while retaining the loss value weight of easy samples, increasing the loss value weight of difficult samples is more suitable for semantic segmentation.

## 4. Experimental Evaluation and Discussion

#### 4.1. Dataset

#### 4.2. Experimental Evaluation Indicators

#### 4.3. Comparison Experiment and Analysis

## 5. Conclusions

## Author Contributions

## Funding

## Data Availability Statement

## Acknowledgments

## Conflicts of Interest

## References

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**Figure 8.**Original drawing and segmentation effects for 3 different models: (

**a**) original drawing; (

**b**) DeeplabV3+; (

**c**) CBAM_DeeplabV3+; and (

**d**) CS_DeeplabV3+.

**Figure 9.**Network prediction effect diagram: (

**a**) original drawing; (

**b**) U-Net; (

**c**) Deeplabv3+; and (

**d**) CS_Deeplabv3+.

Module | MPA | MIOU |
---|---|---|

DeeplabV3+ | 0.794 | 0.699 |

CBAM_DeeplabV3+ | 0.824 | 0.738 |

CS_DeeplabV3+ | 0.850 | 0.772 |

Module | MPA | MIOU |
---|---|---|

U-Net | 0.714 | 0.615 |

DeeplabV3+ | 0.794 | 0.699 |

CS_DeeplabV3+ | 0.850 | 0.772 |

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**MDPI and ACS Style**

Zhang, J.; Zhu, W. Research on Algorithm for Improving Infrared Image Defect Segmentation of Power Equipment. *Electronics* **2023**, *12*, 1588.
https://doi.org/10.3390/electronics12071588

**AMA Style**

Zhang J, Zhu W. Research on Algorithm for Improving Infrared Image Defect Segmentation of Power Equipment. *Electronics*. 2023; 12(7):1588.
https://doi.org/10.3390/electronics12071588

**Chicago/Turabian Style**

Zhang, Jingwen, and Wu Zhu. 2023. "Research on Algorithm for Improving Infrared Image Defect Segmentation of Power Equipment" *Electronics* 12, no. 7: 1588.
https://doi.org/10.3390/electronics12071588